Scanning Quantum Cryogenic Atom Microscope
Authors:
Fan Yang,
Alicia J. Kollár,
Stephen F. Taylor,
Richard W. Turner,
Benjamin L. Lev
Abstract:
Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed matter materials. However, a wide variety of intriguing strongly correlated and topologically nontrivial materials exhibit poorly understood phenomena outside the detection capability of state-of-the-art high-sensitivity, high-resolution scanning probe mag…
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Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed matter materials. However, a wide variety of intriguing strongly correlated and topologically nontrivial materials exhibit poorly understood phenomena outside the detection capability of state-of-the-art high-sensitivity, high-resolution scanning probe magnetometers. We introduce a quantum-noise-limited scanning probe magnetometer that can operate from room to cryogenic temperatures with unprecedented DC-field sensitivity and micron-scale resolution. The Scanning Quantum Cryogenic Atom Microscope (SQCRAMscope) employs a magnetically levitated atomic Bose-Einstein condensate (BEC), thereby providing immunity to conductive and blackbody radiative heating. It has a field sensitivity of 1.4 nT per resolution-limited point ($\sim$2 $μ$m), or 6 nT/$\sqrt{\text{Hz}}$ per point at its duty cycle. Compared to point-by-point sensors, the long length of the BEC provides a naturally parallel measurement, allowing one to measure nearly one-hundred points with an effective field sensitivity of 600 pT$/\sqrt{\text{Hz}}$ for each point during the same time as a point-by-point scanner would measure these points sequentially. Moreover, it has a noise floor of 300 pT and provides nearly two orders of magnitude improvement in magnetic flux sensitivity (down to $10^{-6}$ $Φ_0/\sqrt{\text{Hz}}$) over previous atomic probe magnetometers capable of scanning near samples. These capabilities are, for the first time, carefully benchmarked by imaging magnetic fields arising from microfabricated wire patterns, in a system where samples may be scanned, cryogenically cooled, and easily exchanged. The SQCRAMscope will provide charge transport images at temperatures from room to 4 K in unconventional superconductors and topologically nontrivial materials.
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Submitted 28 March, 2017; v1 submitted 24 August, 2016;
originally announced August 2016.
Trap** ultracold gases near cryogenic materials with rapid reconfigurability
Authors:
Matthew A. Naides,
Richard W. Turner,
Ruby A. Lai,
Jack M. DiSciacca,
Benjamin L. Lev
Abstract:
We demonstrate a novel atom chip trap** system that allows the placement and high-resolution imaging of ultracold atoms within microns from any <100 um-thin, UHV-compatible material, while also allowing sample exchange with minimal experimental downtime. The sample is not connected to the atom chip, allowing rapid exchange without perturbing the atom chip or laser cooling apparatus. Exchange of…
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We demonstrate a novel atom chip trap** system that allows the placement and high-resolution imaging of ultracold atoms within microns from any <100 um-thin, UHV-compatible material, while also allowing sample exchange with minimal experimental downtime. The sample is not connected to the atom chip, allowing rapid exchange without perturbing the atom chip or laser cooling apparatus. Exchange of the sample and retrap** of atoms has been performed within a week turnaround, limited only by chamber baking. Moreover, the decoupling of sample and atom chip provides the ability to independently tune the sample temperature and its position with respect to the trapped ultracold gas, which itself may remain in the focus of a high-resolution imaging system. As a first demonstration of this new system, we have confined a 700-nK cloud of 8x10^4 87Rb atoms within 100 um of a gold-mirrored 100-um-thick silicon substrate. The substrate was cooled to 35 K without use of a heat shield, while the atom chip, 120 um away, remained at room temperature. Atoms may be imaged and retrapped every 16 s, allowing rapid data collection.
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Submitted 8 November, 2013;
originally announced November 2013.
