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Realization of high-dynamic-range broadband magnetic-field sensing with ensemble nitrogen-vacancy centers in diamond
Authors:
Cao Wang,
Qihui Liu,
Yuqiang Hu,
Fei Xie,
Krishangi Krishna,
Nan Wang,
Lihao Wang,
Yang Wang,
Kimani C. Toussaint Jr,
Jiangong Cheng,
Hao Chen,
Zhenyu Wu
Abstract:
We present a new magnetometry method integrating an ensemble of nitrogen-vacancy (NV) centers in a single-crystal diamond with an extended dynamic range for monitoring the fast changing magnetic-field. The NV-center spin resonance frequency is tracked using a closed-loop frequency locked technique with fast frequency hop** to achieve a 10 kHz measurement bandwidth, thus, allowing for the detecti…
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We present a new magnetometry method integrating an ensemble of nitrogen-vacancy (NV) centers in a single-crystal diamond with an extended dynamic range for monitoring the fast changing magnetic-field. The NV-center spin resonance frequency is tracked using a closed-loop frequency locked technique with fast frequency hop** to achieve a 10 kHz measurement bandwidth, thus, allowing for the detection of fast changing magnetic signals up to 0.723 T/s.This technique exhibits an extended dynamic range subjected to the working bandwidth of the microwave source. This extended dynamic range can reach up to 4.3 mT, which is 86 times broader than the intrinsic dynamic range. The essential components for NV spin control and signal processing such as signal generation, microwave frequency control, data processing and readout are integrated in a board-level system. With this platform, we demonstrate broadband magnetometry with an optimized sensitivity of 4.2 nT-Hz-1/2. This magnetometry method has the potential to be implemented in a multichannel frequency locked vector magnetometer suitable for a wide range of practical applications such as magnetocardiography and high-precision current sensors.
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Submitted 22 September, 2022;
originally announced September 2022.
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Entangled-photon ellipsometry
Authors:
Ayman F. Abouraddy,
Kimani C. Toussaint, Jr.,
Alexander V. Sergienko,
Bahaa E. A. Saleh,
Malvin C. Teich
Abstract:
Performing reliable measurements in optical metrology, such as those needed in ellipsometry, requires a calibrated source and detector, or a well-characterized reference sample. We present a novel interferometric technique to perform reliable ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely polarization-entangled twin photons generated by spo…
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Performing reliable measurements in optical metrology, such as those needed in ellipsometry, requires a calibrated source and detector, or a well-characterized reference sample. We present a novel interferometric technique to perform reliable ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute, i.e., they require neither source nor detector calibration, nor do they require a reference.
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Submitted 15 February, 2002;
originally announced February 2002.
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Ellipsometric measurements by use of photon pairs generated by spontaneous parametric down-conversion
Authors:
Ayman F. Abouraddy,
Kimani C. Toussaint, Jr.,
Alexander V. Sergienko,
Bahaa E. A. Saleh,
Malvin C. Teich
Abstract:
We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute; i…
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We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration.
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Submitted 12 October, 2001;
originally announced October 2001.
