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Identifying charge density and dielectric environment of graphene using Raman spectroscopy and deep learning
Authors:
Zhuofa Chen,
Yousif Khaireddin,
Anna K. Swan
Abstract:
The impact of the environment on graphene's properties such as strain, charge density, and dielectric environment can be evaluated by Raman spectroscopy. These environmental interactions are not trivial to determine, since they affect the spectra in overlap** ways. Data preprocessing such as background subtraction and peak fitting is typically used. Moreover, collected spectroscopic data vary du…
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The impact of the environment on graphene's properties such as strain, charge density, and dielectric environment can be evaluated by Raman spectroscopy. These environmental interactions are not trivial to determine, since they affect the spectra in overlap** ways. Data preprocessing such as background subtraction and peak fitting is typically used. Moreover, collected spectroscopic data vary due to different experimental setups and environments. Such variations, artifacts, and environmental differences pose a challenge in accurate spectral analysis. In this work, we developed a deep learning model to overcome the effects of such variations and classify graphene Raman spectra according to different charge densities and dielectric environments. We consider two approaches: deep learning models and machine learning algorithms to classify spectra with slightly different charge density or dielectric environment. These two approaches show similar success rates for high Signal-to-Noise data. However, deep learning models are less sensitive to noise. To improve the accuracy and generalization of all models, we use data augmentation through additive noise and peak shifting. We demonstrated the spectra classification with 99% accuracy using a convolutional neural net (CNN) model. The CNN model is able to classify Raman spectra of graphene with different charge do** levels and even subtle variation in the spectra between graphene on SiO$_2$ and graphene on silanized SiO$_2$. Our approach has the potential for fast and reliable estimation of graphene do** levels and dielectric environments. The proposed model paves the way for achieving efficient analytical tools to evaluate the properties of graphene.
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Submitted 24 February, 2022;
originally announced March 2022.
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Ultra-low do** and local charge variation in graphene measured by Raman: experiment and simulation
Authors:
Zhuofa Chen,
Nathan Ullberg,
Mounika Vutukuru,
David Barton,
Anna K Swan
Abstract:
Avoiding charge density variations and impurities in graphene is vital for high-quality graphene-based devices. Here, we demonstrate an optical method using Raman 2D peak-split to monitor charge density variations in the range 1-25e10 cm-2. We compare Raman signatures with electrostatically gated Raman and transport measurements to correlate the 2D peak-split with the charge density on graphene wi…
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Avoiding charge density variations and impurities in graphene is vital for high-quality graphene-based devices. Here, we demonstrate an optical method using Raman 2D peak-split to monitor charge density variations in the range 1-25e10 cm-2. We compare Raman signatures with electrostatically gated Raman and transport measurements to correlate the 2D peak-split with the charge density on graphene with high precision. We found that the Raman 2D peak-split and peak areas linearly varies with the charge density, where a lower charge density results in a larger 2D peak-split. We simulate Raman 2D spectra under various do** conditions to study the correlation between Raman 2D peak and charge puddles. These simulations give qualitative agreement with experimental results. Our work provides a simple and non-invasive optical method for estimating the do** level, local charge density variation and transport properties of graphene before fabricating graphene devices, with up to two orders of magnitude higher precision than previously reported optical methods.
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Submitted 8 May, 2020;
originally announced May 2020.
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Monitoring the low do** regime in graphene using Raman 2D peak-splits: Comparison of gated Raman and transport measurements
Authors:
Zhuofa Chen,
Nathan Ullberg,
Mounika Vutukuru,
David Barton,
Anna K Swan
Abstract:
Avoiding charge density fluctuations and impurities in graphene is vital for high-quality graphene-based devices. Traditional characterization methods require device fabrication and electrical transport measurements, which are labor-intensive and time-consuming. Existing optical methods using Raman spectroscopy only work for do** levels higher than ~10^12 cm^-2. Here, we propose an optical metho…
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Avoiding charge density fluctuations and impurities in graphene is vital for high-quality graphene-based devices. Traditional characterization methods require device fabrication and electrical transport measurements, which are labor-intensive and time-consuming. Existing optical methods using Raman spectroscopy only work for do** levels higher than ~10^12 cm^-2. Here, we propose an optical method using Raman 2D peak-splitting (split between the Raman 2D1 and 2D2 peaks at low do** levels). Electrostatically gated Raman measurements combined with transport measurements were used to correlate the 2D peak-split with the charge density on graphene with high precision (2x10^10 cm^-2 per 2D peak-split wavenumber). We found that the Raman 2D peak-split has a strong correlation with the charge density at low do** levels, and that a lower charge density results in a larger 2D peak-split. Our work provides a simple and non-invasive optical method to quantify the do** level of graphene from 10^10 cm^-2 to 10^12 cm^-2, two orders of magnitude higher precision than previously reported optical methods. This method provides a platform for estimating the do** level and quality of graphene before fabricating graphene devices
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Submitted 28 August, 2019;
originally announced August 2019.
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Modeling and Thermal Metrology of Thermally Isolated MEMS Electrothermal Actuators for Strain Engineering of 2D Materials
Authors:
Mounika Vutukuru,
Jason W. Christopher,
Corey Pollock,
David J. Bishop,
Anna K. Swan
Abstract:
We present electrothermal microelectromechanical (MEMS) actuators as a practical platform for straining 2D materials. The advantages of the electrothermal actuator is its high output force and displacement for low input voltage, but its drawback is that it is actuated by generating high amounts of heat. It is crucial to mitigate the high temperatures generated during actuation for reliable 2D mate…
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We present electrothermal microelectromechanical (MEMS) actuators as a practical platform for straining 2D materials. The advantages of the electrothermal actuator is its high output force and displacement for low input voltage, but its drawback is that it is actuated by generating high amounts of heat. It is crucial to mitigate the high temperatures generated during actuation for reliable 2D material strain device implementation. Here, we implement a chevron actuator design that incorporates a thermal isolation stage in order to avoid heating the 2D material from the high temperatures generated during the actuation. By comparing experiment and simulation, we ensure our design does not compromise output displacement, while kee** the 2D material strain device stage cool. We also provide a simple analytical model useful for quickly evaluating different thermal isolation stage designs.
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Submitted 13 November, 2018;
originally announced November 2018.
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Phase sensitive detection of dipole radiation in a fiber-based high numerical aperture optical system
Authors:
A. N. Vamivakas,
M. Dogan,
S. B. Ippolito,
E. R. Behringer,
A. K. Swan,
B. B. Goldberg,
M. S. Unlu
Abstract:
We theoretically study the problem of detecting dipole radiation in an optical system of high numerical aperture in which the detector is sensitive to \textit{field amplitude}. In particular, we model the phase sensitive detector as a single-mode cylindrical optical fiber. We find that the maximum in collection efficiency of the dipole radiation does not coincide with the optimum resolution for…
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We theoretically study the problem of detecting dipole radiation in an optical system of high numerical aperture in which the detector is sensitive to \textit{field amplitude}. In particular, we model the phase sensitive detector as a single-mode cylindrical optical fiber. We find that the maximum in collection efficiency of the dipole radiation does not coincide with the optimum resolution for the light gathering instrument. The calculated results are important for analyzing fiber-based confocal microscope performance in fluorescence and spectroscopic studies of single molecules and/or quantum dots.
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Submitted 20 September, 2006;
originally announced September 2006.