Merged-Element Transmons: Design and Qubit Performance
Authors:
H. J. Mamin,
E. Huang,
S. Carnevale,
C. T. Rettner,
N. Arellano,
M. H. Sherwood,
C. Kurter,
B. Trimm,
M. Sandberg,
R. M. Shelby,
M. A. Mueed,
B. A. Madon,
A. Pushp,
M. Steffen,
D. Rugar
Abstract:
We have demonstrated a novel type of superconducting transmon qubit in which a Josephson junction has been engineered to act as its own parallel shunt capacitor. This merged-element transmon (MET) potentially offers a smaller footprint and simpler fabrication than conventional transmons. Because it concentrates the electromagnetic energy inside the junction, it reduces relative electric field part…
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We have demonstrated a novel type of superconducting transmon qubit in which a Josephson junction has been engineered to act as its own parallel shunt capacitor. This merged-element transmon (MET) potentially offers a smaller footprint and simpler fabrication than conventional transmons. Because it concentrates the electromagnetic energy inside the junction, it reduces relative electric field participation from other interfaces. By combining micrometer-scale Al/AlOx/Al junctions with long oxidations and novel processing, we have produced functional devices with $E_{J}$/$E_{C}$ in the low transmon regime ($E_{J}$/$E_{C}$ $\lesssim$30). Cryogenic I-V measurements show sharp dI/dV structure with low sub-gap conduction. Qubit spectroscopy of tunable versions show a small number of avoided level crossings, suggesting the presence of two-level systems (TLS). We have observed mean T1 times typically in the range of 10-90 microseconds, with some annealed devices exhibiting T1 > 100 microseconds over several hours. The results suggest that energy relaxation in conventional, small-junction transmons is not limited by junction loss.
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Submitted 13 August, 2021; v1 submitted 16 March, 2021;
originally announced March 2021.
