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Double diffraction imaging of X-ray induced structural dynamics in single free nanoparticles
Authors:
M. Sauppe,
T. Bischoff,
C. Bomme,
C. Bostedt,
A. Colombo,
B. Erk,
T. Feigl,
L. Flückiger,
T. Gorkhover,
A. Heilrath,
K. Kolatzki,
Y. Kumagai,
B. Langbehn,
J. P. Müller,
C. Passow,
D. Ramm,
D. Rolles,
D. Rompotis,
J. Schäfer-Zimmermann,
B. Senfftleben,
R. Treusch,
A. Ulmer,
J. Zimbalski,
T. Möller,
D. Rupp
Abstract:
Because of their high photon flux, X-ray free-electron lasers (FEL) allow to resolve the structure of individual nanoparticles via coherent diffractive imaging (CDI) within a single X-ray pulse. Since the inevitable rapid destruction of the sample limits the achievable resolution, a thorough understanding of the spatiotemporal evolution of matter on the nanoscale following the irradiation is cruci…
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Because of their high photon flux, X-ray free-electron lasers (FEL) allow to resolve the structure of individual nanoparticles via coherent diffractive imaging (CDI) within a single X-ray pulse. Since the inevitable rapid destruction of the sample limits the achievable resolution, a thorough understanding of the spatiotemporal evolution of matter on the nanoscale following the irradiation is crucial. We present a technique to track X-ray induced structural changes in time and space by recording two consecutive diffraction patterns of the same single, free-flying nanoparticle, acquired separately on two large-area detectors opposite to each other, thus examining both the initial and evolved particle structure. We demonstrate the method at the extreme ultraviolet (XUV) and soft X-ray Free-electron LASer in Hamburg (FLASH), investigating xenon clusters as model systems. By splitting a single XUV pulse, two diffraction patterns from the same particle can be obtained. For focus intensities of about $2\cdot10^{12}\,\text{W/cm}^2$ we observe still largely intact clusters even at the longest delays of up to 650 picoseconds of the second pulse, indicating that in the highly absorbing systems the damage remains confined to one side of the cluster. Instead, in case of five times higher flux, the diffraction patterns show clear signatures of disintegration, namely increased diameters and density fluctuations in the fragmenting clusters. Future improvements to the accessible range of dynamics and time resolution of the approach are discussed.
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Submitted 22 May, 2024; v1 submitted 19 December, 2023;
originally announced December 2023.
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Diffractive imaging of transient electronic core-shell structures in a nanoplasma
Authors:
Daniela Rupp,
Leonie Flückiger,
Marcus Adolph,
Tais Gorkhover,
Maria Krikunova,
Jan Phillipe Müller,
Maria Müller,
Tim Oelze,
Yevheniy Ovcharenko,
Mario Sauppe,
Sebastian Schorb,
David Wolter,
Marion Harmand,
Rolf Treusch,
Christoph Bostedt,
Thomas Möller
Abstract:
We have recorded the coherent diffraction images of individual xenon clusters with intense extreme ultraviolet pulses to elucidate the influence of light-induced electronic changes on the diffraction pattern. Using the FLASH free-electron laser we tuned the wavelength to specific xenon atomic and ionic resonances. The data show the emergence of a transient core-shell structure within the otherwise…
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We have recorded the coherent diffraction images of individual xenon clusters with intense extreme ultraviolet pulses to elucidate the influence of light-induced electronic changes on the diffraction pattern. Using the FLASH free-electron laser we tuned the wavelength to specific xenon atomic and ionic resonances. The data show the emergence of a transient core-shell structure within the otherwise homogeneous sample. Simulations indicate that ionization and nanoplasma formation result in a cluster shell with strongly altered refraction. The presented resonant scattering approach enables imaging of ultrafast electron dynamics on their natural time scale.
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Submitted 11 October, 2017; v1 submitted 3 November, 2016;
originally announced November 2016.
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Ultra-compact In-Line Scattering Polarimetry
Authors:
J. P. Balthasar Müller,
Kristjan Leosson,
Federico Capasso
Abstract:
In-line polarimeters perform non-destructive polarization measurements of optical signals, and play a critical role in monitoring and controlling the polarization environment in for example optical networks. While current in-line polarimeters are constructed with multiple optical components, either fabricated into an optical fiber or using free-space optics, we present here a novel architecture co…
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In-line polarimeters perform non-destructive polarization measurements of optical signals, and play a critical role in monitoring and controlling the polarization environment in for example optical networks. While current in-line polarimeters are constructed with multiple optical components, either fabricated into an optical fiber or using free-space optics, we present here a novel architecture conducive to monolithic on-chip integration. This enables the scalable fabrication of high-performance polarization sensors with exceptional stability, compactness and speed. The method relies on the detection of the highly polarization-dependent scattered field of a sub-wavelength antenna array known as metasurface, and is shown here to provide polarization state measurements matching those of a state-of-the-art commercial polarimeter.
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Submitted 8 December, 2015; v1 submitted 17 September, 2015;
originally announced September 2015.
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Lateral Chirality-sorting Optical Spin Forces in Evanescent Fields
Authors:
Amaury Hayat,
J. P. Balthasar Müller,
Federico Capasso
Abstract:
The transverse component of the spin angular momentum of evanescent waves gives rise to lateral optical forces on chiral particles, which have the unusual property of acting in a direction in which there is neither a field gradient nor wave propagation. As their direction and strength depends on the chiral polarizability of the particle, they act as chirality-sorting and may offer a mechanism for…
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The transverse component of the spin angular momentum of evanescent waves gives rise to lateral optical forces on chiral particles, which have the unusual property of acting in a direction in which there is neither a field gradient nor wave propagation. As their direction and strength depends on the chiral polarizability of the particle, they act as chirality-sorting and may offer a mechanism for passive chirality spectroscopy. The absolute strength of the forces also substantially exceeds that of other recently predicted sideways optical forces, such that they may more readily offer an experimental confirmation of the phenomenon.
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Submitted 20 December, 2014; v1 submitted 10 August, 2014;
originally announced August 2014.
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Strong Asymmetric Surface Plasmon Polariton Emission by a Dipole Emitter near a Metal Surface
Authors:
J. P. Balthasar Mueller,
Federico Capasso
Abstract:
We show that the surface plasmon polariton (SPP) radiation patterns of point-dipole emitters in the vicinity of a metal-dielectric interface are generally asymmetric with respect to the location of the emitter. In particular rotating dipoles, which emit elliptically polarized light, produce highly asymmetric SPP radiation fields that include unidirectional emission. Asymmetric SPP radiation patter…
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We show that the surface plasmon polariton (SPP) radiation patterns of point-dipole emitters in the vicinity of a metal-dielectric interface are generally asymmetric with respect to the location of the emitter. In particular rotating dipoles, which emit elliptically polarized light, produce highly asymmetric SPP radiation fields that include unidirectional emission. Asymmetric SPP radiation patterns also result when a dipole oscillates tilted with respect to the plane of the interface and optical losses or gains are present in the materials. These effects can be used to directionally control SPP emission and absorption, as well as to study emission and scattering processes close to metal-dielectric interfaces. Possible implementations of asymmetrically emitting SPP sources are discussed.
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Submitted 6 November, 2013; v1 submitted 8 April, 2013;
originally announced April 2013.
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Steplike intensity threshold behavior of extreme ionization in laser-driven Xe clusters
Authors:
T. Döppner,
J. P. Müller,
A. Przystawik,
S. Göde,
J. Tiggesbäumker,
K. -H. Meiwes-Broer,
C. Varin,
L. Ramunno,
T. Brabec,
T. Fennel
Abstract:
The generation of highly charged Xe$^{q+}$ ions up to {$q=24$} is observed in Xe clusters embedded in helium nanodroplets and exposed to intense femtosecond laser pulses ($λ$=800 nm). Laser intensity resolved measurements show that the high-$q$ ion generation starts at an unexpectedly low threshold intensity of about {10$^{14}$ W/cm$^{2}$}. Above threshold, the Xe ion charge spectrum saturates q…
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The generation of highly charged Xe$^{q+}$ ions up to {$q=24$} is observed in Xe clusters embedded in helium nanodroplets and exposed to intense femtosecond laser pulses ($λ$=800 nm). Laser intensity resolved measurements show that the high-$q$ ion generation starts at an unexpectedly low threshold intensity of about {10$^{14}$ W/cm$^{2}$}. Above threshold, the Xe ion charge spectrum saturates quickly and changes only weakly for higher laser intensities. Good agreement between these observations and a molecular dynamics analysis allows us to identify the mechanisms responsible for the highly charged ion production and the surprising intensity threshold behavior of the ionization process.
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Submitted 6 March, 2010; v1 submitted 14 August, 2009;
originally announced August 2009.