Color of Copper/Copper oxide
Authors:
Su Jae Kim,
Seonghoon Kim,
Jegon Lee,
Youngjae Jo,
Yu-Seong Seo,
Myounghoon Lee,
Yousil Lee,
Chae Ryong Cho,
Jong-pil Kim,
Miyeon Cheon,
Jungseek Hwang,
Yong In Kim,
Young-Hoon Kim,
Young-Min Kim,
Aloysius Soon,
Myunghwan Choi,
Woo Seok Choi,
Se-Young Jeong,
Young Hee Lee
Abstract:
Stochastic inhomogeneous oxidation is an inherent characteristic of copper (Cu), often hindering color tuning and bandgap engineering of oxides. Coherent control of the interface between metal and metal oxide remains unresolved. We demonstrate coherent propagation of an oxidation front in single-crystal Cu thin film to achieve a full-color spectrum for Cu by precisely controlling its oxide-layer t…
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Stochastic inhomogeneous oxidation is an inherent characteristic of copper (Cu), often hindering color tuning and bandgap engineering of oxides. Coherent control of the interface between metal and metal oxide remains unresolved. We demonstrate coherent propagation of an oxidation front in single-crystal Cu thin film to achieve a full-color spectrum for Cu by precisely controlling its oxide-layer thickness. Grain boundary-free and atomically flat films prepared by atomic-sputtering epitaxy allow tailoring of the oxide layer with an abrupt interface via heat treatment with a suppressed temperature gradient. Color tuning of nearly full-color RGB indices is realized by precise control of oxide-layer thickness; our samples covered ~50.4% of the sRGB color space. The color of copper/copper oxide is realized by the reconstruction of the quantitative yield color from oxide pigment (complex dielectric functions of Cu2O) and light-layer interference (reflectance spectra obtained from the Fresnel equations) to produce structural color. We further demonstrate laser-oxide lithography with micron-scale linewidth and depth through local phase transformation to oxides embedded in the metal, providing spacing necessary for semiconducting transport and optoelectronics functionality.
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Submitted 15 July, 2021;
originally announced July 2021.
The basis for design of a DSP-based coincidence spectrometer
Authors:
Pham Dinh Khang,
Nguyen Xuan Hai,
Nguyen Nhi Dien,
Pham Ngoc Tuan,
Dang Lanh,
Nguyen Duc Hoa,
Nguyen An Son
Abstract:
Coincidence technique and the coincidence measurement systems have been developed and applied for over 40 years. Most of popular coincidence measurement systems were based on analog electronics techniques such as time to amplitude conversion (TAC) or logic selecting coincidence unit. The above-mentioned systems are relatively cumbersome and complicated to use. With the strong growth of digital ele…
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Coincidence technique and the coincidence measurement systems have been developed and applied for over 40 years. Most of popular coincidence measurement systems were based on analog electronics techniques such as time to amplitude conversion (TAC) or logic selecting coincidence unit. The above-mentioned systems are relatively cumbersome and complicated to use. With the strong growth of digital electronics techniques and computational science, the coincidence measurement systems will be constructed simpler but more efficient with the sake of application. This article presents the design principle and signal processing of a simple two-channel coincidence system by a new technique called Digital Signal Processing (DSP) using Field Programmable Gate Arrays (FPGA) devices at Nuclear Research Institute (NRI), Dalat.
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Submitted 1 July, 2013;
originally announced July 2013.
