Showing 1–11 of 11 results for author: McKinney-Martinez, F

Gain suppression study on LGADs at the CENPA tandem accelerator

Authors: S. Braun, Q. Buat, J. Ding, P. Kammel, S. M. Mazza, F. McKinney-Martinez, A. Molnar, C. Lansdell, J. Ott, A. Seiden, B. Schumm, Y. Zhao

Abstract: Low-Gain Avalanche Detectors (LGADs) are a type of thin silicon detector with a highly doped gain layer that provides moderate internal signal amplification. One recent challenge in the use of LGADs, studied by several research groups, is the gain suppression mechanism for large localized charge deposits. Using the CENPA Tandem accelerator at the University of Washington, the response of the LGADs… ▽ More Low-Gain Avalanche Detectors (LGADs) are a type of thin silicon detector with a highly doped gain layer that provides moderate internal signal amplification. One recent challenge in the use of LGADs, studied by several research groups, is the gain suppression mechanism for large localized charge deposits. Using the CENPA Tandem accelerator at the University of Washington, the response of the LGADs to MeV-range energy deposits from a proton beam was studied. Two LGAD prototypes and a PIN diode were characterized, and the gain of the devices was determined as a function of bias voltage, incidence beam angle and proton energy. This study was conducted in the scope of the PIONEER experiment, an experiment proposed at the Paul Scherrer Institute to perform high-precision measurements of rare pion decays. %At the center of the experiment, a high-granularity active target (ATAR) will stop the pion and characterize its decay. A range of deposited charge from Minimum Ionizing Particle (MIP, few 10s of KeV) from positrons to several MeV from the stop** pions/muons is expected in PIONEER; the detection and separation of close-by hits in such a wide dynamic range will be a main challenge of the experiment. To achieve this goal, the gain suppression mechanism has to be understood fully. △ Less

Submitted 3 May, 2024; originally announced May 2024.

Synchrotron light source X-ray detection with Low-Gain Avalanche Diodes

Authors: S. M. Mazza, G. Saito, Y. Zhao, T. Kirkes, N. Yoho, D. Yerdea, N. Nagel, J. Ott, M. Nizam, M. Leite, M. Moralles, H. F. -W. Sadrozinski, A. Seiden, B. Schumm, F. McKinney-Martinez, G. Giacomini, W. Chen

Abstract: The response of Low Gain Avalanche Diodes (LGADs), which are a type of thin silicon detector with internal gain, to X-rays of energies between 6-70 keV was characterized at the SLAC light source (SSRL). The utilized beamline at SSRL was 11-2, with a nominal beam size of 3 cm x 0.5 cm, a repetition rate of 500 MHz, and very monochromatic. LGADs of different thicknesses and gain layer configurations… ▽ More The response of Low Gain Avalanche Diodes (LGADs), which are a type of thin silicon detector with internal gain, to X-rays of energies between 6-70 keV was characterized at the SLAC light source (SSRL). The utilized beamline at SSRL was 11-2, with a nominal beam size of 3 cm x 0.5 cm, a repetition rate of 500 MHz, and very monochromatic. LGADs of different thicknesses and gain layer configurations were read out using fast amplification boards and digitized with a fast oscilloscope. Standard PiN devices were characterized as well. The devices' energy resolution and time resolution as a function of X-ray energy were measured. The charge collection and multiplication mechanism were simulated using TCAD Sentaurus, and the results were compared with the collected data. △ Less

Submitted 1 September, 2023; v1 submitted 27 June, 2023; originally announced June 2023.

Comments: 18 pages, 18 figures

Tuning of gain layer do** concentration and Carbon implantation effect on deep gain layer

Authors: S. M. Mazza, C. Gee, Y. Zhao, R. Padilla, E. Ryan, N. Tournebise, B. Darby, F. McKinney-Martinez, H. F. -W. Sadrozinski, A. Seiden, B. Schumm, V. Cindro, G. Kramberger, I. Mandić, M. Mikuž, M. Zavrtanik, R. Arcidiacono, N. Cartiglia, M. Ferrero, M. Mandurrino, V. Sola, A. Staiano, M. Boscardin, G. F. Della Betta, F. Ficorella , et al. (2 additional authors not shown)

Abstract: Next generation Low Gain Avalanche Diodes (LGAD) produced by Hamamatsu photonics (HPK) and Fondazione Bruno Kessler (FBK) were tested before and after irradiation with ~1MeV neutrons at the JSI facility in Ljubljana. Sensors were irradiated to a maximum 1-MeV equivalent fluence of 2.5E15 Neq/cm2. The sensors analysed in this paper are an improvement after the lessons learned from previous FBK and… ▽ More Next generation Low Gain Avalanche Diodes (LGAD) produced by Hamamatsu photonics (HPK) and Fondazione Bruno Kessler (FBK) were tested before and after irradiation with ~1MeV neutrons at the JSI facility in Ljubljana. Sensors were irradiated to a maximum 1-MeV equivalent fluence of 2.5E15 Neq/cm2. The sensors analysed in this paper are an improvement after the lessons learned from previous FBK and HPK productions that were already reported in precedent papers. The gain layer of HPK sensors was fine-tuned to optimize the performance before and after irradiation. FBK sensors instead combined the benefit of Carbon infusion and deep gain layer to further the radiation hardness of the sensors and reduced the bulk thickness to enhance the timing resolution. The sensor performance was measured in charge collection studies using \b{eta}-particles from a 90Sr source and in capacitance-voltage scans (C-V) to determine the bias to deplete the gain layer. The collected charge and the timing resolution were measured as a function of bias voltage at -30C. Finally a correlation is shown between the bias voltage to deplete the gain layer and the bias voltage needed to reach a certain amount of gain in the sensor. HPK sensors showed a better performance before irradiation while maintaining the radiation hardness of the previous production. FBK sensors showed exceptional radiation hardness allowing a collected charge up to 10 fC and a time resolution of 40 ps at the maximum fluence. △ Less

Submitted 31 January, 2022; v1 submitted 21 January, 2022; originally announced January 2022.

Comments: arXiv admin note: text overlap with arXiv:2004.05260

Inter-pad dead regions of irradiated FBK Low Gain Avalanche Detectors

Authors: B. Darby, S. M. Mazza, F. McKinney-Martinez, R. Padilla, H. F. -W. Sadrozinski, A. Seiden, B. Schumm, M. Wilder, Y. Zhao, R. Arcidiacono, N. Cartiglia, M. Ferrero, M. Mandurrino, V. Sola, A. Staiano, V. Cindro, G. Kranberger, I. Mandiz, M. Mikuz, M. Zavtranik, M. Boscardin, G. F. Della Betta, F. Ficorella, L. Pancheri, G. Paternoster

Abstract: Low Gain Avalanche Detectors (LGADs) are a type of thin silicon detector with a highly doped gain layer. LGADs manufactured by Fondazione Bruno Kessler (FBK) were tested before and after irradiation with neutrons. In this study, the Inter-pad distances (IPDs), defined as the width of the distances between pads, were measured with a TCT laser system. The response of the laser was tuned using $β$-pa… ▽ More Low Gain Avalanche Detectors (LGADs) are a type of thin silicon detector with a highly doped gain layer. LGADs manufactured by Fondazione Bruno Kessler (FBK) were tested before and after irradiation with neutrons. In this study, the Inter-pad distances (IPDs), defined as the width of the distances between pads, were measured with a TCT laser system. The response of the laser was tuned using $β$-particles from a 90Sr source. These insensitive "dead zones" are created by a protection structure to avoid breakdown, the Junction Termination Extension (JTE), which separates the pads. The effect of neutron radiation damage at \fluence{1.5}{15}, and \fluence{2.5}{15} on IPDs was studied. These distances are compared to the nominal distances given from the vendor, it was found that the higher fluence corresponds to a better matching of the nominal IPD. △ Less

Submitted 19 September, 2022; v1 submitted 24 November, 2021; originally announced November 2021.

Effect of deep gain layer and Carbon infusion on LGAD radiation hardness

Authors: R Padilla, C. Labitan, Z. Galloway, C. Gee, S. M. Mazza, F. McKinney-Martinez, H. F. -W. Sadrozinski, A. Seiden, B. Schumm, M. Wilder, Y. Zhao, H. Ren, Y. **, M. Lockerby, V. Cindro, G. Kramberger, I. Mandiz, M. Mikuz, M. Zavrtanik, R. Arcidiacono, N. Cartiglia, M. Ferrero, M. Mandurrino, V. Sola, A. Staiano

Abstract: The properties of 50 um thick Low Gain Avalanche Diode (LGAD) detectors manufactured by Hamamatsu photonics (HPK) and Fondazione Bruno Kessler (FBK) were tested before and after irradiation with 1 MeV neutrons. Their performance were measured in charge collection studies using b-particles from a 90Sr source and in capacitance-voltage scans (C-V) to determine the bias to deplete the gain layer. Car… ▽ More The properties of 50 um thick Low Gain Avalanche Diode (LGAD) detectors manufactured by Hamamatsu photonics (HPK) and Fondazione Bruno Kessler (FBK) were tested before and after irradiation with 1 MeV neutrons. Their performance were measured in charge collection studies using b-particles from a 90Sr source and in capacitance-voltage scans (C-V) to determine the bias to deplete the gain layer. Carbon infusion to the gain layer of the sensors was tested by FBK in the UFSD3 production. HPK instead produced LGADs with a very thin, highly doped and deep multiplication layer. The sensors were exposed to a neutron fluence from 4e14 neq/cm2 to 4e15 neq/cm2. The collected charge and the timing resolution were measured as a function of bias voltage at -30C, furthermore the profile of the capacitance over voltage of the sensors was measured. △ Less

Submitted 27 July, 2020; v1 submitted 10 April, 2020; originally announced April 2020.

Comments: 13 pages, 10 figures, 16 references

Proprieties of FBK UFSDs after neutron and proton irradiation up to 6*10e15 neq/cm2

Authors: S. M. Mazza, E. Estrada, Z. Galloway, C. Gee, A. Goto, Z. Luce, F. McKinney-Martinez, R. Rodriguez, H. F. -W. Sadrozinski, A. Seiden, B. Smithers, Y. Zhao, V. Cindro, G. Kramberger, I. Mandić, M. Mikuž, M. Zavrtanik R. Arcidiacono, N. Cartiglia, M. Ferrero, M. Mandurrino, V. Sola, A. Staiano, M. Boscardin, G. F. Della Betta, F. Ficorella , et al. (2 additional authors not shown)

Abstract: The properties of 60-μm thick Ultra-Fast Silicon Detectors (UFSD) detectors manufactured by Fondazione Bruno Kessler (FBK), Trento (Italy) were tested before and after irradiation with minimum ionizing particles (MIPs) from a 90Sr \b{eta}-source . This FBK production, called UFSD2, has UFSDs with gain layer made of Boron, Boron low-diffusion, Gallium, Carbonated Boron and Carbonated. The irradiati… ▽ More The properties of 60-μm thick Ultra-Fast Silicon Detectors (UFSD) detectors manufactured by Fondazione Bruno Kessler (FBK), Trento (Italy) were tested before and after irradiation with minimum ionizing particles (MIPs) from a 90Sr \b{eta}-source . This FBK production, called UFSD2, has UFSDs with gain layer made of Boron, Boron low-diffusion, Gallium, Carbonated Boron and Carbonated. The irradiation with neutrons took place at the TRIGA reactor in Ljubljana, while the proton irradiation took place at CERN SPS. The sensors were exposed to a neutron fluence of 4*10e14, 8*1014, 1.5*10e15, 3*10e15, 6*10e15 neq/cm2 and to a proton fluence of 9.6*10e14 p/cm2, equivalent to a fluence of 6*10e14 neq/cm2. The internal gain and the timing resolution were measured as a function of bias voltage at -20C. The timing resolution was extracted from the time difference with a second calibrated UFSD in coincidence, using the constant fraction method for both. △ Less

Submitted 18 March, 2020; v1 submitted 15 April, 2018; originally announced April 2018.

Comments: arXiv admin note: text overlap with arXiv:1803.02690

Beam test measurements of Low Gain Avalanche Detector single pads and arrays for the ATLAS High Granularity Timing Detector

Authors: C. Allaire, J. Benitez, M. Bomben, G. Calderini, M. Carulla, E. Cavallaro, A. Falou, D. Flores, P. Freeman, Z. Galloway, E. L. Gkougkousis, H. Grabas, S. Grinstein, B. Gruey, S. Guindon, A. M. Henriques Correia, S. Hidalgo, A. Kastanas, C. Labitan, D. Lacour, J. Lange, F. Lanni, B. Lenzi, Z. Luce, N. Makovec , et al. (19 additional authors not shown)

Abstract: For the high luminosity upgrade of the LHC at CERN, ATLAS is considering the addition of a High Granularity Timing Detector (HGTD) in front of the end cap and forward calorimeters at |z| = 3.5 m and covering the region 2.4 < |η| < 4 to help reducing the effect of pile-up. The chosen sensors are arrays of 50 μm thin Low Gain Avalanche Detectors (LGAD). This paper presents results on single LGAD sen… ▽ More For the high luminosity upgrade of the LHC at CERN, ATLAS is considering the addition of a High Granularity Timing Detector (HGTD) in front of the end cap and forward calorimeters at |z| = 3.5 m and covering the region 2.4 < |η| < 4 to help reducing the effect of pile-up. The chosen sensors are arrays of 50 μm thin Low Gain Avalanche Detectors (LGAD). This paper presents results on single LGAD sensors with a surface area of 1.3x1.3 mm2 and arrays with 2x2 pads with a surface area of 2x2 mm^2 or 3x3 mm^2 each and different implant doses of the p+ multiplication layer. They are obtained from data collected during a beam test campaign in Autumn 2016 with a pion beam of 120 GeV energy at the CERN SPS. In addition to several quantities measured inclusively for each pad, the gain, efficiency and time resolution have been estimated as a function of the position of the incident particle inside the pad by using a beam telescope with a position resolution of few μm. Different methods to measure the time resolution are compared, yielding consistent results. The sensors with a surface area of 1.3x1.3 mm^2 have a time resolution of about 40 ps for a gain of 20 and of about 27 ps for a gain of 50 and fulfill the HGTD requirements. Larger sensors have, as expected, a degraded time resolution. All sensors show very good efficiency and time resolution uniformity. △ Less

Submitted 9 August, 2018; v1 submitted 2 April, 2018; originally announced April 2018.

Journal ref: JINST 13 P06017 (2018)

Comparison of 35 and 50 μm thin HPK UFSD after neutron irradiation up to 6*10^15 neq/cm^2

Authors: Y. Zhao, N. Cartiglia, E. Estrada, Z. Galloway, C. Gee, A. Goto, Z. Luce, S. M. Mazza, F. McKinney-Martinez, R. Rodriguez, H. F. -W. Sadrozinski, A. Seiden V. Cindro, G. Kramberger, I. Mandić, M. Mikuž, M. Zavrtanik

Abstract: We report results from the testing of 35 μm thick Ultra-Fast Silicon Detectors (UFSD produced by Hamamatsu Photonics (HPK), Japan and the comparison of these new results to data reported before on 50 μm thick UFSD produced by HPK. The 35 μm thick sensors were irradiated with neutrons to fluences of 0, 1*10^14, 1*10^15, 3*10^15, 6*10^15 neq/cm^2. The sensors were tested pre-irradiation and post-irr… ▽ More We report results from the testing of 35 μm thick Ultra-Fast Silicon Detectors (UFSD produced by Hamamatsu Photonics (HPK), Japan and the comparison of these new results to data reported before on 50 μm thick UFSD produced by HPK. The 35 μm thick sensors were irradiated with neutrons to fluences of 0, 1*10^14, 1*10^15, 3*10^15, 6*10^15 neq/cm^2. The sensors were tested pre-irradiation and post-irradiation with minimum ionizing particles (MIPs) from a 90Sr \b{eta}-source. The leakage current, capacitance, internal gain and the timing resolution were measured as a function of bias voltage at -20C and -27C. The timing resolution was extracted from the time difference with a second calibrated UFSD in coincidence, using the constant fraction method for both. Within the fluence range measured, the advantage of the 35 μm thick UFSD in timing accuracy, bias voltage and power can be established. △ Less

Submitted 5 March, 2018; originally announced March 2018.

Comments: 9 pages, 9 figures, HSTD11 Okinawa. arXiv admin note: text overlap with arXiv:1707.04961

Radiation Hardness of Thin Low Gain Avalanche Detectors

Authors: G. Kramberger, M. Carulla, E. Cavallaro, V. Cindro, D. Flores, Z. Galloway, S. Grinstein, S. Hidalgo, V. Fadeyev, J. Lange, I. Mandic, G. Medin, A. Merlos, F. McKinney-Martinez, M. Mikuz, D. Quirion, G. Pellegrini, M. Petek, H. F-W. Sadrozinski, A. Seiden, M. Zavrtanik

Abstract: Low Gain Avalanche Detectors (LGAD) are based on a n++-p+-p-p++ structure where an appropriate do** of the multiplication layer (p+) leads to high enough electric fields for impact ionization. Gain factors of few tens in charge significantly improve the resolution of timing measurements, particularly for thin detectors, where the timing performance was shown to be limited by Landau fluctuations.… ▽ More Low Gain Avalanche Detectors (LGAD) are based on a n++-p+-p-p++ structure where an appropriate do** of the multiplication layer (p+) leads to high enough electric fields for impact ionization. Gain factors of few tens in charge significantly improve the resolution of timing measurements, particularly for thin detectors, where the timing performance was shown to be limited by Landau fluctuations. The main obstacle for their operation is the decrease of gain with irradiation, attributed to effective acceptor removal in the gain layer. Sets of thin sensors were produced by two different producers on different substrates, with different gain layer do** profiles and thicknesses (45, 50 and 80 um). Their performance in terms of gain/collected charge and leakage current was compared before and after irradiation with neutrons and pions up to the equivalent fluences of 5e15 cm-2. Transient Current Technique and charge collection measurements with LHC speed electronics were employed to characterize the detectors. The thin LGAD sensors were shown to perform much better than sensors of standard thickness (~300 um) and offer larger charge collection with respect to detectors without gain layer for fluences <2e15 cm-2. Larger initial gain prolongs the beneficial performance of LGADs. Pions were found to be more damaging than neutrons at the same equivalent fluence, while no significant difference was found between different producers. At very high fluences and bias voltages the gain appears due to deep acceptors in the bulk, hence also in thin standard detectors. △ Less

Submitted 16 November, 2017; originally announced November 2017.

Properties of HPK UFSD after neutron irradiation up to 6e15 n/cm2

Authors: Z. Galloway, V. Fadeyev, P. Freeman, E. Gkougkousis, B. Gruey, C. A. Labitan, Z. Luce, F. McKinney-Martinez, H. F. -W. Sadrozinski, A. Seiden, E. Spencer, M. Wilder, N. Woods, A. Zatserklyaniy, Y. Zhao, N. Cartiglia, M. Ferrero, S. Giordanengo, M. Mandurrino, A. Staiano, V. Sola, F. Cenna, F. Fausti, R. Arcidiacono, F. Carnasecchi , et al. (5 additional authors not shown)

Abstract: In this paper we report results from a neutron irradiation campaign of Ultra-Fast Silicon Detectors (UFSD) with fluences of 1e14, 3e14, 6e14, 1e15, 3e15, 6e15 n/cm2. The UFSD used in this study are circular 50 micro-meter thick Low-Gain Avalanche Detectors (LGAD), with a 1.0 mm diameter active area. They have been produced by Hamamatsu Photonics (HPK), Japan, with pre-radiation internal gain in th… ▽ More In this paper we report results from a neutron irradiation campaign of Ultra-Fast Silicon Detectors (UFSD) with fluences of 1e14, 3e14, 6e14, 1e15, 3e15, 6e15 n/cm2. The UFSD used in this study are circular 50 micro-meter thick Low-Gain Avalanche Detectors (LGAD), with a 1.0 mm diameter active area. They have been produced by Hamamatsu Photonics (HPK), Japan, with pre-radiation internal gain in the range 10-100 depending on the bias voltage. The sensors were tested pre-irradiation and post-irradiation with minimum ionizing particle (MIPs) from a 90Sr based \b{eta}-source. The leakage current, internal gain and the timing resolution were measured as a function of bias voltage at -20C and -30C. The timing resolution was extracted from the time difference with a second calibrated UFSD in coincidence, using the constant fraction method for both. The dependence of the gain upon the irradiation fluence is consistent with the concept of acceptor removal and the gain decreases from about 80 pre-irradiation to 7 after a fluence of 6e15 n/cm2. Consequently, the timing resolution was found to deteriorate from 20 ps to 50 ps. The results indicate that the most accurate time resolution is obtained at a value of the constant fraction discriminator (CFD) threshold used to determine the time of arrival varying with fluence, from 10% pre-radiation to 60% at the highest fluence. Key changes to the pulse shape induced by irradiation, i.e. (i) a reduce sensitivity of the pulse shape on the initial non-uniform charge deposition, (ii) the shortening of the rise time and (iii) the reduced pulse height, were compared with the WF2 simulation program and found to be in agreement. △ Less

Submitted 10 April, 2020; v1 submitted 16 July, 2017; originally announced July 2017.

Comments: 18 pages, 21 figures, 1 table

Beam test results of a 16 ps timing system based on ultra-fast silicon detectors

Authors: N. Cartiglia, A. Staiano, V. Sola, R. Arcidiacono, R. Cirio, F. Cenna, M. Ferrero, V. Monaco, R. Mulargia, M. Obertino, F. Ravera, R. Sacchi, A. Bellora, S. Durando, M. Mandurrino, N. Minafra, V. Fadeyev, P. Freeman, Z. Galloway, E. Gkougkousis, H. Grabas, B. Gruey, C. A. Labitan, R. Losakul, Z. Luce , et al. (18 additional authors not shown)

Abstract: In this paper we report on the timing resolution of the first production of 50 micro-meter thick Ultra-Fast Silicon Detectors (UFSD) as obtained in a beam test with pions of 180 GeV/c momentum. UFSD are based on the Low-Gain Avalanche Detectors (LGAD) design, employing n-on-p silicon sensors with internal charge multiplication due to the presence of a thin, low-resistivity diffusion layer below th… ▽ More In this paper we report on the timing resolution of the first production of 50 micro-meter thick Ultra-Fast Silicon Detectors (UFSD) as obtained in a beam test with pions of 180 GeV/c momentum. UFSD are based on the Low-Gain Avalanche Detectors (LGAD) design, employing n-on-p silicon sensors with internal charge multiplication due to the presence of a thin, low-resistivity diffusion layer below the junction. The UFSD used in this test belongs to the first production of thin (50 μm) sensors, with an pad area of 1.4 mm2. The gain was measured to vary between 5 and 70 depending on the bias voltage. The experimental setup included three UFSD and a fast trigger consisting of a quartz bar readout by a SiPM. The timing resolution, determined comparing the time of arrival of the particle in one or more UFSD and the trigger counter, for single UFSD was measured to be 35 ps for a bias voltage of 200 V, and 26 ps for a bias voltage of 240 V, and for the combination of 3 UFSD to be 20 ps for a bias voltage of 200 V, and 15 ps for a bias voltage of 240 V. △ Less

Submitted 3 January, 2017; v1 submitted 30 August, 2016; originally announced August 2016.

Comments: 7 pages, 8 figures, 1 table, Subm. to NIM A

Journal ref: NIM A850, 1 April 2017, pages 83-88