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An Ahistorical Approach to Elementary Physics
Authors:
B. C. Regan
Abstract:
A goal of physics is to understand the greatest possible breadth of natural phenomena in terms of the most economical set of basic concepts. However, as the understanding of physics has developed historically, its pedagogy and language have not kept pace. This gap handicaps the student and the practitioner, making it harder to learn and apply ideas that are `well understood', and doubtless making…
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A goal of physics is to understand the greatest possible breadth of natural phenomena in terms of the most economical set of basic concepts. However, as the understanding of physics has developed historically, its pedagogy and language have not kept pace. This gap handicaps the student and the practitioner, making it harder to learn and apply ideas that are `well understood', and doubtless making it more difficult to see past those ideas to new discoveries. Energy, momentum, and action are archaic concepts representing an unnecessary level of abstraction. Viewed from a modern perspective, these quantities correspond to wave parameters, namely temporal frequency, spatial frequency, and phase, respectively. The main results of classical mechanics can be concisely reproduced by considering waves in the spacetime defined by special relativity. This approach unifies kinematics and dynamics, and introduces inertial mass not via a definition, but rather as the real-space effect of a reciprocal-space invariant.
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Submitted 6 September, 2020;
originally announced October 2020.
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Differential electron yield imaging with STXM
Authors:
William A. Hubbard,
Jared J. Lodico,
Xin Yi Ling,
Brian Zutter,
Young-Sang Yu,
David Shapiro,
B. C. Regan
Abstract:
Total electron yield (TEY) imaging is an established scanning transmission X-ray microscopy (STXM) technique that gives varying contrast based on a sample's geometry, elemental composition, and electrical conductivity. However, the TEY-STXM signal is determined solely by the electrons that the beam ejects from the sample. A related technique, X-ray beam-induced current (XBIC) imaging, is sensitive…
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Total electron yield (TEY) imaging is an established scanning transmission X-ray microscopy (STXM) technique that gives varying contrast based on a sample's geometry, elemental composition, and electrical conductivity. However, the TEY-STXM signal is determined solely by the electrons that the beam ejects from the sample. A related technique, X-ray beam-induced current (XBIC) imaging, is sensitive to electrons and holes independently, but requires electric fields in the sample. Here we report that multi-electrode devices can be wired to produce differential electron yield (DEY) contrast, which is also independently sensitive to electrons and holes, but does not require an electric field. Depending on whether the region illuminated by the focused STXM beam is better connected to one electrode or another, the DEY-STXM contrast changes sign. DEY-STXM images thus provide a vivid map of a device's connectivity landscape, which can be key to understanding device function and failure. To demonstrate an application in the area of failure analysis, we image a 100~nm, lithographically-defined aluminum nanowire that has failed after being stressed with a large current density.
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Submitted 27 September, 2020;
originally announced September 2020.
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In situ coherent diffractive imaging
Authors:
Yuan Hung Lo,
Lingrong Zhao,
Marcus Gallagher-Jones,
Arjun Rana,
Jared Lodico,
Weikun Xiao,
B. C. Regan,
Jianwei Miao
Abstract:
Coherent diffractive imaging (CDI) has been widely applied in the physical and biological sciences using synchrotron radiation, XFELs, high harmonic generation, electrons and optical lasers. One of CDI's important applications is to probe dynamic phenomena with high spatio-temporal resolution. Here, we report the development of a general in situ CDI method for real-time imaging of dynamic processe…
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Coherent diffractive imaging (CDI) has been widely applied in the physical and biological sciences using synchrotron radiation, XFELs, high harmonic generation, electrons and optical lasers. One of CDI's important applications is to probe dynamic phenomena with high spatio-temporal resolution. Here, we report the development of a general in situ CDI method for real-time imaging of dynamic processes in solution. By introducing a time-invariant overlap** region as a real-space constraint, we show that in situ CDI can simultaneously reconstruct a time series of the complex exit wave of dynamic processes with robust and fast convergence. We validate this method using numerical simulations with coherent X-rays and performing experiments on a materials science and a biological specimen in solution with an optical laser. Our numerical simulations further indicate that in situ CDI can potentially reduce the radiation dose by more than an order of magnitude relative to conventional CDI. As coherent X-rays are under rapid development worldwide, we expect in situ CDI could be applied to probe dynamic phenomena ranging from electrochemistry, structural phase transitions, charge transfer, transport, crystal nucleation, melting and fluid dynamics to biological imaging.
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Submitted 2 December, 2017; v1 submitted 19 March, 2017;
originally announced March 2017.
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Impedance matching of inverted conductors: Two-dimensional beam splitters with divergent gain
Authors:
Matthew Mecklenburg,
B. C. Regan
Abstract:
A thin conducting sheet - graphene, for example - transmits, absorbs, and reflects radiation. A sheet that is very thin, even vanishingly so, can still produce 50% absorption at normal incidence if it has conductivity corresponding to half the impedance of free space. We find that, regardless of the sheet conductivity, there exists a combination of polarization and angle of incidence that achieves…
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A thin conducting sheet - graphene, for example - transmits, absorbs, and reflects radiation. A sheet that is very thin, even vanishingly so, can still produce 50% absorption at normal incidence if it has conductivity corresponding to half the impedance of free space. We find that, regardless of the sheet conductivity, there exists a combination of polarization and angle of incidence that achieves this impedance half-matching condition. If the conducting medium can be inverted, the conductivity is formally negative and the sheet amplifies the incident radiation. To the extent that a negative half-match in a thin sheet can be maintained, enormous single-pass gain in both transmission and reflection is possible. Known semiconductors (e.g., gallium nitride) have the optical properties necessary to give large amplification in a structure that is, remarkably, both thin and nonresonant.
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Submitted 9 March, 2017; v1 submitted 11 March, 2015;
originally announced March 2015.
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Reply to "Local Filtering Fundamentally Against Wide Spectrum"
Authors:
Jianwei Miao,
M. C. Scott,
Chien-Chun Chen,
Chun Zhu,
Edward R. White,
Chin-Yi Chiu,
B. C. Regan,
Yu Huang,
Laurence D. Marks
Abstract:
After carefully studying the comment by Wang et al. (arXiv:1408.6420), we found it includes several mistakes and unjustified statements and Wang et al. lack very basic knowledge of dislocations. Moreover, there is clear evidence indicating that Wang et al. significantly misrepresented our method and claimed something that they actually did not implement.
After carefully studying the comment by Wang et al. (arXiv:1408.6420), we found it includes several mistakes and unjustified statements and Wang et al. lack very basic knowledge of dislocations. Moreover, there is clear evidence indicating that Wang et al. significantly misrepresented our method and claimed something that they actually did not implement.
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Submitted 2 September, 2014;
originally announced September 2014.
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Electron tomography at 2.4 Å resolution
Authors:
M. C. Scott,
Chien-Chun Chen,
Matthew Mecklenburg,
Chun Zhu,
Rui Xu,
Peter Ercius,
Ulrich Dahmen,
B. C. Regan,
Jianwei Miao
Abstract:
Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial resolution and image quality in TEM have been significantly improved(4,5) and resolution below 0.5 Å has been demonstrated(6). To reveal the 3D structure of thin samples…
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Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial resolution and image quality in TEM have been significantly improved(4,5) and resolution below 0.5 Å has been demonstrated(6). To reveal the 3D structure of thin samples, electron tomography is the method of choice(7-11), with resolutions of ~1 nm^3 currently achievable(10,11). Recently, discrete tomography has been used to generate a 3D atomic reconstruction of a silver nanoparticle 2-3 nm in diameter(12), but this statistical method assumes prior knowledge of the particle's lattice structure and requires that the atoms fit rigidly on that lattice. Here we report the experimental demonstration of a general electron tomography method that achieves atomic scale resolution without initial assumptions about the sample structure. By combining a novel projection alignment and tomographic reconstruction method with scanning transmission electron microscopy, we have determined the 3D structure of a ~10 nm gold nanoparticle at 2.4 Å resolution. While we cannot definitively locate all of the atoms inside the nanoparticle, individual atoms are observed in some regions of the particle and several grains are identified at three dimensions. The 3D surface morphology and internal lattice structure revealed are consistent with a distorted icosahedral multiply-twinned particle. We anticipate that this general method can be applied not only to determine the 3D structure of nanomaterials at atomic scale resolution(13-15), but also to improve the spatial resolution and image quality in other tomography fields(7,9,16-20).
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Submitted 5 February, 2012; v1 submitted 26 August, 2011;
originally announced August 2011.
