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Rapid detection of rare events from in situ X-ray diffraction data using machine learning
Authors:
Weijian Zheng,
Jun-Sang Park,
Peter Kenesei,
Ahsan Ali,
Zhengchun Liu,
Ian T. Foster,
Nicholas Schwarz,
Rajkumar Kettimuthu,
Antonino Miceli,
Hemant Sharma
Abstract:
High-energy X-ray diffraction methods can non-destructively map the 3D microstructure and associated attributes of metallic polycrystalline engineering materials in their bulk form. These methods are often combined with external stimuli such as thermo-mechanical loading to take snapshots over time of the evolving microstructure and attributes. However, the extreme data volumes and the high costs o…
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High-energy X-ray diffraction methods can non-destructively map the 3D microstructure and associated attributes of metallic polycrystalline engineering materials in their bulk form. These methods are often combined with external stimuli such as thermo-mechanical loading to take snapshots over time of the evolving microstructure and attributes. However, the extreme data volumes and the high costs of traditional data acquisition and reduction approaches pose a barrier to quickly extracting actionable insights and improving the temporal resolution of these snapshots. Here we present a fully automated technique capable of rapidly detecting the onset of plasticity in high-energy X-ray microscopy data. Our technique is computationally faster by at least 50 times than the traditional approaches and works for data sets that are up to 9 times sparser than a full data set. This new technique leverages self-supervised image representation learning and clustering to transform massive data into compact, semantic-rich representations of visually salient characteristics (e.g., peak shapes). These characteristics can be a rapid indicator of anomalous events such as changes in diffraction peak shapes. We anticipate that this technique will provide just-in-time actionable information to drive smarter experiments that effectively deploy multi-modal X-ray diffraction methods that span many decades of length scales.
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Submitted 6 December, 2023;
originally announced December 2023.
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Signatures of Thermal and Electrical Crosstalk in a Microwave Multiplexed Hard X-ray Transition Edge Sensor Array
Authors:
Panthita Triamkitsawat,
Tejas Guruswamy,
Orlando Quaranta,
Lisa Gades,
Umeshkumar Patel,
Antonino Miceli
Abstract:
We investigate the crosstalk between Transition-Edge Sensor (TES) pixels in a prototype 24-pixel hard X-ray array fabricated at the Advanced Photon Source, Argonne National Laboratory. Analysis shows thermal cross talk, possibly associated with insufficient thermalization, and rare but large in magnitude electrical crosstalk between specific perpetrator-victim pixel combinations, potentially due t…
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We investigate the crosstalk between Transition-Edge Sensor (TES) pixels in a prototype 24-pixel hard X-ray array fabricated at the Advanced Photon Source, Argonne National Laboratory. Analysis shows thermal cross talk, possibly associated with insufficient thermalization, and rare but large in magnitude electrical crosstalk between specific perpetrator-victim pixel combinations, potentially due to deficiencies in the bias wiring or microwave multiplexing circuit. We use a method based on group triggering and averaging to isolate the crosstalk response despite only having access to X-ray photon illumination uniform across the entire array. This allows us to identify thermal and electrical crosstalk between pixel pairs in repeated measurements to the level of 1 part in 1000 or better. In the array under study, the magnitude of observed crosstalk is small but comparable to the resolving power of this pixel design (E/$Δ$E $\sim$ 1000 at 20 keV) and so potentially responsible for a degradation in energy resolution of the array at high incident photon rates. Having proven the methods to identify and quantify crosstalk in our setup, we can consider mitigations.
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Submitted 17 January, 2024; v1 submitted 28 November, 2023;
originally announced November 2023.
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Demonstration of an AI-driven workflow for autonomous high-resolution scanning microscopy
Authors:
Saugat Kandel,
Tao Zhou,
Anakha V Babu,
Zichao Di,
Xinxin Li,
Xuedan Ma,
Martin Holt,
Antonino Miceli,
Charudatta Phatak,
Mathew Cherukara
Abstract:
With the continuing advances in scientific instrumentation, scanning microscopes are now able to image physical systems with up to sub-atomic-level spatial resolutions and sub-picosecond time resolutions. Commensurately, they are generating ever-increasing volumes of data, storing and analysis of which is becoming an increasingly difficult prospect. One approach to address this challenge is throug…
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With the continuing advances in scientific instrumentation, scanning microscopes are now able to image physical systems with up to sub-atomic-level spatial resolutions and sub-picosecond time resolutions. Commensurately, they are generating ever-increasing volumes of data, storing and analysis of which is becoming an increasingly difficult prospect. One approach to address this challenge is through self-driving experimentation techniques that can actively analyze the data being collected and use this information to make on-the-fly measurement choices, such that the data collected is sparse but representative of the sample and sufficiently informative. Here, we report the Fast Autonomous Scanning Toolkit (FAST) that combines a trained neural network, a route optimization technique, and efficient hardware control methods to enable a self-driving scanning microscopy experiment. The key features of our method are that: it does not require any prior information about the sample, it has a very low computational cost, and that it uses generic hardware controls with minimal experiment-specific wrap**. We test this toolkit in numerical experiments and a scanning dark-field x-ray microscopy experiment of a $WSe_2$ thin film, where our experiments show that a FAST scan of <25% of the sample is sufficient to produce both a high-fidelity image and a quantitative analysis of the surface distortions in the sample. We show that FAST can autonomously identify all features of interest in the sample while significantly reducing the scan time, the volume of data acquired, and dose on the sample. The FAST toolkit is easy to apply for any scanning microscopy modalities and we anticipate adoption of this technique will empower broader multi-level studies of the evolution of physical phenomena with respect to time, temperature, or other experimental parameters.
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Submitted 12 January, 2023;
originally announced January 2023.
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Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection
Authors:
Elliot Kisiel,
Ishwor Poudyal,
Peter Kenesei,
Mark Engbretson,
Arndt Last,
Rourav Basak,
Ivan Zaluzhnyy,
Uday Goteti,
Robert Dynes,
Antonino Miceli,
Alex Frano,
Zahir Islam
Abstract:
Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films proves challenging due to available detection methods and incident x-ray flux at the sample. We presen…
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Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films proves challenging due to available detection methods and incident x-ray flux at the sample. We present a direct detection method focusing on DFXM studies in the hard x-ray range of 10s of keV and above capable of approaching nanoscale resolution. Additionally, we compare this direct detection scheme with routinely used scintillator based optical detection and achieve an order of magnitude improvement in exposure times allowing for imaging of weakly diffracting ordered systems.
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Submitted 4 January, 2023; v1 submitted 14 December, 2022;
originally announced December 2022.
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A lightweight, user-configurable detector ASIC digital architecture with on-chip data compression for MHz X-ray coherent diffraction imaging
Authors:
Sebastian Strempfer,
Tao Zhou,
Kazutomo Yoshii,
Mike Hammer,
Anakha Babu,
Dawid Bycul,
John Weizeorick,
Mathew J. Cherukara,
Antonino Miceli
Abstract:
Today, most X-ray pixel detectors used at light sources transmit raw pixel data off the detector ASIC. With the availability of more advanced ASIC technology nodes for scientific application, more digital functionality from the computing domains (e.g., compression) can be integrated directly into a detector ASIC to increase data velocity. In this paper, we describe a lightweight, user-configurable…
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Today, most X-ray pixel detectors used at light sources transmit raw pixel data off the detector ASIC. With the availability of more advanced ASIC technology nodes for scientific application, more digital functionality from the computing domains (e.g., compression) can be integrated directly into a detector ASIC to increase data velocity. In this paper, we describe a lightweight, user-configurable detector ASIC digital architecture with on-chip compression which can be implemented in \SI{130}{\nm} technologies in a reasonable area on the ASIC periphery. In addition, we present a design to efficiently handle the variable data from the stream of parallel compressors. The architecture includes user-selectable lossy and lossless compression blocks. The impact of lossy compression algorithms is evaluated on simulated and experimental X-ray ptychography datasets. This architecture is a practical approach to increase pixel detector frame rates towards the continuous \SI{1}{\MHz} regime for not only coherent imaging techniques such as ptychography, but also for other diffraction techniques at X-ray light sources.
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Submitted 29 July, 2022;
originally announced August 2022.
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Absolute Energy Measurements with Superconducting Transition-Edge Sensors for Muonic X-ray Spectroscopy at 44 keV
Authors:
Daikang Yan,
Joel C. Weber,
Tejas Guruswamy,
Kelsey M. Morgan,
Galen C. O'Neil,
Abigail L. Wessels,
Douglas A. Bennett,
Christine G. Pappas,
John A. Mates,
Johnathon D. Gard,
Daniel T. Becker,
Joseph W. Fowler,
Daniel S. Swetz,
Daniel R. Schmidt,
Joel N. Ullom,
Takuma Okumura,
Tadaaki Isobe,
Toshiyuki Azuma,
Shinji Okada,
Shinya Yamada,
Tadashi Hashimoto,
Orlando Quaranta,
Antonino Miceli,
Lisa M. Gades,
Umeshkumar M. Patel
, et al. (3 additional authors not shown)
Abstract:
Superconducting transition-edge sensor (TES) microcalorimeters have great utility in x-ray applications owing to their high energy resolution, good collecting efficiency and the feasibility of being multiplexed into large arrays. In this work, we develop hard x-ray TESs to measure the absolute energies of muonic-argon ($μ$-Ar) transition lines around 44 keV and 20 keV. TESs with sidecar absorbers…
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Superconducting transition-edge sensor (TES) microcalorimeters have great utility in x-ray applications owing to their high energy resolution, good collecting efficiency and the feasibility of being multiplexed into large arrays. In this work, we develop hard x-ray TESs to measure the absolute energies of muonic-argon ($μ$-Ar) transition lines around 44 keV and 20 keV. TESs with sidecar absorbers of different heat capacities were fabricated and characterized for their energy resolution and calibration uncertainty. We achieved ~ 1 eV absolute energy measurement accuracy at 44 keV, and < 12 eV energy resolution at 17.5 keV.
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Submitted 21 July, 2022;
originally announced July 2022.
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Pushing compute and AI onto detector silicon
Authors:
Antonino Miceli,
Kazutomo Yoshii,
Ian T. Foster
Abstract:
In order to take full advantage of the U.S. Department of Energy's billion-dollar investments into the next-generation research infrastructure (e.g., exascale, light sources, colliders), advances are required not only in detector technology but also in computing and specifically AI. Let us consider an example from X-ray science. Nanoscale X-ray imaging is a crucial tool to enable a wide range of s…
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In order to take full advantage of the U.S. Department of Energy's billion-dollar investments into the next-generation research infrastructure (e.g., exascale, light sources, colliders), advances are required not only in detector technology but also in computing and specifically AI. Let us consider an example from X-ray science. Nanoscale X-ray imaging is a crucial tool to enable a wide range of scientific explorations from materials science and biology to mechanical and civil engineering. The next-generation light sources will increase the X-ray beam brightness and coherent flux by 100 to 1,000 times. In order to image larger samples, the continuous frame rate of pixel array detectors must be increased, approaching 1 MHz, which requires several Tbps (aggregated) to transfer pixel data out to a data acquisition system. Using 65-nm CMOS technology, an optimistic raw data rate off such a chip is about 100-200 Gbps. However, a continuous 1 MHz detector with only $256 \times 256$ pixels at 16-bit resolution, for example, will require 1,000 Gbps (i.e., 1 Tbps) bandwidth off the chip! It is impractical to have multiple high-speed transceivers running in parallel to provide such bandwidth and represents the first data bottleneck. New approaches are necessary to reduce the data size by performing data compression or AI-based feature extraction directly inside a detector silicon chip in a streaming manner before sending it off-chip.
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Submitted 21 May, 2022;
originally announced May 2022.
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High-resolution Compton spectroscopy using X-ray microcalorimeters
Authors:
U. Patel,
T. Guruswamy,
A. J. Krzysko,
H. Charalambous,
L. Gades,
K. Wiaderek,
O. Quaranta,
Y. Ren,
A. Yakovenko,
A. Miceli
Abstract:
X-ray Compton spectroscopy is one of the few direct probes of the electron momentum distribution of bulk materials in ambient and operando environments. We report high-resolution inelastic X-ray scattering experiments with high momentum and energy transfer performed at a storage-ring-based high-energy X-ray light source facility using an X-ray microcalorimeter detector. Compton profiles were measu…
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X-ray Compton spectroscopy is one of the few direct probes of the electron momentum distribution of bulk materials in ambient and operando environments. We report high-resolution inelastic X-ray scattering experiments with high momentum and energy transfer performed at a storage-ring-based high-energy X-ray light source facility using an X-ray microcalorimeter detector. Compton profiles were measured for lithium and cobalt oxide powders relevant to lithium-ion battery research. Spectroscopic analysis of the measured Compton profiles shows high-sensitivity to the low-Z elements and oxidation states. The lineshape analysis of the measured Compton profiles in comparison with computed Hartree-Fock profiles is limited by the resolution of the energy-resolving semiconductor detector. We have characterized an X-ray transition-edge sensor microcalorimeter detector for high-resolution Compton scattering experiments using a bending magnet source at the Advanced Photon Source (APS) with a double crystal monochromator providing monochromatic photon energies near 27.5 keV. The momentum resolution below 0.16 atomic units was measured yielding an improvement of more than a factor of 7 over a state-of-the-art silicon drift detector for the same scattering geometry. Furthermore, the lineshapes of narrow valence and broad core electron profiles of sealed lithium metal were clearly resolved using an X-ray microcalorimeter detector compared to smeared and broadened lineshapes observed when using a silicon drift detector. High-resolution Compton scattering using the energy-resolving detector shown here presents new opportunities for spatial imaging of electron momentum distributions for a wide class of materials with applications ranging from electrochemistry to condensed matter physics.
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Submitted 1 April, 2022;
originally announced April 2022.
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Devices for Thermal Conductivity Measurements of Electroplated Bi for X-ray TES Absorbers
Authors:
Orlando Quaranta,
Lisa M. Gades,
Cindy Xue,
Ralu Divan,
Umeshkumar M. Patel,
Tejas Guruswamy,
Antonino Miceli
Abstract:
Electroplated Bismuth (Bi) is commonly used in Transition-Edge Sensors (TESs) for X-rays because of its high stop** power and low heat capacity. Electroplated Bi is usually grown on top of another metal that acts as seed layer, typically gold (Au), making it challenging to extrapolate its thermoelectric properties. In this work, we present four-wire resistance measurement structures that allow u…
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Electroplated Bismuth (Bi) is commonly used in Transition-Edge Sensors (TESs) for X-rays because of its high stop** power and low heat capacity. Electroplated Bi is usually grown on top of another metal that acts as seed layer, typically gold (Au), making it challenging to extrapolate its thermoelectric properties. In this work, we present four-wire resistance measurement structures that allow us to measure resistance as a function of temperature of electroplated Bi independently of Au. The results show that the thermal conductivity of the Bi at 3 K is high enough to guarantee the correct thermalization of X-ray photons when used as an absorber for TESs.
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Submitted 3 November, 2021;
originally announced November 2021.
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A Hardware Co-design Workflow for Scientific Instruments at the Edge
Authors:
Kazutomo Yoshii,
Rajesh Sankaran,
Sebastian Strempfer,
Maksim Levental,
Mike Hammer,
Antonino Miceli
Abstract:
As spatial and temporal resolutions of scientific instruments improve, the explosion in the volume of data produced is becoming a key challenge. It can be a critical bottleneck for integration between scientific instruments at the edge and high-performance computers/emerging accelerators. Placing data compression or reduction logic close to the data source is a possible approach to solve the bottl…
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As spatial and temporal resolutions of scientific instruments improve, the explosion in the volume of data produced is becoming a key challenge. It can be a critical bottleneck for integration between scientific instruments at the edge and high-performance computers/emerging accelerators. Placing data compression or reduction logic close to the data source is a possible approach to solve the bottleneck. However, the realization of such a solution requires the development of custom ASIC designs, which is still challenging in practice and tends to produce one-off implementations unusable beyond the initial intended scope. Therefore, as a feasibility study, we have been investigating a design workflow that allows us to explore algorithmically complex hardware designs and develop reusable hardware libraries for the needs of scientific instruments at the edge. Our vision is to cultivate our hardware development capability for streaming/dataflow hardware components that can be placed close to the data source to enable extreme data-intensive scientific experiments or environmental sensing. Furthermore, reducing data movement is essential to improving computing performance in general. Therefore, our co-design efforts on streaming hardware components can benefit computing applications other than scientific instruments. This vision paper discusses hardware specialization needs in scientific instruments and briefly reviews our progress leveraging the Chisel hardware description language and emerging open-source hardware ecosystems, including a few design examples.
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Submitted 2 November, 2021;
originally announced November 2021.
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Designing a Streaming Data Coalescing Architecture for Scientific Detector ASICs with Variable Data Velocity
Authors:
Sebastian Strempfer,
Kazutomo Yoshii,
Mike Hammer,
Dawid Bycul,
Antonino Miceli
Abstract:
Scientific detectors are a key technological enabler for many disciplines. Application-specific integrated circuits (ASICs) are used for many of these scientific detectors. Until recently, pixel detector ASICs have been used mainly for analog signal processing of the charge from the sensor layer and the transmission of raw pixel data off the detector ASIC. However, with the availability of more ad…
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Scientific detectors are a key technological enabler for many disciplines. Application-specific integrated circuits (ASICs) are used for many of these scientific detectors. Until recently, pixel detector ASICs have been used mainly for analog signal processing of the charge from the sensor layer and the transmission of raw pixel data off the detector ASIC. However, with the availability of more advanced ASIC technology nodes for scientific application, more digital functionality from the computing domains (e.g., compression) can be integrated directly into the detector ASIC to increase data velocity. However, these computing functionalities often have high and variable latency, whereas scientific detectors must operate in real-time (i.e., stall-free) to support continuous streaming of sampled data. This paper presents an example from the domain of pixel detectors with on-chip data compression for X-ray science applications. To address the challenges of variable-sized data from a parallel stream of compressors, we present an ASIC design architecture to coalesce variable-length data for transmission over a fixed bit-width network interface.
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Submitted 14 October, 2021;
originally announced October 2021.
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Beamline Spectroscopy of Integrated Circuits With Hard X-ray Transition Edge Sensors at the Advanced Photon Source
Authors:
T. Guruswamy,
L. Gades,
A. Miceli,
U. Patel,
O. Quaranta
Abstract:
At Argonne National Laboratory, we are develo** hard X-ray (2 to 20 keV) Transition Edge Sensor (TES) arrays for beamline science. The significantly improved energy resolution provided by superconducting detectors compared to semiconductor-based energy-dispersive detectors, but with better collection efficiency than wavelength-dispersive instruments, will enable greatly improved X-ray emission a…
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At Argonne National Laboratory, we are develo** hard X-ray (2 to 20 keV) Transition Edge Sensor (TES) arrays for beamline science. The significantly improved energy resolution provided by superconducting detectors compared to semiconductor-based energy-dispersive detectors, but with better collection efficiency than wavelength-dispersive instruments, will enable greatly improved X-ray emission and absorption spectroscopic measurements. A prototype instrument with 24 microwave-frequency multiplexed pixels is now in testing at the Advanced Photon Source (APS) 1-BM beamline. Initial measurements show an energy resolution ten times better (150 eV compared to < 15 eV) than the silicon-drift detectors currently available to APS beamline users, and in particular demonstrate the ability to resolve closely-spaced emission lines in samples containing multiple transition metal elements, such as integrated circuits. Comparing fluorescence spectra of integrated circuits measured with our TESs at the beamline to those measured with silicon detectors, we find emission lines and elements largely hidden (e.g. Hf alongside Cu) from a semiconductor-based detector but well resolved by a TES. This directly shows the strengths of TES-based instruments in fluorescence map**.
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Submitted 12 March, 2021; v1 submitted 21 December, 2020;
originally announced December 2020.
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Strategies for on-chip digital data compression for X-ray pixel detectors
Authors:
Mike Hammer,
Kazutomo Yoshii,
Antonino Miceli
Abstract:
The continued desire for X-ray pixel detectors with higher frame rates will stress the ability of application-specific integrated circuit (ASIC) designers to provide sufficient off-chip bandwidth to reach continuous frame rates in the 1 MHz regime. To move from the current 10 kHz to the 1 MHz frame rate regime, ASIC designers will continue to pack as many power-hungry high-speed transceivers at th…
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The continued desire for X-ray pixel detectors with higher frame rates will stress the ability of application-specific integrated circuit (ASIC) designers to provide sufficient off-chip bandwidth to reach continuous frame rates in the 1 MHz regime. To move from the current 10 kHz to the 1 MHz frame rate regime, ASIC designers will continue to pack as many power-hungry high-speed transceivers at the periphery of the ASIC as possible. In this paper, however, we present new strategies to make the most efficient use of the off-chip bandwidth by utilizing data compression schemes for X-ray photon-counting and charge-integrating pixel detectors. In particular, we describe a novel in-pixel compression scheme that converts from analog to digital converter units to encoded photon counts near the photon Poisson noise level and achieves a compression ratio of $>\!1.5\times$ independent of the dataset. In addition, we describe a simple yet efficient zero-suppression compression scheme called ``zeromask'' (ZM) located at the ASIC's edge before streaming data off the ASIC chip. ZM achieves average compression ratios of $>\!4\times$, $>\!7\times$, and $>\!8\times$ for high-energy X-ray diffraction, ptychography, and X-ray photon correlation spectroscopy datasets, respectively. We present the conceptual designs, register-transfer level block diagrams, and the physical ASIC implementation of these compression schemes in 65-nm CMOS. When combined, these two digital compression schemes could increase the effective off-chip bandwidth by a factor of 6-12$\times$.
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Submitted 1 August, 2020; v1 submitted 4 June, 2020;
originally announced June 2020.
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Hard X-ray Fluorescence measurements with TESs at the Advanced Photon Source
Authors:
Tejas Guruswamy,
Lisa M. Gades,
Antonino Miceli,
Umeshkumar M. Patel,
John T. Weizeorick,
Orlando Quaranta
Abstract:
Transition Edge Sensor (TES) spectrometers for hard X-ray beamline science will enable improved X-ray emission and absorption spectroscopy in the information-rich 2 to 20 keV energy range. We are building a TES-based instrument for the Advanced Photon Source (APS) synchrotron, to be made available to beamline users. 24-pixel prototype arrays have recently been fabricated and tested. The first spec…
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Transition Edge Sensor (TES) spectrometers for hard X-ray beamline science will enable improved X-ray emission and absorption spectroscopy in the information-rich 2 to 20 keV energy range. We are building a TES-based instrument for the Advanced Photon Source (APS) synchrotron, to be made available to beamline users. 24-pixel prototype arrays have recently been fabricated and tested. The first spectroscopy measurements using these arrays are promising, with a best single-pixel energy resolution of 11.2 eV and saturation energy > 20 keV. We present a series of recent X-ray Fluorescence measurements involving transition metal elements and multi-element samples with closely spaced emission lines, in particular a Cu-Ni-Co thin film and a foil of Cu and Hf. The TES-measured spectra are directly compared to spectra measured with silicon drift detectors at an APS beamline, demonstrating the improved X-ray science made possible by TES spectrometers.
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Submitted 12 September, 2019;
originally announced September 2019.
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Development of Transition-Edge Sensor X-ray Microcalorimeter Linear Array for Compton Scattering and Energy Dispersive Diffraction Imaging
Authors:
U. Patel,
R. Divan,
L. Gades,
T. Guruswamy,
D. Yan,
O. Quaranta,
A. Miceli
Abstract:
We present a strip transition-edge sensor microcalorimeter linear array detector developed for energy dispersive X-ray diffraction imaging and Compton scattering applications. The prototype detector is an array of 20 transition-edge-sensors with absorbers in strip geometry arranged in a linear array. We discuss the fabrication steps needed to develop this array including Mo/Cu bilayer, Au electrop…
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We present a strip transition-edge sensor microcalorimeter linear array detector developed for energy dispersive X-ray diffraction imaging and Compton scattering applications. The prototype detector is an array of 20 transition-edge-sensors with absorbers in strip geometry arranged in a linear array. We discuss the fabrication steps needed to develop this array including Mo/Cu bilayer, Au electroplating, and proof-of-principle fabrication of long strips of SiNx membranes. We demonstrate minimal unwanted effect of strip geometry on X-ray pulse response, and show linear relationship of 1/pulse height and pulse decay times with absorber length. For the absorber lengths studied, preliminary measurements show energy resolutions of 40 eV to 180 eV near 17 keV. Furthermore, we show that the heat flow to the cold bath is nearly independent of the absorber area and depends on the SiNx membrane geometry.
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Submitted 28 November, 2019; v1 submitted 27 August, 2019;
originally announced August 2019.
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Development of a High Rate Front-end ASIC for X-ray Spectroscopy and Diffraction Applications
Authors:
Emerson Vernon,
Gianluigi De Geronimo,
Jonathan Baldwin,
Wei Chen,
Jack Fried,
Gabriele Giacomini,
Anthony Kuczewski,
John Kuczewski,
Joe Mead,
Antonino Miceli,
John S. Okasinski,
Don Pinelli,
Orlando Quaranta,
Abdul K. Rumaiz,
Peter Siddons,
Graham Smith,
Milutin Stanacevic,
Russell Woods
Abstract:
We developed a new front-end application specific integrated circuit (ASIC) for the upgrade of the Maia x-ray microprobe. The ASIC instruments 32 configurable front-end channels that perform either positive or negative charge amplification, pulse sha**, peak amplitude and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1 $μ$s peaking time and a temperature of 248 K, an…
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We developed a new front-end application specific integrated circuit (ASIC) for the upgrade of the Maia x-ray microprobe. The ASIC instruments 32 configurable front-end channels that perform either positive or negative charge amplification, pulse sha**, peak amplitude and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1 $μ$s peaking time and a temperature of 248 K, an electronic resolution of 13- and 10 electrons rms was measured with and without a SDD sensor respectively. A spectral resolution of 170 eV FWHM at 5.9 keV was obtained with an $^{55}$Fe source. The channel linearity was better than $\pm$ 1 % with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250 nm process with a footprint of 6.3 mm x 3.9 mm and dissipates 167 mW of static power.
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Submitted 13 May, 2019;
originally announced May 2019.
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A Two-Dimensional Resistor Network Model for Transition-Edge Sensors with Normal Metal Features
Authors:
Daikang Yan,
Lisa M. Gades,
Tejas Guruswamy,
Antonino Miceli,
Umeshkumar M. Patel,
Orlando Quaranta
Abstract:
Transition-edge sensors (TESs) can be used in high-resolution photon detection, exploiting the steep slope of the resistance in the superconducting-to-normal transition edge. Normal metal bars on the TES film are commonly used to engineer its transition shape, namely the dependence of resistance on temperature and current. This problem has been studied in one dimension, however until now, there ha…
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Transition-edge sensors (TESs) can be used in high-resolution photon detection, exploiting the steep slope of the resistance in the superconducting-to-normal transition edge. Normal metal bars on the TES film are commonly used to engineer its transition shape, namely the dependence of resistance on temperature and current. This problem has been studied in one dimension, however until now, there have been no predictive models of the influence of two-dimensional (2-D) normal metal features on the TES transition shape. In this work, we approach this problem by treating the TES as a 2-D network of resistors, the values of which are based on the two-fluid model. We present a study of the behavior of devices with different 2-D geometric features. Our 2-D network model is capable of predicting how typical TES geometry parameters, such as number of bars, bar spacing, and overall dimensions, influence device behavior and thus is a powerful tool to guide the engineering of new TES devices.
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Submitted 14 March, 2019;
originally announced March 2019.
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Modelling a Transition-Edge Sensor X-ray Microcalorimeter Linear Array for Compton Profile Measurements and Energy Dispersive Diffraction
Authors:
Daikang Yan,
Lisa M. Gades,
Tejas Guruswamy,
Umeshkumar M. Patel,
Orlando Quaranta,
Antonino Miceli
Abstract:
Transition-edge sensors are a type of superconducting detector that offers high energy resolution based on their sharp resistance-temperature feature in the superconducting-to-normal transition. TES X-ray microcalorimeters have typically been designed and used for spectroscopic applications. In this work, we present a design optimization for a TES X-ray microcalorimeter array for high-energy scatt…
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Transition-edge sensors are a type of superconducting detector that offers high energy resolution based on their sharp resistance-temperature feature in the superconducting-to-normal transition. TES X-ray microcalorimeters have typically been designed and used for spectroscopic applications. In this work, we present a design optimization for a TES X-ray microcalorimeter array for high-energy scattering and diffraction measurements. In particular, Compton scattering provides information about the electron momentum distribution, while energy dispersive diffraction provides structural information about dense engineering materials. Compton scattering and energy dispersive diffraction experiments must be conducted in the very hard X-ray regime (~ 100 keV), demanding a high X-ray stop** power in the detector; therefore, an absorber with a large heat capacity is needed in conjunction with the TES. In addition, both applications would benefit from an array composed of parallel strips. We present a design for a TES X-ray microcalorimeter optimized for such applications. In particular, we model the longitudinal position dependence due to the finite thermal diffusion time in the absorber.
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Submitted 22 March, 2019; v1 submitted 26 February, 2019;
originally announced February 2019.
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Multi-element Germanium Detectors for Synchrotron Applications
Authors:
Abdul K. Rumaiz,
Anthony J. Kuczewski,
Joseph Mead,
Emerson Vernon,
Donald Pinelli,
Eric Dooryhee,
Sanjit Ghose,
Thomas Caswell,
D. Peter Siddons,
Antonino Miceli,
Jonathan Baldwin,
Jonathan Almer,
John Okasinski,
Orlando Quaranta,
Russell Woods,
Thomas Krings,
Stuart Stock
Abstract:
We have developed a series of monolithic multi-element germanium detectors, based on sensor arrays produced by the Forschungzentrum Julich, and on Application-specific integrated circuits (ASICs) developed at Brookhaven. Devices have been made with element counts ranging from 64 to 384. These detectors are being used at NSLS-II and APS for a range of diffraction experiments, both monochromatic and…
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We have developed a series of monolithic multi-element germanium detectors, based on sensor arrays produced by the Forschungzentrum Julich, and on Application-specific integrated circuits (ASICs) developed at Brookhaven. Devices have been made with element counts ranging from 64 to 384. These detectors are being used at NSLS-II and APS for a range of diffraction experiments, both monochromatic and energy-dispersive. Compact and powerful readout systems have been developed, based on the new generation of FPGA system-on-chip devices, which provide closely coupled multi-core processors embedded in large gate arrays. We will discuss the technical details of the systems, and present some of the results from them.
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Submitted 23 April, 2018;
originally announced April 2018.
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Quantum Sensing for High Energy Physics
Authors:
Zeeshan Ahmed,
Yuri Alexeev,
Giorgio Apollinari,
Asimina Arvanitaki,
David Awschalom,
Karl K. Berggren,
Karl Van Bibber,
Przemyslaw Bienias,
Geoffrey Bodwin,
Malcolm Boshier,
Daniel Bowring,
Davide Braga,
Karen Byrum,
Gustavo Cancelo,
Gianpaolo Carosi,
Tom Cecil,
Clarence Chang,
Mattia Checchin,
Sergei Chekanov,
Aaron Chou,
Aashish Clerk,
Ian Cloet,
Michael Crisler,
Marcel Demarteau,
Ranjan Dharmapalan
, et al. (91 additional authors not shown)
Abstract:
Report of the first workshop to identify approaches and techniques in the domain of quantum sensing that can be utilized by future High Energy Physics applications to further the scientific goals of High Energy Physics.
Report of the first workshop to identify approaches and techniques in the domain of quantum sensing that can be utilized by future High Energy Physics applications to further the scientific goals of High Energy Physics.
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Submitted 29 March, 2018;
originally announced March 2018.
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Microstructure analysis of bismuth absorbers for transition-edge sensor X-ray microcalorimeters
Authors:
Daikang Yan,
Ralu Divan,
Lisa M. Gades,
Peter Kenesei,
Timothy J. Madden,
Antonino Miceli,
Jun-Sang Park,
Umeshkumar M. Patel,
Orlando Quaranta,
Hemant Sharma,
Douglas A. Bennett,
William B. Doriese,
Joseph W. Fowler,
Johnathon Gard,
James Hays-Wehle,
Kelsey M. Morgan,
Daniel R. Schmidt,
Daniel S. Swetz,
Joel N. Ullom
Abstract:
Transition-edge sensors (TESs) as microcalorimeters offer high resolving power, owning to their sharp response and low operating temperature. In the hard X-ray regime and above, the demand for high quantum-efficiency requires the use of absorbers. Bismuth (Bi), owing to its low heat carrier density and high X-ray stop** power, has been widely used as an absorber material for TESs. However, disti…
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Transition-edge sensors (TESs) as microcalorimeters offer high resolving power, owning to their sharp response and low operating temperature. In the hard X-ray regime and above, the demand for high quantum-efficiency requires the use of absorbers. Bismuth (Bi), owing to its low heat carrier density and high X-ray stop** power, has been widely used as an absorber material for TESs. However, distinct spectral responses have been observed for Bi absorbers deposited via evaporation versus electroplating. Evaporated Bi absorbers are widely observed to have a non-Gaussian tail on the low energy side of measured spectra. In this study, we fabricated Bi absorbers via these two methods, and performed microstructure analysis using scanning electron microscopy (SEM) and X-ray diffraction microscopy. The two types of material showed the same crystallographic structure, but the grain size of the evaporated Bi was about 40 times smaller than that of the electroplated Bi. This distinction in grain size is likely to be the cause of their different spectral responses.
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Submitted 6 November, 2017;
originally announced November 2017.
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Eliminating the non-Gaussian spectral response of X-ray absorbers for transition-edge sensors
Authors:
Daikang Yan,
Ralu Divan,
Lisa M. Gades,
Peter Kenesei,
Timothy J. Madden,
Antonino Miceli,
Jun-Sang Park,
Umeshkumar M. Patel,
Orlando Quaranta,
Hemant Sharma,
Douglas A. Bennett,
William B. Doriese,
Joseph W. Fowler,
Johnathon Gard,
James Hays-Wehle,
Kelsey M. Morgan,
Daniel R. Schmidt,
Daniel S. Swetz,
Joel N. Ullom
Abstract:
Transition-edge sensors (TES) as microcalorimeters for high-energy-resolution X-ray spectroscopy are often fabricated with an absorber made of materials with high Z (for X-ray stop** power) and low heat capacity (for high resolving power). Bismuth represents one of the most compelling options. TESs with evaporated bismuth absorbers have shown spectra with undesirable and unexplained low-energy t…
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Transition-edge sensors (TES) as microcalorimeters for high-energy-resolution X-ray spectroscopy are often fabricated with an absorber made of materials with high Z (for X-ray stop** power) and low heat capacity (for high resolving power). Bismuth represents one of the most compelling options. TESs with evaporated bismuth absorbers have shown spectra with undesirable and unexplained low-energy tails. We have developed TESs with electroplated bismuth absorbers over a gold layer that are not afflicted by this problem and that retain the other positive aspects of this material. To better understand these phenomena, we have studied a series of TESs with gold, gold/evaporated bismuth, and gold/electroplated bismuth absorbers, fabricated on the same die with identical thermal coupling. We show that bismuth morphology is linked to the spectral response of X-ray TES microcalorimeters.
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Submitted 28 August, 2017;
originally announced August 2017.
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Processing of X-ray Microcalorimeter Data with Pulse Shape Variation using Principal Component Analysis
Authors:
Daikang Yan,
Thomas Cecil,
Lisa Gades,
Chris Jacobsen,
Timothy Madden,
Antonino Miceli
Abstract:
We present a method using principal component analysis (PCA) to process x-ray pulses with severe shape variation where traditional optimal filter methods fail. We demonstrate that PCA is able to noise-filter and extract energy information from x-ray pulses despite their different shapes. We apply this method to a dataset from an x-ray thermal kinetic inductance detector which has severe pulse shap…
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We present a method using principal component analysis (PCA) to process x-ray pulses with severe shape variation where traditional optimal filter methods fail. We demonstrate that PCA is able to noise-filter and extract energy information from x-ray pulses despite their different shapes. We apply this method to a dataset from an x-ray thermal kinetic inductance detector which has severe pulse shape variation arising from position-dependent absorption.
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Submitted 7 January, 2016;
originally announced January 2016.
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Tungsten silicide films for microwave kinetic inductance detectors
Authors:
Thomas Cecil,
Antonino Miceli,
Orlando Quaranta,
Chian Liu,
Daniel Rosenmann,
Sean McHugh,
Benjamin Mazin
Abstract:
Microwave Kinetic Inductance Detectors (MKIDs) provide highly multiplexed arrays of detectors that can be configured to operate from the sub-millimeter to the X-ray regime. We have examined two tungsten silicide alloys (W5Si3 and WSi2), which are dense alloys that provide a critical temperature tunable with composition, large kinetic inductance fraction, and high normal-state resistivity. We have…
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Microwave Kinetic Inductance Detectors (MKIDs) provide highly multiplexed arrays of detectors that can be configured to operate from the sub-millimeter to the X-ray regime. We have examined two tungsten silicide alloys (W5Si3 and WSi2), which are dense alloys that provide a critical temperature tunable with composition, large kinetic inductance fraction, and high normal-state resistivity. We have fabricated superconducting resonators and provide measurement data on critical temperature, surface resistance, quality factor, noise, and quasiparticles lifetime. Tungsten silicide appears to be promising for microwave kinetic inductance detectors.
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Submitted 18 July, 2012; v1 submitted 22 March, 2012;
originally announced March 2012.
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Simulations of a micro-PET System based on Liquid Xenon
Authors:
A. Miceli,
J. Glister,
A. Andreyev,
D. Bryman,
L. Kurchaninov,
P. Lu,
A. Muennich,
F. Retiere,
V. Sossi
Abstract:
The imaging performance of a high-resolution preclinical microPET system employing liquid xenon as the gamma ray detection medium was simulated. The arrangement comprises a ring of detectors consisting of trapezoidal LXe time projection ionization chambers and two arrays of large area avalanche photodiodes for the measurement of ionization charge and scintillation light. A key feature of the LXePE…
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The imaging performance of a high-resolution preclinical microPET system employing liquid xenon as the gamma ray detection medium was simulated. The arrangement comprises a ring of detectors consisting of trapezoidal LXe time projection ionization chambers and two arrays of large area avalanche photodiodes for the measurement of ionization charge and scintillation light. A key feature of the LXePET system is the ability to identify individual photon interactions with high energy resolution and high spatial resolution in 3 dimensions and determine the correct interaction sequence using Compton reconstruction algorithms. The simulated LXePET imaging performance was evaluated by computing the noise equivalent count rate, the sensitivity and point spread function for a point source, and by examining the image quality using a micro-Derenzo phantom according to the NEMA-NU4 standard. Results of these simulation studies included NECR peaking at 1326 kcps at 188 MBq (705 kcps at 184 MBq) for an energy window of 450 - 600 keV and a coincidence window of 1 ns for mouse (rat) phantoms. The absolute sensitivity at the center of the field of view was 12.6%. Radial, tangential, and axial resolutions of 22Na point sources reconstructed with a list-mode maximum likelihood expectation maximization algorithm were <= 0.8 mm (FWHM) throughout the field of view. Hot-rod inserts of < 0.8 mm diameter were resolvable in the transaxial image of a micro-Derenzo phantom. The simulations show that a liquid xenon system would provide new capabilities for significantly enhancing PET images.
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Submitted 13 December, 2011; v1 submitted 25 July, 2011;
originally announced July 2011.
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Liquid Xenon Detectors for Positron Emission Tomography
Authors:
A. Miceli,
P. Amaudruz,
F. Benard,
D. A. Bryman,
L. Kurchaninov,
J. P. Martin,
A. Muennich,
F. Retiere,
T. J. Ruth,
V. Sossi,
A. J. Stoessl
Abstract:
PET is a functional imaging technique based on detection of annihilation photons following beta decay producing positrons. In this paper, we present the concept of a new PET system for preclinical applications consisting of a ring of twelve time projection chambers filled with liquid xenon viewed by avalanche photodiodes. Simultaneous measurement of ionization charge and scintillation light leads…
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PET is a functional imaging technique based on detection of annihilation photons following beta decay producing positrons. In this paper, we present the concept of a new PET system for preclinical applications consisting of a ring of twelve time projection chambers filled with liquid xenon viewed by avalanche photodiodes. Simultaneous measurement of ionization charge and scintillation light leads to a significant improvement to spatial resolution, image quality, and sensitivity. Simulated performance shows that an energy resolution of <10% (FWHM) and a sensitivity of 15% are achievable. First tests with a prototype TPC indicate position resolution <1 mm (FWHM).
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Submitted 7 April, 2011;
originally announced April 2011.
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Large dimension forecasting models and random singular value spectra
Authors:
Jean-Philippe Bouchaud,
Laurent Laloux,
M. Augusta Miceli,
Marc Potters
Abstract:
We present a general method to detect and extract from a finite time sample statistically meaningful correlations between input and output variables of large dimensionality. Our central result is derived from the theory of free random matrices, and gives an explicit expression for the interval where singular values are expected in the absence of any true correlations between the variables under…
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We present a general method to detect and extract from a finite time sample statistically meaningful correlations between input and output variables of large dimensionality. Our central result is derived from the theory of free random matrices, and gives an explicit expression for the interval where singular values are expected in the absence of any true correlations between the variables under study. Our result can be seen as the natural generalization of the Marcenko-Pastur distribution for the case of rectangular correlation matrices. We illustrate the interest of our method on a set of macroeconomic time series.
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Submitted 10 December, 2005;
originally announced December 2005.
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Ultrametricity in Fund of Funds Diversification
Authors:
Gabriele Susinno,
Maria Augusta Miceli
Abstract:
Minimum market transparency requirements impose Hedge Fund (HF) managers to use the statement declared strategy in practice. However each declared strategy may actually origin a multiplicity of implemented management decisions. Is then the "actual "strategy the same as the "announced" strategy? Can the actual strategy be monitored or compared to the actual strategy of HF belonging to the same "a…
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Minimum market transparency requirements impose Hedge Fund (HF) managers to use the statement declared strategy in practice. However each declared strategy may actually origin a multiplicity of implemented management decisions. Is then the "actual "strategy the same as the "announced" strategy? Can the actual strategy be monitored or compared to the actual strategy of HF belonging to the same "announced" class? Can the announced or actual strategy be used as a quantitative argument in the fund of funds policy? With the appropriate metric, it is possible to draw a minimum spanning tree (MST) to emphasize the similarity structure that could be hidden in raw correlation matrix of HF returns.
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Submitted 17 December, 2003; v1 submitted 12 December, 2003;
originally announced December 2003.