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NEXO: Neutrinoless double beta decay search beyond $10^{28}$ year half-life sensitivity
Authors:
nEXO Collaboration,
G. Adhikari,
S. Al Kharusi,
E. Angelico,
G. Anton,
I. J. Arnquist,
I. Badhrees,
J. Bane,
V. Belov,
E. P. Bernard,
T. Bhatta,
A. Bolotnikov,
P. A. Breur,
J. P. Brodsky,
E. Brown,
T. Brunner,
E. Caden,
G. F. Cao,
L. Cao,
C. Chambers,
B. Chana,
S. A. Charlebois,
D. Chernyak,
M. Chiu,
B. Cleveland
, et al. (136 additional authors not shown)
Abstract:
The nEXO neutrinoless double beta decay experiment is designed to use a time projection chamber and 5000 kg of isotopically enriched liquid xenon to search for the decay in $^{136}$Xe. Progress in the detector design, paired with higher fidelity in its simulation and an advanced data analysis, based on the one used for the final results of EXO-200, produce a sensitivity prediction that exceeds the…
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The nEXO neutrinoless double beta decay experiment is designed to use a time projection chamber and 5000 kg of isotopically enriched liquid xenon to search for the decay in $^{136}$Xe. Progress in the detector design, paired with higher fidelity in its simulation and an advanced data analysis, based on the one used for the final results of EXO-200, produce a sensitivity prediction that exceeds the half-life of $10^{28}$ years. Specifically, improvements have been made in the understanding of production of scintillation photons and charge as well as of their transport and reconstruction in the detector. The more detailed knowledge of the detector construction has been paired with more assays for trace radioactivity in different materials. In particular, the use of custom electroformed copper is now incorporated in the design, leading to a substantial reduction in backgrounds from the intrinsic radioactivity of detector materials. Furthermore, a number of assumptions from previous sensitivity projections have gained further support from interim work validating the nEXO experiment concept. Together these improvements and updates suggest that the nEXO experiment will reach a half-life sensitivity of $1.35\times 10^{28}$ yr at 90% confidence level in 10 years of data taking, covering the parameter space associated with the inverted neutrino mass ordering, along with a significant portion of the parameter space for the normal ordering scenario, for almost all nuclear matrix elements. The effects of backgrounds deviating from the nominal values used for the projections are also illustrated, concluding that the nEXO design is robust against a number of imperfections of the model.
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Submitted 22 February, 2022; v1 submitted 30 June, 2021;
originally announced June 2021.
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Event Reconstruction in a Liquid Xenon Time Projection Chamber with an Optically-Open Field Cage
Authors:
T. Stiegler,
S. Sangiorgio,
J. P. Brodsky,
M. Heffner,
S. Al Kharusi,
G. Anton,
I. J. Arnquist,
I. Badhrees,
P. S. Barbeau,
D. Beck,
V. Belov,
T. Bhatta,
A. Bolotnikov,
P. A. Breur,
E. Brown,
T. Brunner,
E. Caden,
G. F. Cao,
L. Cao,
C. Chambers,
B. Chana,
S. A. Charlebois,
M. Chiu,
B. Cleveland,
M. Coon
, et al. (126 additional authors not shown)
Abstract:
nEXO is a proposed tonne-scale neutrinoless double beta decay ($0νββ$) experiment using liquid ${}^{136}Xe$ (LXe) in a Time Projection Chamber (TPC) to read out ionization and scintillation signals. Between the field cage and the LXe vessel, a layer of LXe ("skin" LXe) is present, where no ionization signal is collected. Only scintillation photons are detected, owing to the lack of optical barrier…
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nEXO is a proposed tonne-scale neutrinoless double beta decay ($0νββ$) experiment using liquid ${}^{136}Xe$ (LXe) in a Time Projection Chamber (TPC) to read out ionization and scintillation signals. Between the field cage and the LXe vessel, a layer of LXe ("skin" LXe) is present, where no ionization signal is collected. Only scintillation photons are detected, owing to the lack of optical barrier around the field cage. In this work, we show that the light originating in the skin LXe region can be used to improve background discrimination by 5% over previous published estimates. This improvement comes from two elements. First, a fraction of the $γ$-ray background is removed by identifying light from interactions with an energy deposition in the skin LXe. Second, background from ${}^{222}Rn$ dissolved in the skin LXe can be efficiently rejected by tagging the $α$ decay in the ${}^{214}Bi-{}^{214}Po$ chain in the skin LXe.
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Submitted 24 March, 2021; v1 submitted 21 September, 2020;
originally announced September 2020.
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Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths
Authors:
P. Lv,
G. F. Cao,
L. J. Wen,
S. Al Kharusi,
G. Anton,
I. J. Arnquist,
I. Badhrees,
P. S. Barbeau,
D. Beck,
V. Belov,
T. Bhatta,
P. A. Breur,
J. P. Brodsky,
E. Brown,
T. Brunner,
S. Byrne Mamahit,
E. Caden,
L. Cao,
C. Chambers,
B. Chana,
S. A. Charlebois,
M. Chiu,
B. Cleveland,
M. Coon,
A. Craycraft
, et al. (126 additional authors not shown)
Abstract:
Characterization of the vacuum ultraviolet (VUV) reflectance of silicon photomultipliers (SiPMs) is important for large-scale SiPM-based photodetector systems. We report the angular dependence of the specular reflectance in a vacuum of SiPMs manufactured by Fondazionc Bruno Kessler (FBK) and Hamamatsu Photonics K.K. (HPK) over wavelengths ranging from 120 nm to 280 nm. Refractive index and extinct…
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Characterization of the vacuum ultraviolet (VUV) reflectance of silicon photomultipliers (SiPMs) is important for large-scale SiPM-based photodetector systems. We report the angular dependence of the specular reflectance in a vacuum of SiPMs manufactured by Fondazionc Bruno Kessler (FBK) and Hamamatsu Photonics K.K. (HPK) over wavelengths ranging from 120 nm to 280 nm. Refractive index and extinction coefficient of the thin silicon-dioxide film deposited on the surface of the FBK SiPMs are derived from reflectance data of a FBK silicon wafer with the same deposited oxide film as SiPMs. The diffuse reflectance of SiPMs is also measured at 193 nm. We use the VUV spectral dependence of the optical constants to predict the reflectance of the FBK silicon wafer and FBK SiPMs in liquid xenon.
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Submitted 4 December, 2019;
originally announced December 2019.
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Measurements of electron transport in liquid and gas Xenon using a laser-driven photocathode
Authors:
O. Njoya,
T. Tsang,
M. Tarka,
W. Fairbank,
K. S. Kumar,
T. Rao,
T. Wager,
S. Al Kharusi,
G. Anton,
I. J. Arnquist,
I. Badhrees,
P. S. Barbeau,
D. Beck,
V. Belov,
T. Bhatta,
J. P. Brodsky,
E. Brown,
T. Brunner,
E. Caden,
G. F. Cao,
L. Cao,
W. R. Cen,
C. Chambers,
B. Chana,
S. A. Charlebois
, et al. (131 additional authors not shown)
Abstract:
Measurements of electron drift properties in liquid and gaseous xenon are reported. The electrons are generated by the photoelectric effect in a semi-transparent gold photocathode driven in transmission mode with a pulsed ultraviolet laser. The charges drift and diffuse in a small chamber at various electric fields and a fixed drift distance of 2.0 cm. At an electric field of 0.5 kV/cm, the measur…
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Measurements of electron drift properties in liquid and gaseous xenon are reported. The electrons are generated by the photoelectric effect in a semi-transparent gold photocathode driven in transmission mode with a pulsed ultraviolet laser. The charges drift and diffuse in a small chamber at various electric fields and a fixed drift distance of 2.0 cm. At an electric field of 0.5 kV/cm, the measured drift velocities and corresponding temperature coefficients respectively are $1.97 \pm 0.04$ mm/$μ$s and $(-0.69\pm0.05)$\%/K for liquid xenon, and $1.42 \pm 0.03$ mm/$μ$s and $(+0.11\pm0.01)$\%/K for gaseous xenon at 1.5 bar. In addition, we measure longitudinal diffusion coefficients of $25.7 \pm 4.6$ cm$^2$/s and $149 \pm 23$ cm$^2$/s, for liquid and gas, respectively. The quantum efficiency of the gold photocathode is studied at the photon energy of 4.73 eV in liquid and gaseous xenon, and vacuum. These charge transport properties and the behavior of photocathodes in a xenon environment are important in designing and calibrating future large scale noble liquid detectors.
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Submitted 24 November, 2019;
originally announced November 2019.
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Reflectivity and PDE of VUV4 Hamamatsu SiPMs in Liquid Xenon
Authors:
P. Nakarmi,
I. Ostrovskiy,
A. K. Soma,
F. Retiere,
S. Al Kharusi,
M. Alfaris,
G. Anton,
I. J. Arnquist,
I. Badhrees,
P. S. Barbeau,
D. Beck,
V. Belov,
T. Bhatta,
J. Blatchford,
P. A. Breur,
J. P. Brodsky,
E. Brown,
T. Brunner,
S. Byrne Mamahit,
E. Caden,
G. F. Cao,
L. Cao,
C. Chambers,
B. Chana,
S. A. Charlebois
, et al. (130 additional authors not shown)
Abstract:
Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE. Little information is currently a…
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Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE. Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 micrometer micro-cells conducted with xenon scintillation light (~175 nm) in liquid xenon. The specular reflectivity at 15 deg. incidence of three samples of VUV4 SiPMs is found to be 30.4+/-1.4%, 28.6+/-1.3%, and 28.0+/-1.3%, respectively. The PDE at normal incidence differs by +/-8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.
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Submitted 24 December, 2019; v1 submitted 14 October, 2019;
originally announced October 2019.
