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Dielectronic satellite emission from a solid-density Mg plasma: relationship to models of ionisation potential depression
Authors:
G. Pérez-Callejo,
T. Gawne,
T. R. Preston,
P. Hollebon,
O. S. Humphries,
H. -K. Chung,
G. L. Dakovski,
J. Krzywinski,
M. P. Minitti,
T. Burian,
J. Chalupský,
V. Hájková,
L. Juha,
V. Vozda,
U. Zastrau,
S. M. Vinko,
S. J. Rose,
J. S. Wark
Abstract:
We report on experiments where solid-density Mg plasmas are created by heating with the focused output of the Linac Coherent Light Source x-ray free-electron-laser. We study the K-shell emission from the Helium and Lithium-like ions using Bragg crystal spectroscopy. Observation of the dielectronic satellites in Lithium-like ions confirms that the M-shell electrons appear bound for these high charg…
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We report on experiments where solid-density Mg plasmas are created by heating with the focused output of the Linac Coherent Light Source x-ray free-electron-laser. We study the K-shell emission from the Helium and Lithium-like ions using Bragg crystal spectroscopy. Observation of the dielectronic satellites in Lithium-like ions confirms that the M-shell electrons appear bound for these high charge states. An analysis of the intensity of these satellites indicates that when modelled with an atomic-kinetics code, the ionisation potential depression model employed needs to produce depressions for these ions which lie between those predicted by the well known Stewart-Pyatt and Ecker-Kroll models. These results are largely consistent with recent Density Functional Theory calculations.
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Submitted 4 March, 2024; v1 submitted 5 October, 2023;
originally announced October 2023.
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Balanced Detection in Femtosecond X-ray Absorption Spectroscopy to Reach the Ultimate Sensitivity Limit
Authors:
W. F. Schlotter,
M. Beye,
S. Zohar,
G. Coslovich,
G. L. Dakovski,
M. -F. Lin,
Y. Liu,
A. Reid,
S. Stubbs,
P. Walter,
K. Nakahara,
P. Hart,
P. S. Miedema,
L. LeGuyader,
K. Hofhuis,
Phu Tran Phong Le,
Johan E. ten Elshof,
H. Hilgenkamp,
G. Koster,
X. H. Verbeek,
S. Smit,
M. S. Golden,
H. A. Durr,
A. Sakdinawat
Abstract:
X-ray absorption spectroscopy (XAS) is a powerful and well established technique with sensitivity to elemental and chemical composition. Despite these advantages, its implementation has not kept pace with the development of ultrafast pulsed x-ray sources where XAS can capture femtosecond chemical processes. X-ray Free Electron Lasers (XFELs) deliver femtosecond, narrow bandwidth (…
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X-ray absorption spectroscopy (XAS) is a powerful and well established technique with sensitivity to elemental and chemical composition. Despite these advantages, its implementation has not kept pace with the development of ultrafast pulsed x-ray sources where XAS can capture femtosecond chemical processes. X-ray Free Electron Lasers (XFELs) deliver femtosecond, narrow bandwidth ($\frac{ΔE}{E} < 0.5\%$) pulses containing $\sim 10^{10}$ photons. However, the energy contained in each pulse fluctuates thus complicating pulse by pulse efforts to quantify the number of photons. Improvements in counting the photons in each pulse have defined the state of the art for XAS sensitivity. Here we demonstrate a final step in these improvements through a balanced detection method that approaches the photon counting shot noise limit. In doing so, we obtain high quality absorption spectra from the insulator-metal transition in VO$_2$ and unlock a method to explore dilute systems, subtle processes and nonlinear phenomena with ultrafast x-rays. The method is especially beneficial for x-ray light sources where integration and averaging are not viable options to improve sensitivity.
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Submitted 24 June, 2020;
originally announced June 2020.
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Using photoelectron spectroscopy to measure resonant inelastic X-ray scattering: A computational investigation
Authors:
Daniel J. Higley,
Hirohito Ogasawara,
Sioan Zohar,
Georgi L. Dakovski
Abstract:
Resonant inelastic X-ray scattering (RIXS) has become an important scientific tool. Nonetheless, conventional high-resolution RIXS measurements (<100 meV), especially in the soft x-ray range, require large and low-throughput grating spectrometers that limits measurement accuracy and simplicity. Here, we computationally investigate the performance of a different method for measuring RIXS, Photoelec…
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Resonant inelastic X-ray scattering (RIXS) has become an important scientific tool. Nonetheless, conventional high-resolution RIXS measurements (<100 meV), especially in the soft x-ray range, require large and low-throughput grating spectrometers that limits measurement accuracy and simplicity. Here, we computationally investigate the performance of a different method for measuring RIXS, Photoelectron Spectrometry for Analysis of X-rays (PAX). This method transforms the X-ray measurement problem of RIXS to an electron measurement problem, enabling use of compact, high-throughput electron spectrometers. In PAX, X-rays to be measured are incident on a converter material and the energy distribution of the resultant photoelectrons, the PAX spectrum, is measured with an electron spectrometer. The incident X-ray spectrum is then estimated through a deconvolution algorithm that leverages concepts from machine learning. We investigate a few example PAX cases. Using the 3d levels of Ag as a converter material, and with 10$^5$ detected electrons, we accurately estimate features with 100s of meV width in a model RIXS spectrum. Using a sharp Fermi edge to encode RIXS spectra, we accurately distinguish 100 meV FWHM peaks separated by 45 meV with 10$^7$ electrons detected that were photoemitted from within 0.4 eV of the Fermi level.
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Submitted 18 June, 2020;
originally announced June 2020.
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LCLS in - photon out: fluorescence measurement of neon using soft x-rays
Authors:
Razib Obaid,
Christian Buth,
Georgi L. Dakovski,
Randolf Beerwerth,
Michael Holmes,
Jeff Aldrich,
Ming-Fu Lin,
Michael Minitti,
Timur Osipov,
William Schlotter,
Lorenz S. Cederbaum,
Stephan Fritzsche,
Nora Berrah
Abstract:
We measured the fluorescence photon yield of neon upon soft x-ray ionization (~1200 eV) from the x-ray free electron laser at Linac Coherent Light Source, and demonstrated the usage of a grazing incidence spectrometer with a variable linespacing grating to perform x-ray fluorescence spectroscopy on a gas phase system. Our measurements also allowed us to estimate the focal size of the beam from the…
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We measured the fluorescence photon yield of neon upon soft x-ray ionization (~1200 eV) from the x-ray free electron laser at Linac Coherent Light Source, and demonstrated the usage of a grazing incidence spectrometer with a variable linespacing grating to perform x-ray fluorescence spectroscopy on a gas phase system. Our measurements also allowed us to estimate the focal size of the beam from the theoretical description developed, in terms of the rate equation approximation accounting for photoionization shake-off of neutral neon and double Auger decay of single core holes.
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Submitted 3 August, 2017;
originally announced August 2017.
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Optimal pulse processing, pile-up decomposition and applications of silicon drift detectors at LCLS
Authors:
G. Blaj,
C. J. Kenney,
A. Dragone,
G. Carini,
S. Herrmann,
P. Hart,
A. Tomada,
J. Koglin,
G. Haller,
S. Boutet,
M. Messerschmidt,
G. Williams,
M. Chollet,
G. Dakovski,
S. Nelson,
J. Pines,
S. Song,
J. Thayer
Abstract:
Silicon drift detectors (SDDs) revolutionized spectroscopy in fields as diverse as geology and dentistry. For a subset of experiments at ultra-fast, x-ray free-electron lasers (FELs), SDDs can make substantial contributions. Often the unknown spectrum is interesting, carrying science data, or the background measurement is useful to identify unexpected signals. Many measurements involve only severa…
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Silicon drift detectors (SDDs) revolutionized spectroscopy in fields as diverse as geology and dentistry. For a subset of experiments at ultra-fast, x-ray free-electron lasers (FELs), SDDs can make substantial contributions. Often the unknown spectrum is interesting, carrying science data, or the background measurement is useful to identify unexpected signals. Many measurements involve only several discrete photon energies known a priori, allowing single event decomposition of pile-up and spectroscopic photon counting. We designed a pulse function and demonstrated that the signal amplitude and rise time are obtained for each pulse by fitting, thus removing the need for pulse sha**. By avoiding pulse sha**, rise times of tens of nanoseconds resulted in reduced pulse pile-up and allowed decomposition of remaining pulse pile-up at photon separation times down to hundreds of nanoseconds while yielding time-of-arrival information with precision of 10 nanoseconds. Waveform fitting yields simultaneously high energy resolution and high counting rates (2 orders of magnitude higher than current digital pulse processors). We showed that pile-up spectrum fitting is relatively simple and preferable to pile-up spectrum deconvolution. We developed a photon pile-up statistical model for constant intensity sources, extended it to variable intensity sources (typical for FELs) and used it to fit a complex pile-up spectrum. We subsequently developed a Bayesian pile-up decomposition method that allows decomposing pile-up of single events with up to 6 photons from 6 monochromatic lines with 99% accuracy. The usefulness of SDDs will continue into the x-ray FEL era of science. Their successors, the ePixS hybrid pixel detectors, already offer hundreds of pixels, each with similar performance to an SDD, in a compact, robust and affordable package
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Submitted 19 March, 2019; v1 submitted 5 June, 2017;
originally announced June 2017.
