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Variable-wavelength quick scanning nano-focused X-ray microscopy for in situ strain and tilt map**
Authors:
Marie-ingrid Richard,
Thomas W Cornelius,
Florian Lauraux,
Jean-Baptiste Molin,
Christoph Kirchlechner,
Steven J Leake,
Jérôme Carnis,
Tobias U Schülli,
Ludovic Thilly,
Olivier Thomas
Abstract:
Compression of micro-pillars is followed in situ by a quick nano-focused X-ray scanning microscopy technique combined with three-dimensional reciprocal space map**. Compared to other attempts using 2 X-ray nanobeams, it avoids any motion or vibration that would lead to a destruction of the sample. The technique consists of scanning both the energy of the incident nano-focused X-ray beam and the…
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Compression of micro-pillars is followed in situ by a quick nano-focused X-ray scanning microscopy technique combined with three-dimensional reciprocal space map**. Compared to other attempts using 2 X-ray nanobeams, it avoids any motion or vibration that would lead to a destruction of the sample. The technique consists of scanning both the energy of the incident nano-focused X-ray beam and the in-plane translations of the focusing optics along the X-ray beam. Here, we demonstrate the approach by imaging the strain and lattice orientation of Si micro-pillars and their pedestals during in situ compression. Varying the energy of the incident beam instead of rocking the sample and map** the focusing optics instead of moving the sample supplies a vibration-free measurement of the reciprocal space maps without removal of the mechanical load. The maps of strain and lattice orientation are in good agreement with the ones recorded by ordinary rocking-curve scans. Variable-wavelength quick scanning X-ray microscopy opens the route for in situ strain and tilt map** towards more diverse and complex materials environments, especially where sample manipulation is difficult.
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Submitted 27 June, 2022;
originally announced June 2022.
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Precise wavefront characterization of X-ray optical elements using a laboratory source
Authors:
J. L. Dresselhaus,
H. Fleckenstein,
M. Domaracky,
M. Prasciolu,
N. Ivanov,
J. Carnis,
K. T. Murray,
A. J. Morgan,
H. N. Chapman,
S. Bajt
Abstract:
Improvements in X-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be used to improve the fabrication of optical elements or to design phase correctors to compensate for these errors. Nowadays, the characterization of such optics is made using intense X-ray sources such as synchrotrons. However, the limited acces…
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Improvements in X-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be used to improve the fabrication of optical elements or to design phase correctors to compensate for these errors. Nowadays, the characterization of such optics is made using intense X-ray sources such as synchrotrons. However, the limited access to these facilities can substantially slow down the development process. Improvements in the brightness of lab-based X-ray micro-sources in combination with the development of new metrology methods, and in particular ptychographic X-ray speckle tracking, enable characterization of X-ray optics in the lab with a precision and sensitivity not possible before. Here, we present a laboratory set-up that utilizes a commercially available X-ray source and can be used to characterize different types of X-ray optics. The set-up is used in our laboratory on a routine basis to characterize multilayer Laue lenses of high numerical aperture and other optical elements. This typically includes measurements of the wavefront distortions, optimum operating photon energy and focal length of the lens. To check the sensitivity and accuracy of this laboratory set-up we compared the results to those obtained at the synchrotron and saw no significant difference. To illustrate the feedback of measurements on performance, we demonstrated the correction of the phase errors of a particular multilayer Laue lens using a 3D printed compound refractive phase plate.
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Submitted 27 March, 2022;
originally announced March 2022.
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Statistical analysis of hard X-ray radiation at PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
Authors:
Young Yong Kim,
Ruslan Khubbutdinov,
Jerome Carnis,
Sangsoo Kim,
Daewoong Nam,
Inhyuk Nam,
Gyu** Kim,
Chi Hyun Shim,
Haeryong Yang,
Myunghoon Cho,
Chang-Ki Min,
Changbum Kim,
Heung-Sik Kang,
Ivan Vartanyants
Abstract:
Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at NCI beamline at 10 keV photon energy in various operation conditions: Self-Amplified Spontaneous Emission (SASE), SASE with a monochromator, and self-seeding reg…
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Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at NCI beamline at 10 keV photon energy in various operation conditions: Self-Amplified Spontaneous Emission (SASE), SASE with a monochromator, and self-seeding regimes at 120 pC, 180 pC, and 200 pC electron bunch charge, respectively. Statistical analysis showed short average pulse duration from 6 fs to 9 fs depending on operation conditions. A high spatial degree of coherence of about 70-80% was determined in spatial domain for the SASE beams with the monochromator and self-seeding regime of operation. The obtained values describe the statistical properties of the beams generated at PAL-XFEL facility.
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Submitted 25 March, 2022;
originally announced March 2022.
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High spatial coherence and short pulse duration revealed by the Hanbury Brown and Twiss interferometry at the European XFEL
Authors:
Ruslan Khubbutdinov,
Natalia Gerasimova,
Giuseppe Mercurio,
Dameli Assalauova,
Jerome Carnis,
Luca Gelisio,
Loïc le Guyader,
Alexandr Ignatenko,
Young Yong Kim,
Benjamin van Kuiken,
Ruslan P. Kurta,
Dmitry Lapkin,
Martin Teichmann,
Alexander Yaroslavtsev,
Oleg Gorobtsov,
Aleksey P. Menushenkov,
Matthias Scholz,
Andreas Scherz,
Ivan A. Vartanyants
Abstract:
Second-order intensity interferometry was employed to study the spatial and temporal properties of the European X-ray Free-Electron Laser (EuXFEL). Measurements were performed at the soft X-ray SASE3 undulator beamline at a photon energy of 1.2 keV in the Self-Amplified Spontaneous Emission (SASE) mode. Two high-power regimes of the SASE3 undulator settings, i.e. linear and quadratic tapering at s…
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Second-order intensity interferometry was employed to study the spatial and temporal properties of the European X-ray Free-Electron Laser (EuXFEL). Measurements were performed at the soft X-ray SASE3 undulator beamline at a photon energy of 1.2 keV in the Self-Amplified Spontaneous Emission (SASE) mode. Two high-power regimes of the SASE3 undulator settings, i.e. linear and quadratic tapering at saturation, were studied in detail and compared with the linear gain regime. The statistical analysis showed an exceptionally high degree of spatial coherence up to 90% for the linear undulator tapering. Analysis of the measured data in spectral and spatial domains provided an average pulse duration of about 10 fs in our measurements. The obtained results will be valuable for the experiments requiring and exploiting short pulse duration and utilizing high coherence properties of the EuXFEL.
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Submitted 22 April, 2021;
originally announced April 2021.
