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Definition of design guidelines, construction and performance of an ultra-stable scanning tunneling microscope for spectroscopic imaging
Authors:
Irene Battisti,
Gijsbert Verdoes,
Kees van Oosten,
Koen M. Bastiaans,
Milan P. Allan
Abstract:
Spectroscopic-imaging scanning tunneling microscopy is a powerful technique to study quantum materials, with the ability to provide information about the local electronic structure with subatomic resolution. However, as most spectroscopic measurements are conducted without feedback to the tip, it is extremely sensitive to vibrations coming from the environment. This requires the use of laboratorie…
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Spectroscopic-imaging scanning tunneling microscopy is a powerful technique to study quantum materials, with the ability to provide information about the local electronic structure with subatomic resolution. However, as most spectroscopic measurements are conducted without feedback to the tip, it is extremely sensitive to vibrations coming from the environment. This requires the use of laboratories with low-vibration facilities combined with a very rigid microscope construction. In this article, we report on the design and fabrication of an ultra-stable STM for spectroscopic-imaging measurements that operates in ultra high vacuum and at low temperatures (4 K). We perform finite element analysis calculations for the main components of the microscope in order to guide design choices towards higher stiffness and we choose sapphire as the main material of the STM head. By combining these two strategies, we construct a STM head with measured lowest resonant frequencies above f0=13 kHz for the coarse approach mechanism, a value three times higher than previously reported, and in good agreement with the calculations. With this, we achieve an average vibration level of $\sim$ 6 fm/sqrt(Hz), without a dedicated low-vibration lab. We demonstrate the microscope's performance with topographic and spectroscopic measurements on the correlated metal Sr2RhO4, showing the quasiparticle interference pattern in real and reciprocal space with high signal-to-noise ratio.
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Submitted 23 October, 2018;
originally announced October 2018.
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Amplifier for scanning tunneling microscopy at MHz frequencies
Authors:
K. M. Bastiaans,
T. Benschop,
D. Chatzopoulos,
D. H. Cho,
Q. Dong,
Y. **,
M. P. Allan
Abstract:
Conventional scanning tunneling microscopy (STM) is limited to a bandwidth of circa 1kHz around DC. Here, we develop, build and test a novel amplifier circuit capable of measuring the tunneling current in the MHz regime while simultaneously performing conventional STM measurements. This is achieved with an amplifier circuit including a LC tank with a quality factor exceeding 600 and a home-built,…
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Conventional scanning tunneling microscopy (STM) is limited to a bandwidth of circa 1kHz around DC. Here, we develop, build and test a novel amplifier circuit capable of measuring the tunneling current in the MHz regime while simultaneously performing conventional STM measurements. This is achieved with an amplifier circuit including a LC tank with a quality factor exceeding 600 and a home-built, low-noise high electron mobility transistor (HEMT). The amplifier circuit functions while simultaneously scanning with atomic resolution in the tunneling regime, i.e. at junction resistances in the range of giga-ohms, and down towards point contact spectroscopy. To enable high signal-to-noise and meet all technical requirements for the inclusion in a commercial low temperature, ultra-high vacuum STM, we use superconducting cross-wound inductors and choose materials and circuit elements with low heat load. We demonstrate the high performance of the amplifier by spatially map** the Poissonian noise of tunneling electrons on an atomically clean Au(111) surface. We also show differential conductance spectroscopy measurements at 3MHz, demonstrating superior performance over conventional spectroscopy techniques. Further, our technology could be used to perform impedance matched spin resonance and distinguish Majorana modes from more conventional edge states.
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Submitted 1 June, 2018;
originally announced June 2018.
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Nanofabricated tips for device-based scanning tunneling microscopy
Authors:
Maarten Leeuwenhoek,
Richard A. Norte,
Koen M. Bastiaans,
Doohee Cho,
Irene Battisti,
Yaroslav M. Blanter,
Simon Gröblacher,
Milan P. Allan
Abstract:
We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called smart tips and show the possibility of device-based STM tips. Contrary to conventional etched metal wire tips, these can be integrated into lithographically defin…
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We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called smart tips and show the possibility of device-based STM tips. Contrary to conventional etched metal wire tips, these can be integrated into lithographically defined electrical circuits. We describe a new fabrication method to create a defined apex on a silicon chip and experimentally demonstrate the high performance of the smart tips, both in stability and resolution. In situ tip preparation methods are possible and we verify that they can resolve the herringbone reconstruction and Friedel oscillations on Au(111) surfaces. We further present an overview of possible applications.
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Submitted 2 May, 2020; v1 submitted 22 December, 2017;
originally announced December 2017.
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Probing the Nuclear Spin-Lattice Relaxation Time at the Nanoscale
Authors:
J. J. T. Wagenaar,
A. M. J. den Haan,
J. M. de Voogd,
L. Bossoni,
T. A. de Jong,
M. de Wit,
K. M. Bastiaans,
D. J. Thoen,
A. Endo,
T. M. Klapwijk,
J. Zaanen,
T. H. Oosterkamp
Abstract:
Nuclear spin-lattice relaxation times are measured on copper using magnetic resonance force microscopy performed at temperatures down to 42 mK. The low temperature is verified by comparison with the Korringa relation. Measuring spin-lattice relaxation times locally at very low temperatures opens up the possibility to measure the magnetic properties of inhomogeneous electron systems realized in oxi…
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Nuclear spin-lattice relaxation times are measured on copper using magnetic resonance force microscopy performed at temperatures down to 42 mK. The low temperature is verified by comparison with the Korringa relation. Measuring spin-lattice relaxation times locally at very low temperatures opens up the possibility to measure the magnetic properties of inhomogeneous electron systems realized in oxide interfaces, topological insulators and other strongly correlated electron systems such as high-Tc superconductors.
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Submitted 27 June, 2016; v1 submitted 14 March, 2016;
originally announced March 2016.
