Showing 1–21 of 21 results for author: Jesse, S

A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy

Authors: Ondrej Dyck, Olugbenga Olunloyo, Kai Xiao, Benjamin Wolf, Thomas M. Moore, Andrew R. Lupini, Stephen Jesse

Abstract: We present the design and implementation of a side entry laser system designed for an ultra-high vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can be easily aligned, modified, or exchanged without disturbing the vacuum. The system uses a mirror mounted on the sample holder such that the sample can be illumi… ▽ More We present the design and implementation of a side entry laser system designed for an ultra-high vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can be easily aligned, modified, or exchanged without disturbing the vacuum. The system uses a mirror mounted on the sample holder such that the sample can be illuminated without being tilted. Notably the mirror can be removed and replaced with an ablation target and a higher power laser used to ablate material directly onto the sample. We argue that new capabilities hold the potential to transform the electron microscope from an analysis tool towards a more flexible synthesis system, where atomic scale fabrication and atom-by-atom experiments can be performed. △ Less

Submitted 12 July, 2024; originally announced July 2024.

Closed-Loop Electron-Beam-Induced Spectroscopy and Nanofabrication Around Individual Quantum Emitters

Authors: Jawaher Almutlaq, Kyle P. Kelley, Hyeongrak Choi, Linsen Li, Benjamin Lawrie, Ondrej Dyck, Dirk Englund, Stephen Jesse

Abstract: Color centers in diamond play a central role in the development of quantum photonic technologies, and their importance is only expected to grow in the near future. For many quantum applications, high collection efficiency from individual emitters is required, but the refractive index mismatch between diamond and air limits the optimal collection efficiency with conventional diamond device geometri… ▽ More Color centers in diamond play a central role in the development of quantum photonic technologies, and their importance is only expected to grow in the near future. For many quantum applications, high collection efficiency from individual emitters is required, but the refractive index mismatch between diamond and air limits the optimal collection efficiency with conventional diamond device geometries. While different out-coupling methods with near-unity efficiency exist, many have yet to be realized due to current limitations in nanofabrication methods, especially for mechanically hard materials like diamond. Here, we leverage electron-beam-induced etching to modify Sn-implanted diamond quantum microchiplets containing integrated waveguides with width and thickness of 280 nm and 200 nm, respectively. This approach allows for simultaneous high-resolution imaging and modification of the host matrix with an open geometry and direct writing. When coupled with the cathodoluminescence signal generated from the electron-emitter interactions, we can monitor the enhancement of the quantum emitters in real-time with nanoscale spatial resolution. The operando measurement and manipulation of single photon emitters demonstrated here provides a new foundation for the control of emitter-cavity interactions in integrated quantum photonics. △ Less

Submitted 8 December, 2023; originally announced December 2023.

Comments: 7 pages, 4 figures

Controlling hydrocarbon transport and electron beam induced deposition on single layer graphene: toward atomic scale synthesis in the scanning transmission electron microscope

Authors: Ondrej Dyck, Andrew R. Lupini, Philip D. Rack, Jason Fowlkes, Stephen Jesse

Abstract: Focused electron beam induced deposition (FEBID) is a direct write technique for depositing materials on a support substrate akin to 3D printing with an electron beam (e-beam). Opportunities exist for merging this existing technique with aberration-corrected scanning transmission electron microscopy to achieve molecular- or atomic-level spatial precision. Several demonstrations have been performed… ▽ More Focused electron beam induced deposition (FEBID) is a direct write technique for depositing materials on a support substrate akin to 3D printing with an electron beam (e-beam). Opportunities exist for merging this existing technique with aberration-corrected scanning transmission electron microscopy to achieve molecular- or atomic-level spatial precision. Several demonstrations have been performed using graphene as the support substrate. A common challenge that arises during this process is e-beam-induced hydrocarbon deposition, suggesting greater control over the sample environment is needed. Various strategies exist for cleaning graphene in situ. One of the most effective methods is to rapidly heat to high temperatures, e.g., 600 C or higher. While this can produce large areas of what appears to be atomically clean graphene, mobile hydrocarbons can still be present on the surfaces. Here, we show that these hydrocarbons are primarily limited to surface migration and demonstrate an effective method for interrupting the flow using e-beam deposition to form corralled hydrocarbon regions. This strategy is effective for maintaining atomically clean graphene at high temperatures where hydrocarbon mobility can lead to substantial accumulation of unwanted e-beam deposition. △ Less

Submitted 11 July, 2023; originally announced July 2023.

The Synthescope: A Vision for Combining Synthesis with Atomic Fabrication

Authors: Ondrej Dyck, Andrew R. Lupini, Stephen Jesse

Abstract: The scanning transmission electron microscope, a workhorse instrument in materials characterization, is being transformed into an atomic-scale material manipulation platform. With an eye on the trajectory of recent developments and the obstacles toward progress in this field, we provide a vision for a path toward an expanded set of capabilities and applications. We reconceptualize the microscope a… ▽ More The scanning transmission electron microscope, a workhorse instrument in materials characterization, is being transformed into an atomic-scale material manipulation platform. With an eye on the trajectory of recent developments and the obstacles toward progress in this field, we provide a vision for a path toward an expanded set of capabilities and applications. We reconceptualize the microscope as an instrument for fabrication and synthesis with the capability to image and characterize atomic-scale structural formation as it occurs. Further development and refinement of this approach may have substantial impact on research in microelectronics, quantum information science, and catalysis where precise control over atomic scale structure and chemistry of a few "active sites" can have a dramatic impact on larger scale functionality and where develo** a better understanding of atomic scale processes can help point the way to larger scale synthesis approaches. △ Less

Submitted 30 May, 2023; v1 submitted 16 February, 2023; originally announced February 2023.

Top-down fabrication of atomic patterns in twisted bilayer graphene

Authors: Ondrej Dyck, Sinchul Yeom, Andrew R. Lupini, Jacob L. Swett, Dale Hensley, Mina Yoon, Stephen Jesse

Abstract: Atomic-scale engineering typically involves bottom-up approaches, leveraging parameters such as temperature, partial pressures, and chemical affinity to promote spontaneous arrangement of atoms. These parameters are applied globally, resulting in atomic scale features scattered probabilistically throughout the material. In a top-down approach, different regions of the material are exposed to diffe… ▽ More Atomic-scale engineering typically involves bottom-up approaches, leveraging parameters such as temperature, partial pressures, and chemical affinity to promote spontaneous arrangement of atoms. These parameters are applied globally, resulting in atomic scale features scattered probabilistically throughout the material. In a top-down approach, different regions of the material are exposed to different parameters resulting in structural changes varying on the scale of the resolution. In this work, we combine the application of global and local parameters in an aberration corrected scanning transmission electron microscope (STEM) to demonstrate atomic scale precision patterning of atoms in twisted bilayer graphene. The focused electron beam is used to define attachment points for foreign atoms through the controlled ejection of carbon atoms from the graphene lattice. The sample environment is staged with nearby source materials, such that the sample temperature can induce migration of the source atoms across the sample surface. Under these conditions, the electron-beam (top-down) enables carbon atoms in the graphene to be replaced spontaneously by diffusing adatoms (bottom-up). Using image-based feedback-control, arbitrary patterns of atoms and atom clusters are attached to the twisted bilayer graphene with limited human interaction. The role of substrate temperature on adatom and vacancy diffusion is explored by first-principles simulations. △ Less

Submitted 4 January, 2023; originally announced January 2023.

Probing temperature-induced phase transitions at individual ferroelectric domain walls

Authors: Kyle P. Kelley, Sergei V. Kalinin, Eugene Eliseev, Shivaranjan Raghuraman, Stephen Jesse, Peter Maksymovych, Anna N. Morozovska

Abstract: Ferroelectric domain walls have emerged as one of the most fascinating objects in condensed matter physics due to the broad variability of functional behaviors they exhibit. However, the vast majority of domain walls studies have been focused on bias-induced dynamics and transport behaviors. Here, we introduce the scanning probe microscopy approach based on piezoresponse force microscopy (PFM) wit… ▽ More Ferroelectric domain walls have emerged as one of the most fascinating objects in condensed matter physics due to the broad variability of functional behaviors they exhibit. However, the vast majority of domain walls studies have been focused on bias-induced dynamics and transport behaviors. Here, we introduce the scanning probe microscopy approach based on piezoresponse force microscopy (PFM) with a dynamically heated probe, combining local heating and local biasing of the material. This approach is used to explore the thermal polarization dynamics in soft Sn2P2S6 ferroelectrics, and allows for the exploration of phase transitions at individual domain walls. The strong and weak modulation regimes for the thermal PFM are introduced. The future potential applications of heated probe approach for functional SPM measurements including piezoelectric, elastic, microwave, and transport measurements are discussed. △ Less

Submitted 7 July, 2022; originally announced July 2022.

Autonomous Experiments in Scanning Probe Microscopy and Spectroscopy: Choosing Where to Explore Polarization Dynamics in Ferroelectrics

Authors: Rama K. Vasudevan, Kyle Kelley, Jacob Hinkle, Hiroshi Funakubo, Stephen Jesse, Sergei V. Kalinin, Maxim Ziatdinov

Abstract: Polarization dynamics in ferroelectric materials are explored via the automated experiment in Piezoresponse Force Spectroscopy. A Bayesian Optimization framework for imaging is developed and its performance for a variety of acquisition and pathfinding functions is explored using previously acquired data. The optimized algorithm is then deployed on an operational scanning probe microscope (SPM) for… ▽ More Polarization dynamics in ferroelectric materials are explored via the automated experiment in Piezoresponse Force Spectroscopy. A Bayesian Optimization framework for imaging is developed and its performance for a variety of acquisition and pathfinding functions is explored using previously acquired data. The optimized algorithm is then deployed on an operational scanning probe microscope (SPM) for finding areas of large electromechanical response in a thin film of PbTiO3, with metrics showing gains of ~3x in the sampling efficiency. This approach opens the pathway to perform more complex spectroscopies in SPM that were previously not possible due to time constraints and sample stability, tip wear, and/or stochastic sample damage that occurs at specific, a priori unknown spatial positions. Potential improvements to the framework to enable the incorporation of more prior information and improve efficiency further are discussed. △ Less

Submitted 22 June, 2021; v1 submitted 25 November, 2020; originally announced November 2020.

Fast Scanning Probe Microscopy via Machine Learning: Non-rectangular scans with compressed sensing and Gaussian process optimization

Authors: Kyle P. Kelley, Maxim Ziatdinov, Liam Collins, Michael A. Susner, Rama K. Vasudevan, Nina Balke, Sergei V. Kalinin, Stephen Jesse

Abstract: Fast scanning probe microscopy enabled via machine learning allows for a broad range of nanoscale, temporally resolved physics to be uncovered. However, such examples for functional imaging are few in number. Here, using piezoresponse force microscopy (PFM) as a model application, we demonstrate a factor of 5.8 improvement in imaging rate using a combination of sparse spiral scanning with compress… ▽ More Fast scanning probe microscopy enabled via machine learning allows for a broad range of nanoscale, temporally resolved physics to be uncovered. However, such examples for functional imaging are few in number. Here, using piezoresponse force microscopy (PFM) as a model application, we demonstrate a factor of 5.8 improvement in imaging rate using a combination of sparse spiral scanning with compressive sensing and Gaussian processing reconstruction. It is found that even extremely sparse scans offer strong reconstructions with less than 6 % error for Gaussian processing reconstructions. Further, we analyze the error associated with each reconstructive technique per reconstruction iteration finding the error is similar past approximately 15 iterations, while at initial iterations Gaussian processing outperforms compressive sensing. This study highlights the capabilities of reconstruction techniques when applied to sparse data, particularly sparse spiral PFM scans, with broad applications in scanning probe and electron microscopies. △ Less

Submitted 23 April, 2020; originally announced April 2020.

Reconstruction of effective potential from statistical analysis of dynamic trajectories

Authors: Ali Yousefzadi Nobakht, Ondrej Dyck, David B. Lingerfelt, Feng Bao, Maxim Ziatdinov, Artem Maksov, Bobby G. Sumpter, Richard Archibald, Stephen Jesse, Sergei V. Kalinin, Kody J. H. Law

Abstract: The broad incorporation of microscopic methods is yielding a wealth of information on atomic and mesoscale dynamics of individual atoms, molecules, and particles on surfaces and in open volumes. Analysis of such data necessitates statistical frameworks to convert observed dynamic behaviors to effective properties of materials. Here we develop a method for stochastic reconstruction of effective act… ▽ More The broad incorporation of microscopic methods is yielding a wealth of information on atomic and mesoscale dynamics of individual atoms, molecules, and particles on surfaces and in open volumes. Analysis of such data necessitates statistical frameworks to convert observed dynamic behaviors to effective properties of materials. Here we develop a method for stochastic reconstruction of effective acting potentials from observed trajectories. Using the Silicon vacancy defect in graphene as a model, we develop a statistical framework to reconstruct the free energy landscape from calculated atomic displacements. △ Less

Submitted 27 February, 2020; originally announced February 2020.

Comments: 12 pages, 5 figures. This manuscript is a part of update to previous work (arXiv:1804.03729v1) authors found some of the analysis in the previous work to be not accurate and this manuscript is a partial update to that work

Deep learning of interface structures from the 4D STEM data: cation intermixing vs. roughening

Authors: Mark P. Oxley, Junqi Yin, Nikolay Borodinov, Suhas Somnath, Maxim Ziatdinov, Andrew R. Lupini, Stephen Jesse, Rama K. Vasudevan, Sergei V. Kalinin

Abstract: Interface structures in complex oxides remain one of the active areas of condensed matter physics research, largely enabled by recent advances in scanning transmission electron microscopy (STEM). Yet the nature of the STEM contrast in which the structure is projected along the given direction precludes separation of possible structural models. Here, we utilize deep convolutional neural networks (D… ▽ More Interface structures in complex oxides remain one of the active areas of condensed matter physics research, largely enabled by recent advances in scanning transmission electron microscopy (STEM). Yet the nature of the STEM contrast in which the structure is projected along the given direction precludes separation of possible structural models. Here, we utilize deep convolutional neural networks (DCNN) trained on simulated 4D scanning transmission electron microscopy (STEM) datasets to predict structural descriptors of interfaces. We focus on the widely studied interface between LaAlO3 and SrTiO3, using dynamical diffraction theory and leveraging high performance computing to simulate thousands of possible 4D STEM datasets to train the DCNN to learn properties of the underlying structures on which the simulations are based. We validate the DCNN on simulated data and show that it is possible (with >95% accuracy) to identify a physically rough from a chemically diffuse interface and achieve 85% accuracy in determination of buried step positions within the interface. The method shown here is general and can be applied for any inverse imaging problem where forward models are present. △ Less

Submitted 20 February, 2020; originally announced February 2020.

Comments: 18 pages, 4 figures

Bayesian inference in band excitation Scanning Probe Microscopy for optimal dynamic model selection in imaging

Authors: Rama K. Vasudevan, Kyle P. Kelley, Eugene Eliseev, Stephen Jesse, Hiroshi Funakubo, Anna Morozovska, Sergei V. Kalinin

Abstract: The universal tendency in scanning probe microscopy (SPM) over the last two decades is to transition from simple 2D imaging to complex detection and spectroscopic imaging modes. The emergence of complex SPM engines brings forth the challenge of reliable data interpretation, i.e. conversion from detected signal to descriptors specific to tip-surface interactions and subsequently to materials proper… ▽ More The universal tendency in scanning probe microscopy (SPM) over the last two decades is to transition from simple 2D imaging to complex detection and spectroscopic imaging modes. The emergence of complex SPM engines brings forth the challenge of reliable data interpretation, i.e. conversion from detected signal to descriptors specific to tip-surface interactions and subsequently to materials properties. Here, we implemented a Bayesian inference approach for the analysis of the image formation mechanisms in band excitation (BE) SPM. Compared to the point estimates in classical functional fit approaches, Bayesian inference allows for the incorporation of extant knowledge of materials and probe behavior in the form of corresponding prior distribution and return the information on the material functionality in the form of readily interpretable posterior distributions. We note that in application of Bayesian methods, special care should be made for proper setting on the problem as model selection vs. establishing practical parameter equivalence. We further explore the non-linear mechanical behaviors at topological defects in a classical ferroelectric material, PbTiO3. We observe the non-trivial evolution of Duffing resonance frequency and the nonlinearity of the sample surface, suggesting the presence of the hidden elements of domain structure. These observations suggest that the spectrum of anomalous behaviors at the ferroelectric domain walls can be significantly broader than previously believed and can extend to non-conventional mechanical properties in addition to static and microwave conductance. △ Less

Submitted 19 February, 2020; originally announced February 2020.

Comments: Supplementary materials is located at the end of the manuscript

Super-resolution and signal separation in contact Kelvin probe force microscopy of electrochemically active ferroelectric materials

Authors: Maxim Ziatdinov, Dohyung Kim, Sabine Neumayer, Liam Collins, Mahshid Ahmadi, Rama K. Vasudevan, Stephen Jesse, Myung Hyun Ann, Jong H. Kim, Sergei V. Kalinin

Abstract: Imaging mechanisms in contact Kelvin Probe Force Microscopy (cKPFM) are explored via information theory-based methods. Gaussian Processes are used to achieve super-resolution in the cKPFM signal, effectively extrapolating across the spatial and parameter space. Tensor matrix factorization is applied to reduce the multidimensional signal to the tensor convolution of the scalar functions that show c… ▽ More Imaging mechanisms in contact Kelvin Probe Force Microscopy (cKPFM) are explored via information theory-based methods. Gaussian Processes are used to achieve super-resolution in the cKPFM signal, effectively extrapolating across the spatial and parameter space. Tensor matrix factorization is applied to reduce the multidimensional signal to the tensor convolution of the scalar functions that show clear trending behavior with the imaging parameters. These methods establish a workflow for the analysis of the multidimensional data sets, that can then be related to the relevant physical mechanisms. We also provide an interactive Google Colab notebook (http://bit.ly/39kMtuR) that goes through all the analysis discussed in the paper. △ Less

Submitted 9 August, 2020; v1 submitted 10 February, 2020; originally announced February 2020.

Comments: Update with accepted version

Journal ref: Journal of Applied Physics 128, 055101 (2020)

Dynamic manipulation in piezoresponse force microscopy: creating non-equilibrium phases with large electromechanical response

Authors: Kyle P. Kelley, Yao Ren, Anna N. Morozovska, Eugene A. Eliseev, Yoshitaka Ehara, Hiroshi Funakubo, Thierry Giamarchi, Nina Balke, Rama K. Vasudevan, Ye Cao, Stephen Jesse, Sergei V. Kalinin

Abstract: Domains walls and topological defects in ferroelectric materials have emerged as a powerful new paradigm for functional electronic devices including memory and logic. Similarly, wall interactions and dynamics underpin a broad range of mesoscale phenomena ranging from giant electromechanical responses to memory effects. Exploring the functionalities of individual domain walls, their interactions, a… ▽ More Domains walls and topological defects in ferroelectric materials have emerged as a powerful new paradigm for functional electronic devices including memory and logic. Similarly, wall interactions and dynamics underpin a broad range of mesoscale phenomena ranging from giant electromechanical responses to memory effects. Exploring the functionalities of individual domain walls, their interactions, and controlled modifications of the domain structures is crucial for applications and fundamental physical studies. However, the dynamic nature of these features severely limits studies of their local physics since application of local biases or pressures in piezoresponse force microscopy induce wall displacement as a primary response. Here, we introduce a fundamentally new approach for the control and modification of domain structures based on automated experimentation whereby real space image-based feedback is used to control the tip bias during ferroelectric switching, allowing for modification routes conditioned on domain states under the tip. This automated experiment approach is demonstrated for the exploration of domain wall dynamics and creation of metastable phases with large electromechanical response. △ Less

Submitted 10 January, 2020; originally announced January 2020.

Direct matter disassembly via electron beam control: Electron-beam-mediated catalytic etching of graphene by nanoparticles

Authors: Ondrej Dyck, David Lingerfelt, Songkil Kim, Stephen Jesse, Sergei V. Kalinin

Abstract: We report electron-beam activated motion of a catalytic nanoparticle along a graphene step edge and associated etching of the edge. This approach enables beam-controlled etching of matter through activated electrocatalytic processes. The applications of electron-beam control as a paradigm for molecular-scale robotics are discussed. We report electron-beam activated motion of a catalytic nanoparticle along a graphene step edge and associated etching of the edge. This approach enables beam-controlled etching of matter through activated electrocatalytic processes. The applications of electron-beam control as a paradigm for molecular-scale robotics are discussed. △ Less

Submitted 16 December, 2019; originally announced December 2019.

Piezoresponse phase as variable in electromechanical characterization

Authors: Sabine M. Neumayer, Sahar Saremi, Lane W. Martin, Liam Collins, Alexander Tselev, Stephen Jesse, Sergei V. Kalinin, Nina Balke

Abstract: Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate ferroelectrics domains. PFM gives insight into the strength of local piezoelectric coupling as well as polarization direction through PFM amplitude and phase, respectively. Converting measured arbitrary units to physical material parameters, however, remains a challenge. While much effort… ▽ More Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate ferroelectrics domains. PFM gives insight into the strength of local piezoelectric coupling as well as polarization direction through PFM amplitude and phase, respectively. Converting measured arbitrary units to physical material parameters, however, remains a challenge. While much effort has been spent on quantifying the PFM amplitude signal, little attention has been given to the PFM phase and it is often arbitrarily adjusted to fit expectations or processed as recorded. This is problematic when investigating materials with unknown or potentially negative sign of the probed effective electrostrictive coefficient or strong frequency dispersion of electromechanical responses since assumptions about the phase cannot be reliably made. The PFM phase can, however, provide important information on the polarization orientation and the sign of the electrostrictive coefficient. Most notably, the orientation of the PFM hysteresis loop is determined by the PFM phase. Moreover, when presenting PFM data as a combined signal, the resulting response can be artificially lowered or asymmetric if the phase data has not been correctly processed. Here, we demonstrate a path to identify the phase offset required to extract correct meaning from PFM phase data. We explore different sources of phase offsets including the experimental setup, instrumental contributions, and data analysis. We discuss the physical working principles of PFM and develop a strategy to extract physical meaning from the PFM phase. The proposed procedures are verified on two materials with positive and negative piezoelectric coefficients. △ Less

Submitted 6 December, 2019; originally announced December 2019.

Comments: 16 pages, 6 figures

Imaging Mechanism for Hyperspectral Scanning Probe Microscopy via Gaussian Process Modelling

Authors: Maxim Ziatdinov, Dohyung Kim, Sabine Neumayer, Rama K. Vasudevan, Liam Collins, Stephen Jesse, Mahshid Ahmadi, Sergei V. Kalinin

Abstract: We investigate the ability to reconstruct and derive spatial structure from sparsely sampled 3D piezoresponse force microcopy data, captured using the band-excitation (BE) technique, via Gaussian Process (GP) methods. Even for weakly informative priors, GP methods allow unambiguous determination of the characteristic length scales of the imaging process both in spatial and frequency domains. We fu… ▽ More We investigate the ability to reconstruct and derive spatial structure from sparsely sampled 3D piezoresponse force microcopy data, captured using the band-excitation (BE) technique, via Gaussian Process (GP) methods. Even for weakly informative priors, GP methods allow unambiguous determination of the characteristic length scales of the imaging process both in spatial and frequency domains. We further show that BE data set tends to be oversampled, with ~30% of the original data set sufficient for high-quality reconstruction, potentially enabling the faster BE imaging. Finally, we discuss how the GP can be used for automated experimentation in SPM, by combining GP regression with non-rectangular scans. The full code for GP regression applied to hyperspectral data is available at https://git.io/JePGr. △ Less

Submitted 26 November, 2019; originally announced November 2019.

Structure retrieval from 4D-STEM: statistical analysis of potential pitfalls in high-dimensional data

Authors: Xin Li, Ondrej Dyck, Stephen Jesse, Andrew R. Lupini, Sergei V. Kalinin, Mark P. Oxley

Abstract: Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most rapidly growing modes of electron microscopy imaging. The advent of fast pixelated cameras and the associated data infrastructure have greatly accelerated this process. Yet conversion of the 4D datasets into physically meaningful structure images in real-space remains an open issue. In this work, we demonstrate… ▽ More Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most rapidly growing modes of electron microscopy imaging. The advent of fast pixelated cameras and the associated data infrastructure have greatly accelerated this process. Yet conversion of the 4D datasets into physically meaningful structure images in real-space remains an open issue. In this work, we demonstrate that, it is possible to systematically create filters that will affect the apparent resolution or even qualitative features of the real-space structure image, reconstructing artificially generated patterns. As initial efforts, we explore statistical model selection algorithms, aiming for robustness and reliability of estimated filters. This statistical model selection analysis demonstrates the need for regularization and cross-validation of inversion methods to robustly recover structure from high-dimensional diffraction datasets. △ Less

Submitted 26 August, 2019; v1 submitted 1 August, 2019; originally announced August 2019.

Journal ref: Phys. Rev. E 100, 023308, 2019

USID and Pycroscopy -- Open frameworks for storing and analyzing spectroscopic and imaging data

Authors: Suhas Somnath, Chris R. Smith, Nouamane Laanait, Rama K. Vasudevan, Anton Ievlev, Alex Belianinov, Andrew R. Lupini, Mallikarjun Shankar, Sergei V. Kalinin, Stephen Jesse

Abstract: Materials science is undergoing profound changes due to advances in characterization instrumentation that have resulted in an explosion of data in terms of volume, velocity, variety and complexity. Harnessing these data for scientific research requires an evolution of the associated computing and data infrastructure, bridging scientific instrumentation with super- and cloud- computing. Here, we de… ▽ More Materials science is undergoing profound changes due to advances in characterization instrumentation that have resulted in an explosion of data in terms of volume, velocity, variety and complexity. Harnessing these data for scientific research requires an evolution of the associated computing and data infrastructure, bridging scientific instrumentation with super- and cloud- computing. Here, we describe Universal Spectroscopy and Imaging Data (USID), a data model capable of representing data from most common instruments, modalities, dimensionalities, and sizes. We pair this schema with the hierarchical data file format (HDF5) to maximize compatibility, exchangeability, traceability, and reproducibility. We discuss a family of community-driven, open-source, and free python software packages for storing, processing and visualizing data. The first is pyUSID which provides the tools to read and write USID HDF5 files in addition to a scalable framework for parallelizing data analysis. The second is Pycroscopy, which provides algorithms for scientific analysis of nanoscale imaging and spectroscopy modalities and is built on top of pyUSID and USID. The instrument-agnostic nature of USID facilitates the development of analysis code independent of instrumentation and task in Pycroscopy which in turn can bring scientific communities together and break down barriers in the age of open-science. The interested reader is encouraged to be a part of this ongoing community-driven effort to collectively accelerate materials research and discovery through the realms of big data. △ Less

Submitted 27 March, 2019; v1 submitted 22 March, 2019; originally announced March 2019.

Manifold Learning of Four-dimensional Scanning Transmission Electron Microscopy

Authors: Xin Li, Ondrej E. Dyck, Mark P. Oxley, Andrew R. Lupini, Leland McInnes, John Healy, Stephen Jesse, Sergei V. Kalinin

Abstract: Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient processing and interpretation of large volumes of data remain challenging, especially for two-dimensional or light materials because the diffraction signal recor… ▽ More Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient processing and interpretation of large volumes of data remain challenging, especially for two-dimensional or light materials because the diffraction signal recorded on the pixelated arrays is weak. Here we employ data-driven manifold leaning approaches for straightforward visualization and exploration analysis of the 4D-STEM datasets, distilling real-space neighboring effects on atomically resolved deflection patterns from single-layer graphene, with single dopant atoms, as recorded on a pixelated detector. These extracted patterns relate to both individual atom sites and sublattice structures, effectively discriminating single dopant anomalies via multi-mode views. We believe manifold learning analysis will accelerate physics discoveries coupled between data-rich imaging mechanisms and materials such as ferroelectric, topological spin and van der Waals heterostructures. △ Less

Submitted 13 January, 2019; v1 submitted 18 October, 2018; originally announced November 2018.

Journal ref: npj Computational Materials volume 5, Article number: 5 (2019)

Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) on Non-Rectangular Scans

Authors: Xin Li, Ondrej Dyck, Sergei V. Kalinin, Stephen Jesse

Abstract: Scanning Transmission Electron Microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to map** order parameter fields. In the last several years, attention was attracted by potential of STEM to explore beam induced chemical processes and especially manipulating atomic motion, enabli… ▽ More Scanning Transmission Electron Microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to map** order parameter fields. In the last several years, attention was attracted by potential of STEM to explore beam induced chemical processes and especially manipulating atomic motion, enabling atom-by-atom fabrication. These applications, as well as traditional imaging of beam sensitive materials, necessitate increasing dynamic range of STEM between imaging and manipulation modes, and increasing absolute scanning/imaging speeds, that can be achieved by combining sparse sensing methods with non-rectangular scanning trajectories. Here we developed a general method for real-time reconstruction of sparsely sampled images from high-speed, non-invasive and diverse scanning pathways. This approach is demonstrated on both the synthetic data where ground truth is known and the experimental STEM data. This work lays the foundation for future tasks such as optimal design of dose efficient scanning strategies and real-time adaptive inference and control of e-beam induced atomic fabrication. △ Less

Submitted 22 October, 2018; v1 submitted 13 May, 2018; originally announced May 2018.

Comments: Accepted by Microscopy and Microanalysis as a full article. GPU implementation available at https://github.com/nonmin/RTSSTEM

Journal ref: Microsc Microanal 24(6),(2018)

Map** fast evolution of transient surface photovoltage dynamics using G-Mode Kelvin probe force microscopy

Authors: Liam Collins, Mahshid Ahmadi, Jiajun Qin, Olga S. Ovchinnikova, Bin Hu, Stephen Jesse, Sergei V. Kalinin

Abstract: Optoelectronic phenomena in materials such as organic/inorganic hybrid perovskites depend on a complex interplay between light induced carrier generation and fast (electronic) and slower (ionic) processes, all of which are known to be strongly affected by structural inhomogeneities such as interfaces and grain boundaries. Here, we develop a time resolved Kelvin probe force microscopy (KPFM) approa… ▽ More Optoelectronic phenomena in materials such as organic/inorganic hybrid perovskites depend on a complex interplay between light induced carrier generation and fast (electronic) and slower (ionic) processes, all of which are known to be strongly affected by structural inhomogeneities such as interfaces and grain boundaries. Here, we develop a time resolved Kelvin probe force microscopy (KPFM) approach, based on the G-Mode SPM platform, allowing quantification of surface photovoltage (SPV) with microsecond temporal and nanoscale spatial resolution. We demonstrate the approach on methylammonium lead bromide (MAPbBr3) thin films and further highlight the usefulness of unsupervised clustering methods to quickly discern spatial variability in the information rich SPV dataset. Using this technique, we observe concurrent spatial and ultra-fast temporal variations in the SPV generated across the thin film, indicating that structure is likely responsible for the heterogenous behavior. △ Less

Submitted 16 February, 2018; originally announced February 2018.