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Study of the decay and production properties of $D_{s1}(2536)$ and $D_{s2}^*(2573)$
Authors:
M. Ablikim,
M. N. Achasov,
P. Adlarson,
O. Afedulidis,
X. C. Ai,
R. Aliberti,
A. Amoroso,
Q. An,
Y. Bai,
O. Bakina,
I. Balossino,
Y. Ban,
H. -R. Bao,
V. Batozskaya,
K. Begzsuren,
N. Berger,
M. Berlowski,
M. Bertani,
D. Bettoni,
F. Bianchi,
E. Bianco,
A. Bortone,
I. Boyko,
R. A. Briere,
A. Brueggemann
, et al. (645 additional authors not shown)
Abstract:
The $e^+e^-\rightarrow D_s^+D_{s1}(2536)^-$ and $e^+e^-\rightarrow D_s^+D^*_{s2}(2573)^-$ processes are studied using data samples collected with the BESIII detector at center-of-mass energies from 4.530 to 4.946~GeV. The absolute branching fractions of $D_{s1}(2536)^- \rightarrow \bar{D}^{*0}K^-$ and $D_{s2}^*(2573)^- \rightarrow \bar{D}^0K^-$ are measured for the first time to be…
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The $e^+e^-\rightarrow D_s^+D_{s1}(2536)^-$ and $e^+e^-\rightarrow D_s^+D^*_{s2}(2573)^-$ processes are studied using data samples collected with the BESIII detector at center-of-mass energies from 4.530 to 4.946~GeV. The absolute branching fractions of $D_{s1}(2536)^- \rightarrow \bar{D}^{*0}K^-$ and $D_{s2}^*(2573)^- \rightarrow \bar{D}^0K^-$ are measured for the first time to be $(35.9\pm 4.8\pm 3.5)\%$ and $(37.4\pm 3.1\pm 4.6)\%$, respectively. The measurements are in tension with predictions based on the assumption that the $D_{s1}(2536)$ and $D_{s2}^*(2573)$ are dominated by a bare $c\bar{s}$ component. The $e^+e^-\rightarrow D_s^+D_{s1}(2536)^-$ and $e^+e^-\rightarrow D_s^+D^*_{s2}(2573)^-$ cross sections are measured, and a resonant structure at around 4.6~GeV with a width of 50~MeV is observed for the first time with a statistical significance of $15σ$ in the $e^+e^-\rightarrow D_s^+D^*_{s2}(2573)^-$ process. It could be the $Y(4626)$ found by the Belle collaboration in the $D_s^+D_{s1}(2536)^{-}$ final state, since they have similar masses and widths. There is also evidence for a structure at around 4.75~GeV in both processes.
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Submitted 10 July, 2024;
originally announced July 2024.
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A kiloelectron-volt ultrafast electron micro-diffraction apparatus using low emittance semiconductor photocathodes
Authors:
W. H. Li,
C. J. R. Duncan,
M. B. Andorf,
A. C. Bartnik,
E. Bianco,
L. Cultrera,
A. Galdi,
M. Gordon,
M. Kaemingk,
C. A. Pennington,
L. F. Kourkoutis,
I. V. Bazarov,
J. M. Maxson
Abstract:
We report the design and performance of a time-resolved electron diffraction apparatus capable of producing intense bunches with simultaneously single digit micron probe size, long coherence length, and $200$ fs rms time resolution. We measure the 5d (peak) beam brightness at the sample location in micro-diffraction mode to be $7 \times 10^{13} \ \mathrm{A}/\text{m}^2\text{-rad}^2$. To generate hi…
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We report the design and performance of a time-resolved electron diffraction apparatus capable of producing intense bunches with simultaneously single digit micron probe size, long coherence length, and $200$ fs rms time resolution. We measure the 5d (peak) beam brightness at the sample location in micro-diffraction mode to be $7 \times 10^{13} \ \mathrm{A}/\text{m}^2\text{-rad}^2$. To generate high brightness electron bunches, the system employs high efficiency, low emittance semiconductor photocathodes driven with a wavelength near the photoemission threshold at a repetition rate up to 250 kHz. We characterize spatial, temporal, and reciprocal space resolution of the apparatus. We perform proof-of-principle measurements of ultrafast heating in single crystal Au samples and compare experimental results with simulations that account for the effects of multiple-scattering.
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Submitted 2 February, 2022; v1 submitted 15 November, 2021;
originally announced November 2021.
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Atomic-resolution cryo-STEM across continuously variable temperature
Authors:
Berit H. Goodge,
Elisabeth Bianco,
Henny W. Zandbergen Lena F. Kourkoutis
Abstract:
Atomic-resolution cryogenic scanning transmission electron microscopy (cryo-STEM) has provided a path to probing the microscopic nature of select low-temperature phases in quantum materials. Expanding cryo-STEM techniques to broadly tunable temperatures will give access to the rich temperature-dependent phase diagrams of these materials. With existing cryo-holders, however, variations in sample te…
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Atomic-resolution cryogenic scanning transmission electron microscopy (cryo-STEM) has provided a path to probing the microscopic nature of select low-temperature phases in quantum materials. Expanding cryo-STEM techniques to broadly tunable temperatures will give access to the rich temperature-dependent phase diagrams of these materials. With existing cryo-holders, however, variations in sample temperature significantly disrupt the thermal equilibrium of the system, resulting in large-scale sample drift. The ability to tune temperature without negatively impacting the overall instrument stability is crucial, particularly for high-resolution experiments. Here, we test a new side-entry continuously variable temperature dual-tilt cryo-holder which integrates liquid nitrogen cooling with a 6-pin MEMS sample heater to overcome some of these experimental challenges. We measure consistently low drift rates of 0.3-0.4 Angstrom/s and demonstrate atomic-resolution cryo-STEM imaging across a continuously variable temperature range from ~100 K to well above room temperature. We conduct additional drift stability measurements across several commercial sample stages and discuss implications for further developments of ultra-stable, flexible cryo-stages.
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Submitted 30 January, 2020;
originally announced January 2020.
