Li4-xGe1-xPxO4 a potential solid-state electrolyte for all-oxide microbatteries
Authors:
E. Gilardi,
G. Materzanini,
L. Kahle,
M. Doebeli,
S. Lacey,
X. Cheng,
N. Marzari,
D. Pergolesi,
A. Hintennach,
T. Lippert
Abstract:
Solid-state electrolytes for Li-ion batteries are attracting growing interest as they allow building safer batteries, also using lithium metal anodes. Here we studied a compound in the lithium superionic conductor (LISICON) family, i.e. Li4-xGe1-xPxO4 (LGPO). Thin films were deposited via pulsed laser deposition and their electrical properties were compared with ceramic pellets. A detailed charact…
▽ More
Solid-state electrolytes for Li-ion batteries are attracting growing interest as they allow building safer batteries, also using lithium metal anodes. Here we studied a compound in the lithium superionic conductor (LISICON) family, i.e. Li4-xGe1-xPxO4 (LGPO). Thin films were deposited via pulsed laser deposition and their electrical properties were compared with ceramic pellets. A detailed characterization of the micro structure shows that thin films can be deposited fully crystalline at higher temperatures but also partially amorphous at room temperature. The conductivity is not strongly influenced by the presence of grain boundaries, exposure to air or lithium deficiencies. First-principles molecular dynamics simulations were employed to calculate the lithium ion diffusion profile and the conductivity at various temperatures of the ideal LGPO crystal. Simulations gives the upper limit of conductivity for a defect free crystal, which is in the range of 10-2 S cm-1 at 300 deg. The ease of thin film fabrication, the room-temperature Li-ion conductivity in the range of a few microS cm-1 make LGPO a very appealing electrolyte material for thin film all-solid-state all-oxide microbatteries.
△ Less
Submitted 6 October, 2020;
originally announced October 2020.
Real-time monitoring of stress evolution during thin film growth by in situ substrate curvature measurement
Authors:
Elisa Gilardi,
Aline Fluri,
Thomas Lippert,
Daniele Pergolesi
Abstract:
Strain engineering is the art of inducing controlled lattice distortions in a material to modify specific physicochemical properties. Strain engineering is applied for basic fundamental studies of physics and chemistry of solids but also for device fabrication through the development of materials with new functionalities. Thin films are one of the most important tools for strain engineering. Thin…
▽ More
Strain engineering is the art of inducing controlled lattice distortions in a material to modify specific physicochemical properties. Strain engineering is applied for basic fundamental studies of physics and chemistry of solids but also for device fabrication through the development of materials with new functionalities. Thin films are one of the most important tools for strain engineering. Thin films can in fact develop large strain due to the crystalline constrains at the interface with the substrate and/or as the result of specific morphological features that can be selected by an appropriate tuning of the deposition parameters. Within this context, the in situ measurement of the substrate curvature is a powerful diagnostic tool allowing a real time monitoring of the stress state of the growing film. This manuscript reviews a few recent applications of this technique and presents new measurements that point out the great potentials of the substrate curvature measurement in strain engineering. Our study also shows how, due to the high sensitivity of the technique, the correct interpretation of the results can be in certain cases not trivial and require complementary characterizations and an accurate knowledge of the physicochemical properties of the materials under investigation.
△ Less
Submitted 13 May, 2019;
originally announced May 2019.
