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Showing 1–2 of 2 results for author: Biswas, I

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  1. arXiv:2310.08183  [pdf, other

    hep-ex astro-ph.IM gr-qc hep-ph physics.atom-ph

    Terrestrial Very-Long-Baseline Atom Interferometry: Workshop Summary

    Authors: Sven Abend, Baptiste Allard, Iván Alonso, John Antoniadis, Henrique Araujo, Gianluigi Arduini, Aidan Arnold, Tobias Aßmann, Nadja Augst, Leonardo Badurina, Antun Balaz, Hannah Banks, Michele Barone, Michele Barsanti, Angelo Bassi, Baptiste Battelier, Charles Baynham, Beaufils Quentin, Aleksandar Belic, Ankit Beniwal, Jose Bernabeu, Francesco Bertinelli, Andrea Bertoldi, Ikbal Ahamed Biswas, Diego Blas , et al. (228 additional authors not shown)

    Abstract: This document presents a summary of the 2023 Terrestrial Very-Long-Baseline Atom Interferometry Workshop hosted by CERN. The workshop brought together experts from around the world to discuss the exciting developments in large-scale atom interferometer (AI) prototypes and their potential for detecting ultralight dark matter and gravitational waves. The primary objective of the workshop was to lay… ▽ More

    Submitted 12 October, 2023; originally announced October 2023.

    Comments: Summary of the Terrestrial Very-Long-Baseline Atom Interferometry Workshop held at CERN: https://indico.cern.ch/event/1208783/

  2. arXiv:1206.1347  [pdf, ps, other

    cond-mat.mtrl-sci physics.ins-det

    Energy distribution and quantum yield for photoemission from air-contaminated gold surfaces under UV illumination close to the threshold

    Authors: Gerald Hechenblaikner, Tobias Ziegler, Indro Biswas, Christoph Seibel, Mathias Schulze, Nico Brandt, Achim Schoell, Patrick Bergner, Friedrich T. Reinert

    Abstract: The kinetic energy distributions of photo-electrons emitted from gold surfaces under illumination by UV-light close to the threshold are measured and analyzed. Samples are prepared as chemically clean through Ar-Ion sputtering and then exposed to atmosphere for variable durations before Quantum Yield measurements are performed after evacuation. During measurements the bias voltage applied to the s… ▽ More

    Submitted 6 June, 2012; originally announced June 2012.

    Comments: paper draft: two columns, 12 pages, 10 figures

    Journal ref: J. Appl. Phys. 111, 124914 (2012)