Improving the light collection efficiency of silicon photomultipliers through the use of metalenses
Authors:
A. A. Loya Villalpando,
J. Martin-Albo,
W. T. Chen,
R. Guenette,
C. Lego,
J. S. Park,
F. Capasso
Abstract:
Metalenses are optical devices that implement nanostructures as phase shifters to focus incident light. Their compactness and simple fabrication make them a potential cost-effective solution for increasing light collection efficiency in particle detectors with limited photosensitive area coverage. Here we report on the characterization and performance of metalenses in increasing the light collecti…
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Metalenses are optical devices that implement nanostructures as phase shifters to focus incident light. Their compactness and simple fabrication make them a potential cost-effective solution for increasing light collection efficiency in particle detectors with limited photosensitive area coverage. Here we report on the characterization and performance of metalenses in increasing the light collection efficiency of silicon photomultipliers (SiPM) of various sizes using an LED of 630~nm, and find a six to seven-fold increase in signal for a $1.3\times1.3~\mathrm{mm}^2$ SiPM when coupled with a 10-mm-diameter metalens manufactured using deep ultraviolet stepper lithography. Such improvements could be valuable for future generations of particle detectors, particularly those employed in rare-event searches such as dark matter and neutrinoless double beta decay.
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Submitted 3 September, 2020; v1 submitted 13 July, 2020;
originally announced July 2020.
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air
Authors:
S. Ghosh,
J. Haefner,
J. Martín-Albo,
R. Guenette,
X. Li,
A. A. Loya Villalpando,
C. Burch,
C. Adams,
V. Álvarez,
L. Arazi,
I. J. Arnquist,
C. D. R Azevedo,
K. Bailey,
F. Ballester,
J. M. Benlloch-Rodríguez,
F. I. G. M. Borges,
N. Byrnes,
S. Cárcel,
J. V. Carrión,
S. Cebrián,
E. Church,
C. A. N. Conde,
T. Contreras,
G. Díaz,
J. Díaz
, et al. (66 additional authors not shown)
Abstract:
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ran…
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Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm. We also see that the reflectance of PTFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
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Submitted 8 September, 2020; v1 submitted 13 July, 2020;
originally announced July 2020.
