Test-Time Adaptation to Distribution Shift by Confidence Maximization and Input Transformation
Authors:
Chaithanya Kumar Mummadi,
Robin Hutmacher,
Kilian Rambach,
Evgeny Levinkov,
Thomas Brox,
Jan Hendrik Metzen
Abstract:
Deep neural networks often exhibit poor performance on data that is unlikely under the train-time data distribution, for instance data affected by corruptions. Previous works demonstrate that test-time adaptation to data shift, for instance using entropy minimization, effectively improves performance on such shifted distributions. This paper focuses on the fully test-time adaptation setting, where…
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Deep neural networks often exhibit poor performance on data that is unlikely under the train-time data distribution, for instance data affected by corruptions. Previous works demonstrate that test-time adaptation to data shift, for instance using entropy minimization, effectively improves performance on such shifted distributions. This paper focuses on the fully test-time adaptation setting, where only unlabeled data from the target distribution is required. This allows adapting arbitrary pretrained networks. Specifically, we propose a novel loss that improves test-time adaptation by addressing both premature convergence and instability of entropy minimization. This is achieved by replacing the entropy by a non-saturating surrogate and adding a diversity regularizer based on batch-wise entropy maximization that prevents convergence to trivial collapsed solutions. Moreover, we propose to prepend an input transformation module to the network that can partially undo test-time distribution shifts. Surprisingly, this preprocessing can be learned solely using the fully test-time adaptation loss in an end-to-end fashion without any target domain labels or source domain data. We show that our approach outperforms previous work in improving the robustness of publicly available pretrained image classifiers to common corruptions on such challenging benchmarks as ImageNet-C.
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Submitted 28 June, 2021;
originally announced June 2021.
Meta Adversarial Training against Universal Patches
Authors:
Jan Hendrik Metzen,
Nicole Finnie,
Robin Hutmacher
Abstract:
Recently demonstrated physical-world adversarial attacks have exposed vulnerabilities in perception systems that pose severe risks for safety-critical applications such as autonomous driving. These attacks place adversarial artifacts in the physical world that indirectly cause the addition of a universal patch to inputs of a model that can fool it in a variety of contexts. Adversarial training is…
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Recently demonstrated physical-world adversarial attacks have exposed vulnerabilities in perception systems that pose severe risks for safety-critical applications such as autonomous driving. These attacks place adversarial artifacts in the physical world that indirectly cause the addition of a universal patch to inputs of a model that can fool it in a variety of contexts. Adversarial training is the most effective defense against image-dependent adversarial attacks. However, tailoring adversarial training to universal patches is computationally expensive since the optimal universal patch depends on the model weights which change during training. We propose meta adversarial training (MAT), a novel combination of adversarial training with meta-learning, which overcomes this challenge by meta-learning universal patches along with model training. MAT requires little extra computation while continuously adapting a large set of patches to the current model. MAT considerably increases robustness against universal patch attacks on image classification and traffic-light detection.
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Submitted 22 June, 2021; v1 submitted 27 January, 2021;
originally announced January 2021.
