Showing 1–7 of 7 results for author: Savitzky, B H

The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy

Authors: Peter Ercius, Ian J. Johnson, Philipp Pelz, Benjamin H. Savitzky, Lauren Hughes, Hamish G. Brown, Steven E. Zeltmann, Shang-Lin Hsu, Cassio C. S. Pedroso, Bruce E. Cohen, Ramamoorthy Ramesh, David Paul, John M. Joseph, Thorsten Stezelberger, Cory Czarnik, Matthew Lent, Erin Fong, Jim Ciston, Mary C. Scott, Colin Ophus, Andrew M. Minor, and Peter Denes

Abstract: We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700… ▽ More We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 - 300 keV. Through electron counting, the resulting sparse data sets are reduced in size by 10 - 300x compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex 4D-STEM experiments to be accomplished with typical STEM scanning parameters. △ Less

Submitted 19 May, 2023; originally announced May 2023.

Disentangling multiple scattering with deep learning: application to strain map** from electron diffraction patterns

Authors: Joydeep Munshi, Alexander Rakowski, Benjamin H Savitzky, Steven E Zeltmann, Jim Ciston, Matthew Henderson, Shreyas Cholia, Andrew M Minor, Maria KY Chan, Colin Ophus

Abstract: Implementation of a fast, robust, and fully-automated pipeline for crystal structure determination and underlying strain map** for crystalline materials is important for many technological applications. Scanning electron nanodiffraction offers a procedure for identifying and collecting strain maps with good accuracy and high spatial resolutions. However, the application of this technique is limi… ▽ More Implementation of a fast, robust, and fully-automated pipeline for crystal structure determination and underlying strain map** for crystalline materials is important for many technological applications. Scanning electron nanodiffraction offers a procedure for identifying and collecting strain maps with good accuracy and high spatial resolutions. However, the application of this technique is limited, particularly in thick samples where the electron beam can undergo multiple scattering, which introduces signal nonlinearities. Deep learning methods have the potential to invert these complex signals, but previous implementations are often trained only on specific crystal systems or a small subset of the crystal structure and microscope parameter phase space. In this study, we implement a Fourier space, complex-valued deep neural network called FCU-Net, to invert highly nonlinear electron diffraction patterns into the corresponding quantitative structure factor images. We trained the FCU-Net using over 200,000 unique simulated dynamical diffraction patterns which include many different combinations of crystal structures, orientations, thicknesses, microscope parameters, and common experimental artifacts. We evaluated the trained FCU-Net model against simulated and experimental 4D-STEM diffraction datasets, where it substantially out-performs conventional analysis methods. Our simulated diffraction pattern library, implementation of FCU-Net, and trained model weights are freely available in open source repositories, and can be adapted to many different diffraction measurement problems. △ Less

Submitted 31 January, 2022; originally announced February 2022.

Comments: 17 pages, 7 figures

A Fast Algorithm for Scanning Transmission Electron Microscopy (STEM) Imaging and 4D-STEM Diffraction Simulations

Authors: Philipp M Pelz, Alexander Rakowski, Luis Rangel DaCosta, Benjamin H Savitzky, Mary C Scott, Colin Ophus

Abstract: Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the conventional multislice algorithm to perform these simulations can require extremely large calculation times, particularly for experiments with millions of probe positi… ▽ More Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the conventional multislice algorithm to perform these simulations can require extremely large calculation times, particularly for experiments with millions of probe positions as each probe position must be simulated independently. Recently, the PRISM algorithm was developed to reduce calculation times for large STEM simulations. Here, we introduce a new method for STEM simulation: partitioning of the STEM probe into "beamlets," given by a natural neighbor interpolation of the parent beams. This idea is compatible with PRISM simulations and can lead to even larger improvements in simulation time, as well requiring significantly less computer RAM. We have performed various simulations to demonstrate the advantages and disadvantages of partitioned PRISM STEM simulations. We find that this new algorithm is particularly useful for 4D-STEM simulations of large fields of view. We also provide a reference implementation of the multislice, PRISM and partitioned PRISM algorithms. △ Less

Submitted 3 April, 2021; originally announced April 2021.

Comments: 15 pages, 7 figures

Multibeam Electron Diffraction

Authors: Xuhao Hong, Steven E Zeltmann, Benjamin H Savitzky, Luis Rangel DaCosta, Alexander Mueller, Andrew M Minor, Karen Bustillo, Colin Ophus

Abstract: One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged electron probe over the sample to acquire thousands or even millions of sequential diffraction images, a technique that is especially appropriate for polycrystall… ▽ More One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged electron probe over the sample to acquire thousands or even millions of sequential diffraction images, a technique that is especially appropriate for polycrystalline samples. However, due to the large Ewald sphere of TEM, excitation of Bragg peaks can be extremely sensitive to sample tilt, varying strongly for even a few degrees of sample tilt for crystalline samples. In this paper, we present multibeam electron diffraction (MBED), where multiple probe forming apertures are used to create mutiple STEM probes, all of which interact with the sample simultaneously. We detail designs for MBED experiments, and a method for using a focused ion beam (FIB) to produce MBED apertures. We show the efficacy of the MBED technique for crystalline orientation map** using both simulations and proof-of-principle experiments. We also show how the angular information in MBED can be used to perform 3D tomographic reconstruction of samples without needing to tilt or scan the sample multiple times. Finally, we also discuss future opportunities for the MBED method. △ Less

Submitted 18 September, 2020; originally announced September 2020.

Comments: 14 pages, 6 figures

Journal ref: Microsc Microanal 27 (2021) 129-139

py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets

Authors: Benjamin H Savitzky, Lauren A Hughes, Steven E Zeltmann, Hamish G Brown, Shiteng Zhao, Philipp M Pelz, Edward S Barnard, Jennifer Donohue, Luis Rangel DaCosta, Thomas C. Pekin, Ellis Kennedy, Matthew T Janish, Matthew M Schneider, Patrick Herring, Chirranjeevi Gopal, Abraham Anapolsky, Peter Ercius, Mary Scott, Jim Ciston, Andrew M Minor, Colin Ophus

Abstract: Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, in… ▽ More Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields and other sample-dependent properties. However, extracting this information requires complex analysis pipelines, from data wrangling to calibration to analysis to visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail, and present results from several experimental datasets. We have also implemented a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open source HDF5 standard. We hope this tool will benefit the research community, helps to move the develo** standards for data and computational methods in electron microscopy, and invite the community to contribute to this ongoing, fully open-source project. △ Less

Submitted 20 March, 2020; originally announced March 2020.

Comments: 32 pages, 18 figures

Mesophase Formation Stabilizes High-Purity Magic-Sized Clusters

Authors: Douglas R. Nevers, Curtis B. Williamson, Benjamin H. Savitzky, Ido Hadar, Uri Banin, Lena F. Kourkoutis, Tobias Hanrath, Richard D. Robinson

Abstract: Magic-sized clusters (MSCs) are renowned for their identical size and closed-shell stability that inhibit conventional nanoparticle (NP) growth processes. Though MSCs have been of increasing interest, understanding the reaction pathways toward their nucleation and stabilization is an outstanding issue. In this work, we demonstrate that high concentration synthesis (1000 mM) promotes a well-defined… ▽ More Magic-sized clusters (MSCs) are renowned for their identical size and closed-shell stability that inhibit conventional nanoparticle (NP) growth processes. Though MSCs have been of increasing interest, understanding the reaction pathways toward their nucleation and stabilization is an outstanding issue. In this work, we demonstrate that high concentration synthesis (1000 mM) promotes a well-defined reaction pathway to form high-purity MSCs (greater than 99.9 percent). The MSCs are resistant to typical growth and dissolution processes. Based on insights from in-situ X-ray scattering analysis, we attribute this stability to the accompanying production of a large, hexagonal organic-inorganic mesophase (greater than 100 nm grain size) that arrests growth of the MSCs and prevents NP growth. At intermediate concentrations (500 mM), the MSC mesophase forms, but is unstable, resulting in NP growth at the expense of the assemblies. These results provide an alternate explanation for the high stability of MSCs. Whereas the conventional mantra has been that the stability of MSCs derives from the precise arrangement of the inorganic structures (i.e., closed-shell atomic packing), we demonstrate that anisotropic clusters can also be stabilized by self-forming fibrous mesophase assemblies. At lower concentration (less than 200 mM or greater than 16 acid-to-metal), MSCs are further destabilized and NPs formation dominates that of MSCs. Overall, the high concentration approach intensifies and showcases inherent concentration-dependent surfactant phase behavior that is not accessible in conventional (i.e., dilute) conditions. This work provides not only a robust method to synthesize, stabilize, and study identical MSC products, but also uncovers an underappreciated stabilizing interaction between surfactants and clusters. △ Less

Submitted 26 June, 2019; originally announced June 2019.

Comments: main text - 24 pages, 8 figures. SI - 35 pages, 30 figures, 6 tables

Journal ref: J. Am. Chem. Soc.2018, vol. 140 (10), 3652-3662

Image registration of low signal-to-noise cryo-STEM data

Authors: Benjamin H. Savitzky, Ismail El Baggari, Colin Clement, Emily Waite, John P. Sheckelton, Christopher Pasco, Alemayehu S. Admasu, Jaewook Kim, Sang-Wook Cheong, Tyrel M. McQueen, Robert Hovden, Lena F. Kourkoutis

Abstract: Combining multiple fast image acquisitions to mitigate scan noise and drift artifacts has proven essential for picometer precision, quantitative analysis of atomic resolution scanning transmission electron microscopy (STEM) data. For very low signal-to-noise ratio (SNR) image stacks - frequently required for undistorted imaging at liquid nitrogen temperatures - image registration is particularly d… ▽ More Combining multiple fast image acquisitions to mitigate scan noise and drift artifacts has proven essential for picometer precision, quantitative analysis of atomic resolution scanning transmission electron microscopy (STEM) data. For very low signal-to-noise ratio (SNR) image stacks - frequently required for undistorted imaging at liquid nitrogen temperatures - image registration is particularly delicate, and standard approaches may either fail, or produce subtly specious reconstructed lattice images. We present an approach which effectively registers and averages image stacks which are challenging due to their low-SNR and propensity for unit cell misalignments. Registering all possible image pairs in a multi-image stack leads to significant information surplus. In combination with a simple physical picture of stage drift, this enables identification of incorrect image registrations, and determination of the optimal image shifts from the complete set of relative shifts. We demonstrate the effectiveness of our approach on experimental, cryogenic STEM datasets, highlighting subtle artifacts endemic to low-SNR lattice images and how they can be avoided. High-SNR average images with information transfer out to 0.72 A are achieved at 300 kV and with the sample cooled to near liquid nitrogen temperature. △ Less

Submitted 23 October, 2017; originally announced October 2017.

Comments: 25 pages, 5 figures