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Classification of diffraction patterns using a convolutional neural network in single particle imaging experiments performed at X-ray free-electron lasers
Authors:
Dameli Assalauova,
Alexandr Ignatenko,
Fabian Isensee,
Sergey Bobkov,
Darya Trofimova,
Ivan A. Vartanyants
Abstract:
Single particle imaging (SPI) at X-ray free electron lasers (XFELs) is particularly well suited to determine the 3D structure of particles in their native environment. For a successful reconstruction, diffraction patterns originating from a single hit must be isolated from a large number of acquired patterns. We propose to formulate this task as an image classification problem and solve it using c…
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Single particle imaging (SPI) at X-ray free electron lasers (XFELs) is particularly well suited to determine the 3D structure of particles in their native environment. For a successful reconstruction, diffraction patterns originating from a single hit must be isolated from a large number of acquired patterns. We propose to formulate this task as an image classification problem and solve it using convolutional neural network (CNN) architectures. Two CNN configurations are developed: one that maximises the F1-score and one that emphasises high recall. We also combine the CNNs with expectation maximization (EM) selection as well as size filtering. We observed that our CNN selections have lower contrast in power spectral density functions relative to the EM selection, used in our previous work. However, the reconstruction of our CNN-based selections gives similar results. Introducing CNNs into SPI experiments allows streamlining the reconstruction pipeline, enables researchers to classify patterns on the fly, and, as a consequence, enables them to tightly control the duration of their experiments. We think that bringing non-standard artificial intelligence (AI) based solutions in a well-described SPI analysis workflow may be beneficial for the future development of the SPI experiments.
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Submitted 16 December, 2021;
originally announced December 2021.
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Classification of diffraction patterns in single particle imaging experiments performed at X-ray free-electron lasers using a convolutional neural network
Authors:
Alexandr Ignatenko,
Dameli Assalauova,
Sergey A. Bobkov,
Luca Gelisio,
Anton B. Teslyuk,
Viacheslav A. Ilyin,
Ivan A. Vartanyants
Abstract:
Single particle imaging (SPI) is a promising method for native structure determination which has undergone a fast progress with the development of X-ray Free-Electron Lasers. Large amounts of data are collected during SPI experiments, driving the need for automated data analysis. The necessary data analysis pipeline has a number of steps including binary object classification (single versus multip…
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Single particle imaging (SPI) is a promising method for native structure determination which has undergone a fast progress with the development of X-ray Free-Electron Lasers. Large amounts of data are collected during SPI experiments, driving the need for automated data analysis. The necessary data analysis pipeline has a number of steps including binary object classification (single versus multiple hits). Classification and object detection are areas where deep neural networks currently outperform other approaches. In this work, we use the fast object detector networks YOLOv2 and YOLOv3. By exploiting transfer learning, a moderate amount of data is sufficient for training of the neural network. We demonstrate here that a convolutional neural network (CNN) can be successfully used to classify data from SPI experiments. We compare the results of classification for the two different networks, with different depth and architecture, by applying them to the same SPI data with different data representation. The best results are obtained for YOLOv2 color images linear scale classification, which shows an accuracy of about 97% with the precision and recall of about 52% and 61%, respectively, which is in comparison to manual data classification.
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Submitted 17 August, 2020;
originally announced August 2020.
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An advanced workflow for single particle imaging with the limited data at an X-ray free-electron laser
Authors:
Dameli Assalauova,
Young Yong Kim,
Sergey Bobkov,
Ruslan Khubbutdinov,
Max Rose,
Roberto Alvarez,
Jakob Andreasson,
Eugeniu Balaur,
Alice Contreras,
Hasan DeMirci,
Luca Gelisio,
Janos Hajdu,
Mark S. Hunter,
Ruslan P. Kurta,
Haoyuan Li,
Matthew McFadden,
Reza Nazari,
Peter Schwander,
Anton Teslyuk,
Peter Walter,
P. Lourdu Xavier,
Chun Hong Yoon,
Sahba Zaared,
Viacheslav A. Ilyin,
Richard A. Kirian
, et al. (3 additional authors not shown)
Abstract:
An improved analysis for single particle imaging (SPI) experiments, using the limited data, is presented here. Results are based on a study of bacteriophage PR772 performed at the AMO instrument at the Linac Coherent Light Source (LCLS) as part of the SPI initiative. Existing methods were modified to cope with the shortcomings of the experimental data: inaccessibility of information from the half…
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An improved analysis for single particle imaging (SPI) experiments, using the limited data, is presented here. Results are based on a study of bacteriophage PR772 performed at the AMO instrument at the Linac Coherent Light Source (LCLS) as part of the SPI initiative. Existing methods were modified to cope with the shortcomings of the experimental data: inaccessibility of information from the half of the detector and small fraction of single hits. General SPI analysis workflow was upgraded with the expectation-maximization based classification of diffraction patterns and mode decomposition on the final virus structure determination step. The presented processing pipeline allowed us to determine the three-dimensional structure of the bacteriophage PR772 without symmetry constraints with a spatial resolution of 6.9 nm. The obtained resolution was limited by the scattering intensity during the experiment and the relatively small number of single hits.
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Submitted 15 June, 2020;
originally announced June 2020.
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Megahertz single-particle imaging at the European XFEL
Authors:
Egor Sobolev,
Serguey Zolotarev,
Klaus Giewekemeyer,
Johan Bielecki,
Kenta Okamoto,
Hemanth K. N. Reddy,
Jakob Andreasson,
Kartik Ayyer,
Imrich Barak,
Sadia Bari,
Anton Barty,
Richard Bean,
Sergey Bobkov,
Henry N. Chapman,
Grzegorz Chojnowski,
Benedikt J. Daurer,
Katerina Dörner,
Tomas Ekeberg,
Leonie Flückiger,
Oxana Galzitskaya,
Luca Gelisio,
Steffen Hauf,
Brenda G. Hogue,
Daniel A. Horke,
Ahmad Hosseinizadeh
, et al. (38 additional authors not shown)
Abstract:
The emergence of high repetition-rate X-ray free-electron lasers (XFELs) powered by superconducting accelerator technology enables the measurement of significantly more experimental data per day than was previously possible. The European XFEL will soon provide 27,000 pulses per second, more than two orders of magnitude more than any other XFEL. The increased pulse rate is a key enabling factor for…
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The emergence of high repetition-rate X-ray free-electron lasers (XFELs) powered by superconducting accelerator technology enables the measurement of significantly more experimental data per day than was previously possible. The European XFEL will soon provide 27,000 pulses per second, more than two orders of magnitude more than any other XFEL. The increased pulse rate is a key enabling factor for single-particle X-ray diffractive imaging, which relies on averaging the weak diffraction signal from single biological particles. Taking full advantage of this new capability requires that all experimental steps, from sample preparation and delivery to the acquisition of diffraction patterns, are compatible with the increased pulse repetition rate. Here, we show that single-particle imaging can be performed using X-ray pulses at megahertz repetition rates. The obtained results pave the way towards exploiting high repetition-rate X-ray free-electron lasers for single-particle imaging at their full repetition rate.
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Submitted 14 December, 2019;
originally announced December 2019.
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A separation of electrons and protons in the GAMMA-400 gamma-ray telescope
Authors:
A. A. Leonov,
A. M. Galper,
V. Bonvicini,
N. P. Topchiev,
O. Adriani,
R. L. Aptekar,
I. V. Arkhangelskaja,
A. I. Arkhangelskiy,
L. Bergstrom,
E. Berti,
G. Bigongiari,
S. G. Bobkov,
M. Boezio,
E. A. Bogomolov,
S. Bonechi,
M. Bongi,
S. Bottai,
G. Castellini,
P. W. Cattaneo,
P. Cumani,
G. L. Dedenko,
C. De Donato,
V. A. Dogiel,
M. S. Gorbunov,
Yu. V. Gusakov
, et al. (41 additional authors not shown)
Abstract:
The GAMMA-400 gamma-ray telescope is intended to measure the fluxes of gamma rays and cosmic-ray electrons and positrons in the energy range from 100 MeV to several TeV. Such measurements concern with the following scientific goals: search for signatures of dark matter, investigation of gamma-ray point and extended sources, studies of the energy spectra of Galactic and extragalactic diffuse emissi…
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The GAMMA-400 gamma-ray telescope is intended to measure the fluxes of gamma rays and cosmic-ray electrons and positrons in the energy range from 100 MeV to several TeV. Such measurements concern with the following scientific goals: search for signatures of dark matter, investigation of gamma-ray point and extended sources, studies of the energy spectra of Galactic and extragalactic diffuse emission, studies of gamma-ray bursts and gamma-ray emission from the active Sun, as well as high-precision measurements of spectra of high-energy electrons and positrons, protons, and nuclei up to the knee. The main components of cosmic rays are protons and helium nuclei, whereas the part of lepton component in the total flux is ~10E-3 for high energies. In present paper, the capability of the GAMMA-400 gamma-ray telescope to distinguish electrons and positrons from protons in cosmic rays is investigated. The individual contribution to the proton rejection is studied for each detector system of the GAMMA-400 gamma-ray telescope. Using combined information from all detector systems allow us to provide the proton rejection from electrons with a factor of ~4x10E5 for vertical incident particles and ~3x10E5 for particles with initial inclination of 30 degrees. The calculations were performed for the electron energy range from 50 GeV to 1 TeV.
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Submitted 23 March, 2015;
originally announced March 2015.
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The GAMMA-400 space observatory: status and perspectives
Authors:
A. M. Galper,
V. Bonvicini,
N. P. Topchiev,
O. Adriani,
R. L. Aptekar,
I. V. Arkhangelskaja,
A. I. Arkhangelskiy,
L. Bergstrom,
E. Berti,
G. Bigongiari,
S. G. Bobkov,
M. Boezio,
E. A. Bogomolov,
S. Bonechi,
M. Bongi,
S. Bottai,
K. A. Boyarchuk,
G. Castellini,
P. W. Cattaneo,
P. Cumani,
G. L. Dedenko,
C. De Donato,
V. A. Dogiel,
M. S. Gorbunov,
Yu. V. Gusakov
, et al. (42 additional authors not shown)
Abstract:
The present design of the new space observatory GAMMA-400 is presented in this paper. The instrument has been designed for the optimal detection of gamma rays in a broad energy range (from ~100 MeV up to 3 TeV), with excellent angular and energy resolution. The observatory will also allow precise and high statistic studies of the electron component in the cosmic rays up to the multi TeV region, as…
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The present design of the new space observatory GAMMA-400 is presented in this paper. The instrument has been designed for the optimal detection of gamma rays in a broad energy range (from ~100 MeV up to 3 TeV), with excellent angular and energy resolution. The observatory will also allow precise and high statistic studies of the electron component in the cosmic rays up to the multi TeV region, as well as protons and nuclei spectra up to the knee region. The GAMMA-400 observatory will allow to address a broad range of science topics, like search for signatures of dark matter, studies of Galactic and extragalactic gamma-ray sources, Galactic and extragalactic diffuse emission, gamma-ray bursts and charged cosmic rays acceleration and diffusion mechanism up to the knee.
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Submitted 13 December, 2014;
originally announced December 2014.
