Bulk morphology of porous materials at sub-micrometer scale studied by multi-modal X-ray imaging with Hartmann masks
Authors:
M. Zakharova,
A. Mikhaylov,
S. Reich,
A. Plech,
D. Kunka
Abstract:
We present the quantitative investigation of the submicron structure in the bulk of porous graphite by using the scattering signal in the multi-modal X-ray imaging with Hartmann masks. By scanning the correlation length and measuring the mask visibility reduction, we obtain average pore size, relative pore fraction, fractal dimension, and Hurst exponent of the structure. Profiting from the dimensi…
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We present the quantitative investigation of the submicron structure in the bulk of porous graphite by using the scattering signal in the multi-modal X-ray imaging with Hartmann masks. By scanning the correlation length and measuring the mask visibility reduction, we obtain average pore size, relative pore fraction, fractal dimension, and Hurst exponent of the structure. Profiting from the dimensionality of the mask, we apply the method to study pore size anisotropy. The measurements were performed in a simple and flexible imaging setup with relaxed requirements on beam coherence.
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Submitted 14 October, 2021;
originally announced October 2021.
A Shack-Hartmann sensor for single-shot multi-contrast imaging with hard X-rays
Authors:
Tomy dos Santos Rolo,
Stefan Reich,
Dmitry Karpov,
Sergey Gasilov,
Danays Kunka,
Edwin Fohtung,
Tilo Baumbach,
Anton Plech
Abstract:
An array of compound refractive X-ray lenses (CRL) with 20x20 lenslets, a focal distance of 20 cm and a visibility of 0.93 is presented. It can be used as a Shack-Hartmann sensor for hard X-rays (SHARX) for wavefront sensing and permits for true single-shot multi-contrast imaging the dynamics of materials with a spatial resolution in the micrometer range, sensitivity on nanosized structures and te…
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An array of compound refractive X-ray lenses (CRL) with 20x20 lenslets, a focal distance of 20 cm and a visibility of 0.93 is presented. It can be used as a Shack-Hartmann sensor for hard X-rays (SHARX) for wavefront sensing and permits for true single-shot multi-contrast imaging the dynamics of materials with a spatial resolution in the micrometer range, sensitivity on nanosized structures and temporal resolution on the microsecond scale. The object's absorption and its induced wavefront shift can be assessed simultaneously together with information from diffraction channels. This enables the imaging of hierarchical materials. In contrast to the established Hartmann sensors the SHARX has an increased flux efficiency through focusing of the beam rather than blocking parts of it. We investigated the spatiotemporal behavior of a cavitation bubble induced by laser pulses. Furthermore, we validated the SHARX by measuring refraction angles of a single diamond CRL, where we obtained an angular resolution better than 4 microrad.
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Submitted 27 February, 2018;
originally announced February 2018.
