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Comprehensive TCAD Simulation Study of High Voltage (>650V) Common Drain Bidirectional AlGaN/GaN HEMTs
Abstract: A broad TCAD simulation analysis of a monolithic common drain bidirectional GaN HEMT was performed. We used gate-to-gate distances of 4 microns and 6 microns for the devices optimized with two field plates. The breakdown voltages were 675V and 915V respectively. Inclusion of field plates near both the gates produced electric field peaks at the opposite ends of the transistor simultaneously. This r… ▽ More
Submitted 1 October, 2023; v1 submitted 10 April, 2023; originally announced April 2023.
Comments: This paper went through a lot of change or update. I wish to submit it as a new paper in arXiv after finalizing