Shack-Hartmann wavefront sensing: A new approach to time-resolved measurement of stress intensity during dynamic fracture of small brittle specimens
Authors:
Liuchi Li,
Velat Kilic,
Milad Alemohammad,
K. T. Ramesh,
Mark A. Foster,
Todd C. Hufnagel
Abstract:
The stress intensity factor is important for understanding crack initiation and propagation. Because it cannot be measured directly, the characterization of the stress intensity factor relies on the measurement of deformation around a crack tip. Such measurements are challenging for dynamic fracture of brittle materials where the deformation is small and the crack tip velocity can be high (>1 km/s…
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The stress intensity factor is important for understanding crack initiation and propagation. Because it cannot be measured directly, the characterization of the stress intensity factor relies on the measurement of deformation around a crack tip. Such measurements are challenging for dynamic fracture of brittle materials where the deformation is small and the crack tip velocity can be high (>1 km/s). Digital gradient sensing (DGS) is capable of full-field measurement of surface deformation with sub-microsecond temporal resolution, but it is limited to centimeter-scale specimens and has a spatial resolution of only $\sim 1$mm. This limits its ability to measure deformations close to the crack tip. Here, we demonstrate the potential of Shack-Hartmann wavefront sensing (SHWFS), as an alternative to DGS, for measuring surface deformation during dynamic brittle fracture of millimeter-scale specimens. Using an commercial glass ceramic as an example material, we demonstrate the capability of SHWFS to measure the surface slope evolution induced by a propagating crack on millimeter-scale specimens with a micrometer-scale spatial resolution and a sub-microsecond temporal resolution. The SHWFS apparatus has the additional advantage of being physically more compact than a typical DGS apparatus. We verify our SHWFS measurements by comparing them with analytical predictions and phase-field simulations of the surface slope around a crack tip. Then, fitting the surface slope measurements to the asymptotic crack-tip field solution, we extract the evolution of the apparent stress intensity factor associated with the propagating crack tip. We conclude by discussing potential future enhancements of this technique and how its compactness could enable the integration with other characterization techniques including x-ray phase-contrast imaging (XPCI) toward a multi-modal characterization.
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Submitted 1 October, 2023;
originally announced October 2023.
Ultrafast Radiographic Imaging and Tracking: An overview of instruments, methods, data, and applications
Authors:
Zhehui Wang,
Andrew F. T. Leong,
Angelo Dragone,
Arianna E. Gleason,
Rafael Ballabriga,
Christopher Campbell,
Michael Campbell,
Samuel J. Clark,
Cinzia Da Vià,
Dana M. Dattelbaum,
Marcel Demarteau,
Lorenzo Fabris,
Kamel Fezzaa,
Eric R. Fossum,
Sol M. Gruner,
Todd Hufnagel,
Xiaolu Ju,
Ke Li,
Xavier Llopart,
Bratislav Lukić,
Alexander Rack,
Joseph Strehlow,
Audrey C. Therrien,
Julia Thom-Levy,
Feixiang Wang
, et al. (3 additional authors not shown)
Abstract:
Ultrafast radiographic imaging and tracking (U-RadIT) use state-of-the-art ionizing particle and light sources to experimentally study sub-nanosecond dynamic processes in physics, chemistry, biology, geology, materials science and other fields. These processes, fundamental to nuclear fusion energy, advanced manufacturing, green transportation and others, often involve one mole or more atoms, and t…
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Ultrafast radiographic imaging and tracking (U-RadIT) use state-of-the-art ionizing particle and light sources to experimentally study sub-nanosecond dynamic processes in physics, chemistry, biology, geology, materials science and other fields. These processes, fundamental to nuclear fusion energy, advanced manufacturing, green transportation and others, often involve one mole or more atoms, and thus are challenging to compute by using the first principles of quantum physics or other forward models. One of the central problems in U-RadIT is to optimize information yield through, e.g. high-luminosity X-ray and particle sources, efficient imaging and tracking detectors, novel methods to collect data, and large-bandwidth online and offline data processing, regulated by the underlying physics, statistics, and computing power. We review and highlight recent progress in: a.) Detectors; b.) U-RadIT modalities; c.) Data and algorithms; and d.) Applications. Hardware-centric approaches to U-RadIT optimization are constrained by detector material properties, low signal-to-noise ratio, high cost and long development cycles of critical hardware components such as ASICs. Interpretation of experimental data, including comparisons with forward models, is frequently hindered by sparse measurements, model and measurement uncertainties, and noise. Alternatively, U-RadIT make increasing use of data science and machine learning algorithms, including experimental implementations of compressed sensing. Machine learning and artificial intelligence approaches, refined by physics and materials information, may also contribute significantly to data interpretation, uncertainty quantification, and U-RadIT optimization.
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Submitted 4 September, 2023; v1 submitted 21 August, 2023;
originally announced August 2023.
Bulk Metallic Glasses Deform via Slip Avalanches
Authors:
James Antonaglia,
Wendelin J. Wright,
Xiaojun Gu,
Rachel R. Byer,
Todd C. Hufnagel,
Michael LeBlanc,
Jonathan T. Uhl,
Karin A. Dahmen
Abstract:
Inelastic deformation of metallic glasses occurs via slip events with avalanche dynamics similar to those of earthquakes. For the first time in these materials, measurements have been obtained with sufficiently high temporal resolution to extract both the exponents and the scaling functions that describe the nature, statistics and dynamics of the slips according to a simple mean-field model. These…
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Inelastic deformation of metallic glasses occurs via slip events with avalanche dynamics similar to those of earthquakes. For the first time in these materials, measurements have been obtained with sufficiently high temporal resolution to extract both the exponents and the scaling functions that describe the nature, statistics and dynamics of the slips according to a simple mean-field model. These slips originate from localized deformation in shear bands. The mean-field model describes the slip process as an avalanche of rearrangements of atoms in shear transformation zones (STZs). Small slips show the predicted power-law scaling and correspond to limited propagation of a shear front, while large slips are associated with uniform shear on unconstrained shear bands. The agreement between the model and data across multiple independent measures of slip statistics and dynamics provides compelling evidence for slip avalanches of STZs as the elementary mechanism of inhomogeneous deformation in metallic glasses.
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Submitted 20 December, 2013;
originally announced December 2013.
