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Radiation hardness of a p-channel notch CCD developed for the X-ray CCD camera onboard the XRISM satellite
Authors:
Yoshiaki Kanemaru,
** Sato,
Koji Mori,
Hiroshi Nakajima,
Yusuke Nishioka,
Ayaki Takeda,
Kiyoshi Hayashida,
Hironori Matsumoto,
Junichi Iwagaki,
Koki Okazaki,
Kazunori Asakura,
Tomokage Yoneyama,
Hiroyuki Uchida,
Hiromichi Okon,
Takaaki Tanaka,
Takeshi G. Tsuru,
Hiroshi Tomida,
Takeo Shimoi,
Takayoshi Kohmura,
Kouichi Hagino,
Hiroshi Murakami,
Shogo B. Kobayashi,
Makoto Yamauchi,
Isamu Hatsukade,
Masayoshi Nobukawa
, et al. (8 additional authors not shown)
Abstract:
We report the radiation hardness of a p-channel CCD developed for the X-ray CCD camera onboard the XRISM satellite. This CCD has basically the same characteristics as the one used in the previous Hitomi satellite, but newly employs a notch structure of potential for signal charges by increasing the implant concentration in the channel. The new device was exposed up to approximately…
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We report the radiation hardness of a p-channel CCD developed for the X-ray CCD camera onboard the XRISM satellite. This CCD has basically the same characteristics as the one used in the previous Hitomi satellite, but newly employs a notch structure of potential for signal charges by increasing the implant concentration in the channel. The new device was exposed up to approximately $7.9 \times 10^{10} \mathrm{~protons~cm^{-2}}$ at 100 MeV. The charge transfer inefficiency was estimated as a function of proton fluence with an ${}^{55} \mathrm{Fe}$ source. A device without the notch structure was also examined for comparison. The result shows that the notch device has a significantly higher radiation hardness than those without the notch structure including the device adopted for Hitomi. This proves that the new CCD is radiation tolerant for space applications with a sufficient margin.
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Submitted 1 June, 2019;
originally announced June 2019.
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Development of a 32-channel ASIC for an X-ray APD Detector onboard the ISS
Authors:
M. Arimoto,
S. Harita,
S. Sugita,
Y. Yatsu,
N. Kawai,
H. Ikeda,
H. Tomida,
N. Isobe,
S. Ueno,
T. Mihara,
M. Serino,
T. Kohmura,
T. Sakamoto,
A. Yoshida,
H. Tsunemi,
S. Hatori,
K. Kume,
T. Hasegawa
Abstract:
We report on the design and performance of a mixed-signal application specific integrated circuit (ASIC) dedicated to avalanche photodiodes (APDs) in order to detect hard X-ray emissions in a wide energy band onboard the International Space Station. To realize wide-band detection from 20 keV to 1 MeV, we use Ce:GAGG scintillators, each coupled to an APD, with low-noise front-end electronics capabl…
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We report on the design and performance of a mixed-signal application specific integrated circuit (ASIC) dedicated to avalanche photodiodes (APDs) in order to detect hard X-ray emissions in a wide energy band onboard the International Space Station. To realize wide-band detection from 20 keV to 1 MeV, we use Ce:GAGG scintillators, each coupled to an APD, with low-noise front-end electronics capable of achieving a minimum energy detection threshold of 20 keV. The developed ASIC has the ability to read out 32-channel APD signals using 0.35 $μ$m CMOS technology, and an analog amplifier at the input stage is designed to suppress the capacitive noise primarily arising from the large detector capacitance of the APDs. The ASIC achieves a performance of 2099 e$^{-}$ + 1.5 e$^{-}$/pF at root mean square (RMS) with a wide 300 fC dynamic range. Coupling a reverse-type APD with a Ce:GAGG scintillator, we obtain an energy resolution of 6.7% (FWHM) at 662 keV and a minimum detectable energy of 20 keV at room temperature (20 $^{\circ}$C). Furthermore, we examine the radiation tolerance for space applications by using a 90 MeV proton beam, confirming that the ASIC is free of single-event effects and can operate properly without serious degradation in analog and digital processing.
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Submitted 17 November, 2017;
originally announced November 2017.
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Single event effect characterization of the mixed-signal ASIC developed for CCD camera in space use
Authors:
Hiroshi Nakajima,
Mari Fujikawa,
Hideki Mori,
Hiroaki Kan,
Shutaro Ueda,
Hiroko Kosugi,
Naohisa Anabuki,
Kiyoshi Hayashida,
Hiroshi Tsunemi,
John P. Doty,
Hirokazu Ikeda,
Hisashi Kitamura,
Yukio Uchihori
Abstract:
We present the single event effect (SEE) tolerance of a mixed-signal application-specific integrated circuit (ASIC) developed for a charge-coupled device camera onboard a future X-ray astronomical mission. We adopted proton and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear energy transfer (LET) of 57.9 MeV cm^{2}/mg is used to measure the single event latch-up (SEL) tolera…
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We present the single event effect (SEE) tolerance of a mixed-signal application-specific integrated circuit (ASIC) developed for a charge-coupled device camera onboard a future X-ray astronomical mission. We adopted proton and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear energy transfer (LET) of 57.9 MeV cm^{2}/mg is used to measure the single event latch-up (SEL) tolerance, which results in a sufficiently low cross-section of sigma_{SEL} < 4.2x10^{-11} cm^{2}/(IonxASIC). The single event upset (SEU) tolerance is estimated with various kinds of species with wide range of energy. Taking into account that a part of the protons creates recoiled heavy ions that has higher LET than that of the incident protons, we derived the probability of SEU event as a function of LET. Then the SEE event rate in a low-earth orbit is estimated considering a simulation result of LET spectrum. SEL rate is below once per 49 years, which satisfies the required latch-up tolerance. The upper limit of the SEU rate is derived to be 1.3x10^{-3}events/sec. Although the SEU events cannot be distinguished from the signals of X-ray photons from astronomical objects, the derived SEU rate is below 1.3% of expected non-X-ray background rate of the detector and hence these events should not be a major component of the instrumental background.
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Submitted 11 July, 2013;
originally announced July 2013.
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Development of the analog ASIC for multi-channel readout X-ray CCD camera
Authors:
Hiroshi Nakajima,
Daisuke Matsuura,
Toshihiro Idehara,
Naohisa Anabuki,
Hiroshi Tsunemi,
John P. Doty,
Hirokazu Ikeda,
Haruyoshi Katayama,
Hisashi Kitamura,
Yukio Uchihori
Abstract:
We report on the performance of an analog application-specific integrated circuit (ASIC) developed aiming for the front-end electronics of the X-ray CCDcamera system onboard the next X-ray astronomical satellite, ASTRO-H. It has four identical channels that simultaneously process the CCD signals. Distinctive capability of analog-to-digital conversion enables us to construct a CCD camera body that…
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We report on the performance of an analog application-specific integrated circuit (ASIC) developed aiming for the front-end electronics of the X-ray CCDcamera system onboard the next X-ray astronomical satellite, ASTRO-H. It has four identical channels that simultaneously process the CCD signals. Distinctive capability of analog-to-digital conversion enables us to construct a CCD camera body that outputs only digital signals. As the result of the front-end electronics test, it works properly with low input noise of =<30 uV at the pixel rate below 100 kHz. The power consumption is sufficiently low of about 150 mW/chip. The input signal range of 720 mV covers the effective energy range of the typical X-ray photon counting CCD (up to 20 keV). The integrated non-linearity is 0.2% that is similar as those of the conventional CCDs in orbit. We also performed a radiation tolerance test against the total ionizing dose (TID) effect and the single event effect. The irradiation test using 60Co and proton beam showed that the ASIC has the sufficient tolerance against TID up to 200 krad, which absolutely exceeds the expected amount of dose during the period of operating in a low-inclination low-earth orbit. The irradiation of Fe ions with the fluence of 5.2x10^8 Ion/cm2 resulted in no single event latchup (SEL), although there were some possible single event upsets. The threshold against SEL is higher than 1.68 MeV cm^2/mg, which is sufficiently high enough that the SEL event should not be one of major causes of instrument downtime in orbit.
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Submitted 11 February, 2011;
originally announced February 2011.
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Proton Irradiation Experiment for the X-ray Charge-Coupled Devices of the Monitor of All-sky X-ray Image mission onboard the International Space Station: I. Experimental Setup and Measurement of the Charge Transfer Inefficiency
Authors:
E. Miyata,
T. Kamazuka,
H. Kouno,
M. Fukuda M. Mihara,
K. Matsuta,
H. Tsunemi,
K. Tanaka,
T Minamisono,
H. Tomida,
K. Miyaguchi
Abstract:
We have investigated the radiation damage effects on a CCD to be employed in the Japanese X-ray astronomy mission including the Monitor of All-sky X-ray Image (MAXI) onboard the International Space Station (ISS). Since low energy protons release their energy mainly at the charge transfer channel, resulting a decrease of the charge transfer efficiency, we thus focused on the low energy protons in…
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We have investigated the radiation damage effects on a CCD to be employed in the Japanese X-ray astronomy mission including the Monitor of All-sky X-ray Image (MAXI) onboard the International Space Station (ISS). Since low energy protons release their energy mainly at the charge transfer channel, resulting a decrease of the charge transfer efficiency, we thus focused on the low energy protons in our experiments. A 171 keV to 3.91 MeV proton beam was irradiated to a given device. We measured the degradation of the charge transfer inefficiency (CTI) as a function of incremental fluence. A 292 keV proton beam degraded the CTI most seriously. Taking into account the proton energy dependence of the CTI, we confirmed that the transfer channel has the lowest radiation tolerance. We have also developed the different device architectures to reduce the radiation damage in orbit. Among them, the ``notch'' CCD, in which the buried channel implant concentration is increased, resulting in a deeper potential well than outside, has three times higher radiation tolerance than that of the normal CCD. We then estimated the charge transfer inefficiency of the CCD in the orbit of ISS, considering the proton energy spectrum. The CTI value is estimated to be 1.1e-5 per each transfer after two years of mission life in the worse case analysis if the highest radiation-tolerant device is employed. This value is well within the acceptable limit and we have confirmed the high radiation-tolerance of CCDs for the MAXI mission.
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Submitted 26 August, 2002;
originally announced August 2002.
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Application of the Mesh Experiment for the Back-Illuminated CCD: I. Experiment and the Charge Cloud Shape
Authors:
E. Miyata,
M. Miki,
J. Hiraga,
H. Kouno,
K. Yasui,
H. Tsunemi,
K. Miyaguchi,
K. Yamamoto
Abstract:
We have employed a mesh experiment for back-illuminated (BI) CCDs. BI CCDs possess the same structure to those of FI CCDs. Since X-ray photons enter from the back surface of the CCD, a primary charge cloud is formed far from the electrodes. The primary charge cloud expands through diffusion process until it reaches the potential well that is just below the electrodes. Therefore, the diffusion ti…
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We have employed a mesh experiment for back-illuminated (BI) CCDs. BI CCDs possess the same structure to those of FI CCDs. Since X-ray photons enter from the back surface of the CCD, a primary charge cloud is formed far from the electrodes. The primary charge cloud expands through diffusion process until it reaches the potential well that is just below the electrodes. Therefore, the diffusion time for the charge cloud produced is longer than that in the FI CCD, resulting a larger charge cloud shape expected.
The mesh experiment enables us to specify the X-ray point of interaction with a subpixel resolution. We then have measured a charge cloud shape produced in the BI CCD. We found that there are two components of the charge cloud shape having different size: a narrow component and a broad component. The size of the narrow component is $2.8-5.7 μ$m in unit of a standard deviation and strongly depends on the attenuation length in Si of incident X-rays. The shorter the attenuation length of X-rays is, the larger the charge cloud becomes. This result is qualitatively consistent with a diffusion model inside the CCD. On the other hand, the size of the broad component is roughly constant of $\simeq 13 μ$m and does not depend on X-ray energies. Judging from the design value of the CCD and the fraction of each component, we conclude that the narrow component is originated in the depletion region whereas the broad component is in the field-free region.
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Submitted 9 June, 2002;
originally announced June 2002.
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Direct X-ray Imaging of $μ$m precision using Back-Illuminated CCD
Authors:
E. Miyata,
M. Miki,
H. Tsunemi,
J. Hiraga,
H. Kouno,
K. Miyaguchi
Abstract:
A charge-coupled device (CCD) is a standard imager in optical region in which the image quality is limited by its pixel size. CCDs also function in X-ray region but with substantial differences in performance. An optical photon generates only one electron while an X-ray photon generates many electrons at a time. We developed a method to precisely determine the X-ray point of interaction with sub…
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A charge-coupled device (CCD) is a standard imager in optical region in which the image quality is limited by its pixel size. CCDs also function in X-ray region but with substantial differences in performance. An optical photon generates only one electron while an X-ray photon generates many electrons at a time. We developed a method to precisely determine the X-ray point of interaction with subpixel resolution. In particular, we found that a back-illuminated CCD efficiently functions as a fine imager. We present here the validity of our method through an actual imaging experiment.
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Submitted 1 April, 2002;
originally announced April 2002.
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Subpixel Spatial Resolution of the X-Ray Charge-Coupled Device Based on the Charge Cloud Shape
Authors:
J. Hiraga,
H. Tsunemi,
E. Miyata
Abstract:
When an X-ray photon lands into a pixel (event pixel), the primary charge is mainly collected into the event pixel. If the X-ray landing position is sufficiently close to the pixel boundary, the primary charge spills over to the adjacent pixel forming split events. We can easily understand that there are three parameters coupled together; the X-ray landing position inside the pixel, the X-ray ev…
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When an X-ray photon lands into a pixel (event pixel), the primary charge is mainly collected into the event pixel. If the X-ray landing position is sufficiently close to the pixel boundary, the primary charge spills over to the adjacent pixel forming split events. We can easily understand that there are three parameters coupled together; the X-ray landing position inside the pixel, the X-ray event pattern and the primary charge cloud shape. We can determine any one of them from the other two parameters. Since we know the charge cloud shape using the multi-pitch mesh experiment, we can calculate the X-ray landing position with subpixel resolution using the event pattern. We applied our method to Ti-K X-rays for the charge-coupled device with $12 μ$m square pixel. Once the primary charge splits into the adjacent pixel, we can determine the X-ray landing position with subpixel resolution. Using three- or four-pixel split events, we can determine the X-ray landing position with an accuracy of less than $1 μ$m. For a two-pixel split event, we obtained a similar position accuracy in the split direction with no improvement in the direction perpendicular to it. We will discuss the type of CCD which can achieve the subpixel resolution for the entire area of the CCD.
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Submitted 10 January, 2001;
originally announced January 2001.
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Direct measurement of sub-pixel structure of the EPIC MOS CCD on-board th e XMM/NEWTON satellite
Authors:
J. Hiraga,
H. Tsunemi,
A. D. Short,
A. F. Abbey,
P. J. Bennie,
M. J. L. Turner
Abstract:
We have used a mesh experiment in order to measure the sub-pixel structure of the EPIC MOS CCDs on-board the XMM/NEWTON satellite. The EPIC MOS CCDs have 40 $μ$m-square pixels which have an open electrode structure in order to improve the detection efficiency for low-energy X-rays. We obtained restored pixel images for various X-ray event grades (e.g. split-pixel events, single pixel events, etc…
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We have used a mesh experiment in order to measure the sub-pixel structure of the EPIC MOS CCDs on-board the XMM/NEWTON satellite. The EPIC MOS CCDs have 40 $μ$m-square pixels which have an open electrode structure in order to improve the detection efficiency for low-energy X-rays. We obtained restored pixel images for various X-ray event grades (e.g. split-pixel events, single pixel events, etc.) at various X-ray energies.
We confirmed that the open electrode structure results in a distorted horizontal pixel boundary. The open electrode region generates both single pixel events and vertically split events, but no horizontally split events. Because the single pixel events usually show the best energy resolution, we discuss a method of increasing the fraction of single pixel events from the open electrode region. Furthermore, we have directly measured the thickness of the electrodes and dead-layers by comparing spectra from the open electrode region with those from the other regions: electrodes, electrode finger and channel stop. We can say that EPIC MOS CCDs are more radiation hard than front-illumination chips of ACIS on-board Chandra X-ray Observatory because of their extra absorption thickness above the charge transfer channel. We calcurated the mean pixel response and found that our estimation has a good agreement with that of the ground calibration of EPIC MOS CCD.
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Submitted 11 December, 2000;
originally announced December 2000.
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X-ray Measurement of the subpixel structure of the XMM EPIC MOS CCD
Authors:
H. Tsunemi,
K. Yoshita,
A. D. Short,
P. J. Bennie,
M. J. L. Turner,
A. F. Abbey
Abstract:
We report here the results of a mesh experiment to measure the subpixel structure of the EPIC MOS CCDs on board the XMM X-ray observatory. The pixel size is 40$μ$m square while the mesh hole spacing is 48$μ$m, a combination quite different from our standard mesh experiment. We have verified that this combination functions properly and have analyzed the CCD structure with sub-pixel resolution. Th…
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We report here the results of a mesh experiment to measure the subpixel structure of the EPIC MOS CCDs on board the XMM X-ray observatory. The pixel size is 40$μ$m square while the mesh hole spacing is 48$μ$m, a combination quite different from our standard mesh experiment. We have verified that this combination functions properly and have analyzed the CCD structure with sub-pixel resolution. The EPIC MOS CCD has an open electrode structure to improve detection efficiency at low energies. We obtained the distribution of various grades of X-ray events inside the pixel. A horizontally split two-pixel event is generated near the channel stop which forms a straight vertical pixel boundary whereas a vertically split two-pixel event is generated where the potential due to the thinned gate structure forms a wavy horizontal pixel boundary. Therefore, the effective pixel shape is not a square but is distorted. The distribution of X-ray events clearly shows that the two etched regions in each pixel, separated by the bridging finger of the enlarged (open) electrode. We measured the difference in X-ray transmission between the conventional and open regions of the pixel using O-K and Cu-L X-ray emission lines, and found it to be consistent with an electrode thickness comprising $0.2\pm0.1μ$m of Si and $0.6\pm0.2μ$m of SiO2.
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Submitted 2 October, 1999;
originally announced October 1999.
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The X-ray CCD camera of the MAXI Experiment on the ISS/JEM
Authors:
E. Miyata,
H. Tsunemi,
H. Ogata,
D. Akutsu,
K. Yoshita,
Y. Hashimoto,
K. Torii,
M. Matsuoka,
N. Kawai,
A. Yoshida,
T. Mihara,
T. Kotani,
H. Negoro,
H. Kubo,
H. Matsumoto,
Y. Shirasaki,
B. C. Rubin,
I. Sakurai,
M. Yamauchi
Abstract:
MAXI, Monitor of All-sky X-ray Image, is the X-ray observatory on the Japanese experimental module (JEM) Exposed Facility (EF) on the International Space Station (ISS). MAXI is a slit scanning camera which consists of two kinds of X-ray detectors: one is a one-dimensional position-sensitive proportional counter with a total area of $\sim 5000 cm^2$, the Gas Slit Camera (GSC), and the other is an…
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MAXI, Monitor of All-sky X-ray Image, is the X-ray observatory on the Japanese experimental module (JEM) Exposed Facility (EF) on the International Space Station (ISS). MAXI is a slit scanning camera which consists of two kinds of X-ray detectors: one is a one-dimensional position-sensitive proportional counter with a total area of $\sim 5000 cm^2$, the Gas Slit Camera (GSC), and the other is an X-ray CCD array with a total area $\sim 200 cm^2$, the Solid-state Slit Camera (SSC). The GSC subtends a field of view with an angular dimension of 1$^\circ\times 180^\circ$ while the SSC subtends a field of view with an angular dimension of 1$^\circ$ times a little less than 180$^\circ$. In the course of one station orbit, MAXI can scan almost the entire sky with a precision of 1$^\circ$ and with an X-ray energy range of 0.5-30 keV. We have developed the engineering model of CCD chips and the analogue electronics for the SSC. The energy resolution of EM CCD for Mn K$α$ has a full-width at half maximum of $\simeq$ 182 eV. Readout noise is $\simeq$ 11 e^- rms.
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Submitted 8 April, 1999;
originally announced April 1999.
