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Enhancement of low-spatial-frequency components by a new phase-contrast STEM using a probe formed with an amplitude Fresnel zone plate
Authors:
Masato Tomita,
Yukinori Nagatani,
Kazuyoshi Murata,
Atsushi Momose
Abstract:
Electron microscopy is a powerful tool for visualizing the shapes of sub-nanometer objects. However, contrast is not in proportional to density distribution, and therefore achieving a quantitative understanding of specimens is not straightforward, especially for low-contrast subjects such as biological specimens. To overcome this problem, we have developed a new phase-contrast scanning transmissio…
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Electron microscopy is a powerful tool for visualizing the shapes of sub-nanometer objects. However, contrast is not in proportional to density distribution, and therefore achieving a quantitative understanding of specimens is not straightforward, especially for low-contrast subjects such as biological specimens. To overcome this problem, we have developed a new phase-contrast scanning transmission electron microscope (STEM) in which a probe beam formed with an amplitude Fresnel zone plate (FZP) and the resulting interference patterns produced by the zeroth and first order diffracted waves generated by the FZP are detected. We name it FZP-PC-STEM hereinafter. The amplitude FZP was manufactured by using focused ion beam (FIB) equipment, and the diffraction data were collected by using diffraction imaging technique. The validity of our proposed optical model was confirmed by comparing experimental and simulated images. Observations of carbon nanotube (CNT) bundles by this method showed that the contrast of low-spatial-frequency components in the CNT image was enhanced, unlike the case in conventional bright-field STEM. This method does not, in principle, require the post-image processing used in the diffraction imaging method, and it can be easily introduced into a conventional STEM system without major modifications. The stability and robustness of the method toward intense electron irradiation during long-time operation were also confirmed. We expect that the FZP-PC-STEM will be widely applicable to quantitative observations of radiation-sensitive light-element specimens, with simple and easy operation.
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Submitted 12 May, 2020;
originally announced May 2020.
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Research on the background correction method in x-ray phase contrast imaging with Talbot-Lau interferometer
Authors:
Shenghao Wang,
Can Zhang,
Margie P. Olbinado,
Atsushi Momose,
Kun Gao,
Zhili Wang,
Huajie Han,
Meng Yang,
Kai Zhang,
Pei** Zhu,
Ziyu Wu
Abstract:
X-ray Talbot-Lau interferometer has been used widely to conduct phase contrast imaging with a conventional low-brilliance x-ray source. Typically, in this technique, background correction has to be performed in order to obtain the pure signal of the sample under inspection. In this study, we reported on a research on the background correction strategies within this technique, especially we introdu…
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X-ray Talbot-Lau interferometer has been used widely to conduct phase contrast imaging with a conventional low-brilliance x-ray source. Typically, in this technique, background correction has to be performed in order to obtain the pure signal of the sample under inspection. In this study, we reported on a research on the background correction strategies within this technique, especially we introduced a new phase unwrap** solution for one conventional background correction method, the key point of this new solution is changing the initial phase of each pixel by a cyclic shift operation on the raw images collected in phase step** scan. Experimental result and numerical analysis showed that the new phase unwrap** algorithm could successfully subtract contribution of the system's background without error. Moreover, a potential advantage of this phase unwrap** strategy is that its effective phase measuring range could be tuned flexibly in some degree for example to be (-pi+3, pi+3], thus it would find usage in certain case because measuring range of the currently widely used background correction method is fixed to be (-pi, pi].
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Submitted 9 March, 2015; v1 submitted 11 January, 2015;
originally announced January 2015.
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Experimental research on the feature of an X-ray Talbot-Lau interferometer vs. tube accelerating voltage
Authors:
Shenghao Wang,
Renfang Hu,
Zhili Wang,
Kun Gao,
Kai Zhang,
Atsushi Momose,
Ziyu Wu
Abstract:
X-ray Talbot-Lau interferometer has been used most widely to perform X-ray phase-contrast imaging with a conventional low-brilliance X-ray source, it yields high-sensitivity phase and dark-field images of sample producing low absorption contrast, thus bearing tremendous potential for future clinical diagnosis. In this manuscript, while changing accelerating voltage of the X-ray tube from 35KV to 4…
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X-ray Talbot-Lau interferometer has been used most widely to perform X-ray phase-contrast imaging with a conventional low-brilliance X-ray source, it yields high-sensitivity phase and dark-field images of sample producing low absorption contrast, thus bearing tremendous potential for future clinical diagnosis. In this manuscript, while changing accelerating voltage of the X-ray tube from 35KV to 45KV, X-ray phase-contrast imaging of a test sample were performed at each integer KV position to investigate the characteristic of an X-ray Talbot-Lau interferometer (located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan) vs. tube voltage. Experimental results and data analysis show that this X-ray Talbot-Lau interferometer is insensitive to the tube accelerating voltage within a certain range, fringe visibility around 44% is maintained in the aforementioned tube voltage range. This experimental research implies that potential new dual energy phase-contrast X-ray imaging strategy and rough refraction spectrum measurement is feasible with this X-ray Talbot-Lau interferometer.
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Submitted 19 November, 2014; v1 submitted 28 October, 2014;
originally announced October 2014.
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Fourier transform based iterative method for x-ray differential phase-contrast computed tomography
Authors:
Wenxiang Cong,
Atsushi Momose,
Ge Wang
Abstract:
Biological soft tissues encountered in clinical and pre-clinical imaging mainly consist of light element atoms, and their composition is nearly uniform with little density variation. Thus, x-ray attenuation imaging suffers from low image contrast resolution. By contrast, x-ray phase shift of soft tissues is about a thousand times greater than x-ray absorption over the diagnostic energy range, ther…
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Biological soft tissues encountered in clinical and pre-clinical imaging mainly consist of light element atoms, and their composition is nearly uniform with little density variation. Thus, x-ray attenuation imaging suffers from low image contrast resolution. By contrast, x-ray phase shift of soft tissues is about a thousand times greater than x-ray absorption over the diagnostic energy range, thereby a significantly higher sensitivity can be achieved in terms of phase shift. In this paper, we propose a novel Fourier transform based iterative method to perform x-ray tomographic imaging of the refractive index directly from differential phase shift data. This approach offers distinct advantages in cases of incomplete and noisy data than analytic reconstruction, and especially suitable for phase-contrast interior tomography by incorporating prior knowledge in a region of interest (ROI). Biological experiments demonstrate the merits of the proposed approach.
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Submitted 24 June, 2011;
originally announced June 2011.
