CyRSoXS: A GPU-accelerated virtual instrument for Polarized Resonant Soft X-ray Scattering (P-RSoXS)
Authors:
Kumar Saurabh,
Peter J. Dudenas,
Eliot Gann,
Veronica G. Reynolds,
Subhrangsu Mukherjee,
Daniel Sunday,
Tyler B. Martin,
Peter A. Beaucage,
Michael L. Chabinyc,
Dean M. DeLongchamp,
Adarsh Krishnamurthy,
Baskar Ganapathysubramanian
Abstract:
Polarized Resonant Soft X-ray scattering (P-RSoXS) has emerged as a powerful synchrotron-based tool that combines principles of X-ray scattering and X-ray spectroscopy. P-RSoXS provides unique sensitivity to molecular orientation and chemical heterogeneity in soft materials such as polymers and biomaterials. Quantitative extraction of orientation information from P-RSoXS pattern data is challengin…
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Polarized Resonant Soft X-ray scattering (P-RSoXS) has emerged as a powerful synchrotron-based tool that combines principles of X-ray scattering and X-ray spectroscopy. P-RSoXS provides unique sensitivity to molecular orientation and chemical heterogeneity in soft materials such as polymers and biomaterials. Quantitative extraction of orientation information from P-RSoXS pattern data is challenging because the scattering processes originate from sample properties that must be represented as energy-dependent three-dimensional tensors with heterogeneities at nanometer to sub-nanometer length scales. We overcome this challenge by develo** an open-source virtual instrument that uses GPUs to simulate P-RSoXS patterns from real-space material representations with nanoscale resolution. Our computational framework CyRSoXS (https://github.com/usnistgov/cyrsoxs) is designed to maximize GPU performance. We demonstrate the accuracy and robustness of our approach by validating against an extensive set of test cases, which include both analytical solutions and numerical comparisons, demonstrating a speedup of over three orders relative to the current state-of-the-art simulation software. Such fast simulations open up a variety of applications that were previously computationally infeasible, including (a) pattern fitting, (b) co-simulation with the physical instrument for operando analytics, data exploration, and decision support, (c) data creation and integration into machine learning workflows, and (d) utilization in multi-modal data assimilation approaches. Finally, we abstract away the complexity of the computational framework from the end-user by exposing CyRSoXS to Python using Pybind. This eliminates I/O requirements for large-scale parameter exploration and inverse design, and democratizes usage by enabling seamless integration with a Python ecosystem (https://github.com/usnistgov/nrss).
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Submitted 26 September, 2022;
originally announced September 2022.
Electric Field Intensity Modulated Scattering as a Thin-Film Depth Probe
Authors:
Peter J. Dudenas,
Adam Z. Weber,
Ahmet Kusoglu
Abstract:
Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films that possess stratification of scatterers vertically within a sample, it can be difficult to determine where those scatterers are positioned. We present an in-situ…
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Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films that possess stratification of scatterers vertically within a sample, it can be difficult to determine where those scatterers are positioned. We present an in-situ method to extract film thickness, the index of refraction, and depth information using scattering images taken across a range of incident angles. The underlying theory is presented, and we validate the technique using two sets of polymer thin films. Finally, we discuss how it can be implemented as a general beamline procedure. This technique is applicable to any thin-film material and has potentially far-reaching impact by enabling depth-sensitive information in situ at any grazing incidence-capable beamline.
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Submitted 20 December, 2019; v1 submitted 29 July, 2019;
originally announced July 2019.
