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Three-Stage Adjusted Regression Forecasting (TSARF) for Software Defect Prediction
Authors:
Shadow Pritchard,
Bhaskar Mitra,
Vidhyashree Nagaraju
Abstract:
Software reliability growth models (SRGM) enable failure data collected during testing. Specifically, nonhomogeneous Poisson process (NHPP) SRGM are the most commonly employed models. While software reliability growth models are important, efficient modeling of complex software systems increases the complexity of models. Increased model complexity presents a challenge in identifying robust and com…
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Software reliability growth models (SRGM) enable failure data collected during testing. Specifically, nonhomogeneous Poisson process (NHPP) SRGM are the most commonly employed models. While software reliability growth models are important, efficient modeling of complex software systems increases the complexity of models. Increased model complexity presents a challenge in identifying robust and computationally efficient algorithms to identify model parameters and reduces the generalizability of the models. Existing studies on traditional software reliability growth models suggest that NHPP models characterize defect data as a smooth continuous curve and fail to capture changes in the defect discovery process. Therefore, the model fits well under ideal conditions, but it is not adaptable and will only fit appropriately shaped data. Neural networks and other machine learning methods have been applied to greater effect [5], however limited due to lack of large samples of defect data especially at earlier stages of testing.
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Submitted 30 January, 2024;
originally announced January 2024.
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Bayesian Ridge Regression Based Model to Predict Fault Location in HVdc Network
Authors:
Timothy Flavin,
Thomas Steiner,
Bhaskar Mitra,
Vidhyashree nagaraju
Abstract:
This paper discusses a method for accurately estimating the fault location in multi-terminal High Voltage direct current (HVdc) transmission network using single ended current and voltage measurements. The post-fault voltage and current signatures are a function of multiple factors and thus accurately locating faults on a multi-terminal network is challenging. We discuss a novel data-driven Bayes…
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This paper discusses a method for accurately estimating the fault location in multi-terminal High Voltage direct current (HVdc) transmission network using single ended current and voltage measurements. The post-fault voltage and current signatures are a function of multiple factors and thus accurately locating faults on a multi-terminal network is challenging. We discuss a novel data-driven Bayes Regression based method for accurately predicting fault locations. The sensitivity of the proposed algorithm to measurement noise, fault location, resistance and current limiting inductance are performed on a radial three-terminal MTdc network. The test system is designed in Power System Computer Aided Design (PSCAD)/Electromagnetic Transients including dc (EMTdc).
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Submitted 25 February, 2022;
originally announced February 2022.
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Fault location in High Voltage Multi-terminal dc Networks Using Ensemble Learning
Authors:
Timothy Flavin,
Bhaskar Mitra,
Vidhyashree Nagaraju,
Rounak Meyur
Abstract:
Precise location of faults for large distance power transmission networks is essential for faster repair and restoration process. High Voltage direct current (HVdc) networks using modular multi-level converter (MMC) technology has found its prominence for interconnected multi-terminal networks. This allows for large distance bulk power transmission at lower costs. However, they cope with the chall…
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Precise location of faults for large distance power transmission networks is essential for faster repair and restoration process. High Voltage direct current (HVdc) networks using modular multi-level converter (MMC) technology has found its prominence for interconnected multi-terminal networks. This allows for large distance bulk power transmission at lower costs. However, they cope with the challenge of dc faults. Fast and efficient methods to isolate the network under dc faults have been widely studied and investigated. After successful isolation, it is essential to precisely locate the fault. The post-fault voltage and current signatures are a function of multiple factors and thus accurately locating faults on a multi-terminal network is challenging. In this paper, we discuss a novel data-driven ensemble learning based approach for accurate fault location. Here we utilize the eXtreme Gradient Boosting (XGB) method for accurate fault location. The sensitivity of the proposed algorithm to measurement noise, fault location, resistance and current limiting inductance are performed on a radial three-terminal MTdc network designed in Power System Computer Aided Design (PSCAD)/Electromagnetic Transients including dc (EMTdc).
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Submitted 20 January, 2022;
originally announced January 2022.
