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High-resolution spatio-temporal strain imaging reveals loss mechanisms in a surface acoustic wave device
Authors:
Tao Zhou,
Alexandre Reinhardt,
Marie Bousquet,
Joel Eymery,
Steven Leake,
Martin V. Holt,
Paul G. Evans,
Tobias Schülli
Abstract:
Surface acoustic wave devices are key components for processing radio frequency signals in wireless communication because these devices offer simultaneously high performance, compact size and low cost. The optimization of the device structure requires a quantitative understanding of energy conversion and loss mechanisms. Stroboscopic full-field diffraction x-ray microscopy studies of a prototypica…
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Surface acoustic wave devices are key components for processing radio frequency signals in wireless communication because these devices offer simultaneously high performance, compact size and low cost. The optimization of the device structure requires a quantitative understanding of energy conversion and loss mechanisms. Stroboscopic full-field diffraction x-ray microscopy studies of a prototypical one-port resonator device revealed the existence of unanticipated acoustic loss. A non-uniform acoustic excitation in the active area was responsible for the substantial end and side leakages observed at the design frequency. Quantitative analysis of the strain amplitude using a wave decomposition method allowed the determination of several key device parameters. This high-resolution spatiotemporal strain imaging technique is, more generally, suited for studying nanophononics, specifically when the feature size is smaller than optical wavelengths. The strain sensitivity allows precise measurement of acoustic waves with picometer-scale amplitude.
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Submitted 20 April, 2024;
originally announced May 2024.
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Variable-wavelength quick scanning nano-focused X-ray microscopy for in situ strain and tilt map**
Authors:
Marie-ingrid Richard,
Thomas W Cornelius,
Florian Lauraux,
Jean-Baptiste Molin,
Christoph Kirchlechner,
Steven J Leake,
Jérôme Carnis,
Tobias U Schülli,
Ludovic Thilly,
Olivier Thomas
Abstract:
Compression of micro-pillars is followed in situ by a quick nano-focused X-ray scanning microscopy technique combined with three-dimensional reciprocal space map**. Compared to other attempts using 2 X-ray nanobeams, it avoids any motion or vibration that would lead to a destruction of the sample. The technique consists of scanning both the energy of the incident nano-focused X-ray beam and the…
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Compression of micro-pillars is followed in situ by a quick nano-focused X-ray scanning microscopy technique combined with three-dimensional reciprocal space map**. Compared to other attempts using 2 X-ray nanobeams, it avoids any motion or vibration that would lead to a destruction of the sample. The technique consists of scanning both the energy of the incident nano-focused X-ray beam and the in-plane translations of the focusing optics along the X-ray beam. Here, we demonstrate the approach by imaging the strain and lattice orientation of Si micro-pillars and their pedestals during in situ compression. Varying the energy of the incident beam instead of rocking the sample and map** the focusing optics instead of moving the sample supplies a vibration-free measurement of the reciprocal space maps without removal of the mechanical load. The maps of strain and lattice orientation are in good agreement with the ones recorded by ordinary rocking-curve scans. Variable-wavelength quick scanning X-ray microscopy opens the route for in situ strain and tilt map** towards more diverse and complex materials environments, especially where sample manipulation is difficult.
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Submitted 27 June, 2022;
originally announced June 2022.
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A convolutional neural network for defect classification in Bragg coherent X-ray diffraction
Authors:
Bruce Lim,
Ewen Bellec,
Maxime Dupraz,
Steven Leake,
Andrea Resta,
Alessandro Coati,
Michael Sprung,
Ehud Almog,
Eugen Rabkin,
Tobias Schülli,
Marie-Ingrid Richard
Abstract:
Coherent diffraction imaging enables the imaging of individual defects, such as dislocations or stacking faults, in materials.These defects and their surrounding elastic strain fields have a critical influence on the macroscopic properties and functionality of materials. However, their identification in Bragg coherent diffraction imaging remains a challenge and requires significant data mining. Th…
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Coherent diffraction imaging enables the imaging of individual defects, such as dislocations or stacking faults, in materials.These defects and their surrounding elastic strain fields have a critical influence on the macroscopic properties and functionality of materials. However, their identification in Bragg coherent diffraction imaging remains a challenge and requires significant data mining. The ability to identify defects from the diffraction pattern alone would be a significant advantage when targeting specific defect types and accelerates experiment design and execution. Here, we exploit a computational tool based on a three-dimensional (3D) parametric atomistic model and a convolutional neural network to predict dislocations in a crystal from its 3D coherent diffraction pattern. Simulated diffraction patterns from several thousands of relaxed atomistic configurations of nanocrystals are used to train the neural network and to predict the presence or absence of dislocations as well as their type(screw or edge). Our study paves the way for defect recognition in 3D coherent diffraction patterns for material science
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Submitted 30 June, 2021;
originally announced June 2021.
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Spatially-resolved luminescence and crystal structure of single core-shell nanowires measured in the as-grown geometry
Authors:
Ali AlHassan,
Jonas Lähnemann,
Steven Leake,
Hanno Küpers,
Michael Niehle,
Danial Bahrami,
Florian Bertram,
Ryan B. Lewis,
Arman Davtyan,
Tobias Schülli,
Lutz Geelhaar,
Ullrich Pietsch
Abstract:
We report on the direct correlation between the structural and optical properties of single, as-grown core-multi-shell GaAs/In$_{0.15}$Ga$_{0.85}$As/GaAs/AlAs/GaAs nanowires. Fabricated by molecular beam epitaxy on a pre-patterned Si(111) substrate, on a row of well separated nucleation sites, it was possible to access individual nanowires in the as-grown geometry. The polytype distribution along…
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We report on the direct correlation between the structural and optical properties of single, as-grown core-multi-shell GaAs/In$_{0.15}$Ga$_{0.85}$As/GaAs/AlAs/GaAs nanowires. Fabricated by molecular beam epitaxy on a pre-patterned Si(111) substrate, on a row of well separated nucleation sites, it was possible to access individual nanowires in the as-grown geometry. The polytype distribution along the growth axis of the nanowires was revealed by synchrotron-based nanoprobe X-ray diffraction techniques monitoring the axial 111 Bragg reflection. For the same nanowires, the spatially-resolved emission properties were obtained by cathodoluminescence hyperspectral linescans in a scanning electron microscope. Correlating both measurements, we reveal a blueshift of the shell quantum well emission energy combined with an increased emission intensity for segments exhibiting a mixed structure of alternating wurtzite and zincblende stacking compared with the pure crystal polytypes. The presence of this mixed structure was independently confirmed by cross-sectional transmission electron microscopy.
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Submitted 19 February, 2020;
originally announced February 2020.
