Sub-Volt High-Speed Silicon MOSCAP Microring Modulator Driven by High Mobility Conductive Oxide
Authors:
Wei-Che Hsu,
Nabila Nujhat,
Benjamin Kupp,
John F. Conley Jr,
Haisheng Rong,
Ranjeet Kumar,
Alan X. Wang
Abstract:
Low driving voltage (Vpp), high-speed silicon microring modulator plays a critical role in energy-efficient optical interconnect and optical computing systems owing to its ultra-compact footprint and capability for on-chip wavelength-division multiplexing. However, existing silicon microring modulators usually require more than 2 V of Vpp, which is limited by the relatively weak plasma dispersion…
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Low driving voltage (Vpp), high-speed silicon microring modulator plays a critical role in energy-efficient optical interconnect and optical computing systems owing to its ultra-compact footprint and capability for on-chip wavelength-division multiplexing. However, existing silicon microring modulators usually require more than 2 V of Vpp, which is limited by the relatively weak plasma dispersion effect of silicon and the small capacitance density of the reversed PN-junction. Here we present a highly efficient metal-oxide semiconductor capacitor (MOSCAP) microring modulator through heterogeneous integration between silicon photonics and titanium-doped indium oxide, which is a high-mobility transparent conductive oxide (TCO) material with a strong plasma dispersion effect. The device is co-fabricated by Intel's photonics fab and TCO patterning processes at Oregon State University, which exhibits a high electro-optic modulation efficiency of 117 pm/V with a low VpiL of 0.12 Vcm, and consequently can be driven by an extremely low Vpp of 0.8 V. At a 11 GHz modulation bandwidth where the modulator is limited by the high parasitic capacitance, we obtained 25 Gb/s clear eye diagrams with energy efficiency of 53 fJ/bit and demonstrated 35 Gb/s open eyes with a higher driving voltage. Further optimization of the device is expected to increase the modulation bandwidth up to 52 GHz that can encode data at 100 Gb/s for next-generation, energy-efficient optical communication and computation with sub-volt driving voltage without using any high voltage swing amplifier.
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Submitted 30 August, 2023;
originally announced August 2023.
Spatially Resolved Persistent Photoconductivity in MoS$_2$-WS$_2$ Lateral Heterostructures
Authors:
Samuel Berweger,
Hanyu Zhang,
Prasana K. Sahoo,
Benjamin M. Kupp,
Jeffrey L. Blackburn,
Elisa M. Miller,
T. Mitch Wallis,
Dmitri V. Voronine,
Pavel Kabos,
San**i U. Nanayakkara
Abstract:
The optical and electronic properties of 2D semiconductors are intrinsically linked via the strong interactions between optically excited bound species and free carriers. Here we use near-field scanning microwave microscopy (SMM) to image spatial variations in photoconductivity in MoS$_2$--WS$_2$ lateral multijunction heterostructures using photon energy-resolved narrowband illumination. We find t…
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The optical and electronic properties of 2D semiconductors are intrinsically linked via the strong interactions between optically excited bound species and free carriers. Here we use near-field scanning microwave microscopy (SMM) to image spatial variations in photoconductivity in MoS$_2$--WS$_2$ lateral multijunction heterostructures using photon energy-resolved narrowband illumination. We find that the onset of photoconductivity in individual domains corresponds to the optical absorption onset, confirming that the tightly bound excitons in transition metal dichalcogenides can nonetheless dissociate into free carriers. These photogenerated carriers are most likely n-type and are seen to persist for up to days, and informed by finite element modeling we reveal that they can increase the carrier density by up to 200 times. This persistent photoconductivity appears to be dominated by contributions from the multilayer MoS$_2$ domains, and we attribute the flake-wide response in part to charge transfer across the heterointerface. Spatial correlation of our SMM imaging with photoluminescence (PL) map** confirms the strong link between PL peak emission photon energy, PL intensity, and the local accumulated charge. This work reveals the spatially and temporally complex optoelectronic response of these systems and cautions that properties measured during or after illumination may not reflect the true dark state of these materials but rather a metastable charged state.
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Submitted 10 August, 2020;
originally announced August 2020.
