Development of a High Rate Front-end ASIC for X-ray Spectroscopy and Diffraction Applications
Authors:
Emerson Vernon,
Gianluigi De Geronimo,
Jonathan Baldwin,
Wei Chen,
Jack Fried,
Gabriele Giacomini,
Anthony Kuczewski,
John Kuczewski,
Joe Mead,
Antonino Miceli,
John S. Okasinski,
Don Pinelli,
Orlando Quaranta,
Abdul K. Rumaiz,
Peter Siddons,
Graham Smith,
Milutin Stanacevic,
Russell Woods
Abstract:
We developed a new front-end application specific integrated circuit (ASIC) for the upgrade of the Maia x-ray microprobe. The ASIC instruments 32 configurable front-end channels that perform either positive or negative charge amplification, pulse sha**, peak amplitude and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1 $μ$s peaking time and a temperature of 248 K, an…
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We developed a new front-end application specific integrated circuit (ASIC) for the upgrade of the Maia x-ray microprobe. The ASIC instruments 32 configurable front-end channels that perform either positive or negative charge amplification, pulse sha**, peak amplitude and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1 $μ$s peaking time and a temperature of 248 K, an electronic resolution of 13- and 10 electrons rms was measured with and without a SDD sensor respectively. A spectral resolution of 170 eV FWHM at 5.9 keV was obtained with an $^{55}$Fe source. The channel linearity was better than $\pm$ 1 % with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250 nm process with a footprint of 6.3 mm x 3.9 mm and dissipates 167 mW of static power.
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Submitted 13 May, 2019;
originally announced May 2019.
