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Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements
Authors:
Marcel Schloz,
Thomas C. Pekin,
Hamish G. Brown,
Dana O. Byrne,
Bryan D. Esser,
Emmanuel Terzoudis-Lumsden,
Takashi Taniguchi,
Kenji Watanabe,
Scott D. Findlay,
Benedikt Haas,
Jim Ciston,
Christoph T. Koch
Abstract:
A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychogr…
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A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychography, regularized ptychography, and multi-mode ptychography. Additionally, we contrast multi-focus ptychography with an alternative method that uses virtual optical sectioning through a reconstructed scattering matrix ($\mathcal{S}$-matrix), which offers more precise 3D structure information compared to conventional ptychography. Our findings from multiple 3D reconstructions based on simulated and experimental data demonstrate that multi-focus ptychography surpasses other techniques, particularly in accurately reconstructing the surfaces and interface regions of thick specimens.
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Submitted 3 June, 2024;
originally announced June 2024.
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Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone
Authors:
Philipp M Pelz,
Hamish G Brown,
Jim Ciston,
Scott D Findlay,
Yaqian Zhang,
Mary Scott,
Colin Ophus
Abstract:
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront sha** optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a…
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Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront sha** optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a non-crystalline medium from scanning diffraction measurements, and recover the illumination aberrations. Our method will enable 3D imaging and materials characterization at high resolution for a wide range of materials.
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Submitted 28 August, 2020;
originally announced August 2020.
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Probing the limits of the rigid-intensity-shift model in differential phase contrast scanning transmission electron microscopy
Authors:
L. Clark,
H. G. Brown,
D. M. Paganin,
M. J. Morgan,
T. Matsumoto,
N. Shibata,
T. C. Petersen,
S. D. Findlay
Abstract:
The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift rigidly by an amount proportional to that phase gradient. This behaviour is seldom realised exactly in practice. Through a combination of experimental results,…
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The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift rigidly by an amount proportional to that phase gradient. This behaviour is seldom realised exactly in practice. Through a combination of experimental results, analytical modelling and numerical calculations, we explore the breakdown of the rigid-intensity-shift behaviour and how this depends on the magnitude of the phase gradient and the relative scale of features in the phase profile and the probe size. We present guidelines as to when the rigid-intensity-shift model can be applied for quantitative phase reconstruction using segmented detectors, and propose probe-sha** strategies to further improve the accuracy.
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Submitted 18 January, 2018;
originally announced January 2018.
