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Unsupervised learning approaches to characterize heterogeneous samples using X-ray single particle imaging
Authors:
Yulong Zhuang,
Salah Awel,
Anton Barty,
Richard Bean,
Johan Bielecki,
Martin Bergemann,
Benedikt J. Daurer,
Tomas Ekeberg,
Armando D. Estillore,
Hans Fangohr,
Klaus Giewekemeyer,
Mark S. Hunter,
Mikhail Karnevskiy,
Richard A. Kirian,
Henry Kirkwood,
Yoonhee Kim,
Jayanath Koliyadu,
Holger Lange,
Romain Letrun,
Jannik Lübke,
Abhishek Mall,
Thomas Michelat,
Andrew J. Morgan,
Nils Roth,
Amit K. Samanta
, et al. (17 additional authors not shown)
Abstract:
One of the outstanding analytical problems in X-ray single particle imaging (SPI) is the classification of structural heterogeneity, which is especially difficult given the low signal-to-noise ratios of individual patterns and that even identical objects can yield patterns that vary greatly when orientation is taken into consideration. We propose two methods which explicitly account for this orien…
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One of the outstanding analytical problems in X-ray single particle imaging (SPI) is the classification of structural heterogeneity, which is especially difficult given the low signal-to-noise ratios of individual patterns and that even identical objects can yield patterns that vary greatly when orientation is taken into consideration. We propose two methods which explicitly account for this orientation-induced variation and can robustly determine the structural landscape of a sample ensemble. The first, termed common-line principal component analysis (PCA) provides a rough classification which is essentially parameter-free and can be run automatically on any SPI dataset. The second method, utilizing variation auto-encoders (VAEs) can generate 3D structures of the objects at any point in the structural landscape. We implement both these methods in combination with the noise-tolerant expand-maximize-compress (EMC) algorithm and demonstrate its utility by applying it to an experimental dataset from gold nanoparticles with only a few thousand photons per pattern and recover both discrete structural classes as well as continuous deformations. These developments diverge from previous approaches of extracting reproducible subsets of patterns from a dataset and open up the possibility to move beyond studying homogeneous sample sets and study open questions on topics such as nanocrystal growth and dynamics as well as phase transitions which have not been externally triggered.
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Submitted 13 September, 2021;
originally announced September 2021.
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3D diffractive imaging of nanoparticle ensembles using an X-ray laser
Authors:
Kartik Ayyer,
P. Lourdu Xavier,
Johan Bielecki,
Zhou Shen,
Benedikt J. Daurer,
Amit K. Samanta,
Salah Awel,
Richard Bean,
Anton Barty,
Tomas Ekeberg,
Armando D. Estillore,
Klaus Giewekemeyer,
Mark S. Hunter,
Richard A. Kirian,
Henry Kirkwood,
Yoonhee Kim,
Jayanath Koliyadu,
Holger Lange,
Romain Letruin,
Jannik Lübke,
Andrew J. Morgan,
Nils Roth,
Tokushi Sato,
Marcin Sikorski,
Florian Schulz
, et al. (12 additional authors not shown)
Abstract:
We report the 3D structure determination of gold nanoparticles (AuNPs) by X-ray single particle imaging (SPI). Around 10 million diffraction patterns from gold nanoparticles were measured in less than 100 hours of beam time, more than 100 times the amount of data in any single prior SPI experiment, using the new capabilities of the European X-ray free electron laser which allow measurements of 150…
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We report the 3D structure determination of gold nanoparticles (AuNPs) by X-ray single particle imaging (SPI). Around 10 million diffraction patterns from gold nanoparticles were measured in less than 100 hours of beam time, more than 100 times the amount of data in any single prior SPI experiment, using the new capabilities of the European X-ray free electron laser which allow measurements of 1500 frames per second. A classification and structural sorting method was developed to disentangle the heterogeneity of the particles and to obtain a resolution of better than 3 nm. With these new experimental and analytical developments, we have entered a new era for the SPI method and the path towards close-to-atomic resolution imaging of biomolecules is apparent.
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Submitted 17 July, 2020;
originally announced July 2020.
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Ptychographic X-ray Speckle Tracking with Multi Layer Laue Lens Systems
Authors:
Andrew James Morgan,
Kevin T. Murray,
Mauro Prasciolu,
Holger Fleckenstein,
Oleksandr Yefanov,
Pablo Villanueva-Perez,
Valerio Mariani,
Martin Domaracky,
Manuela Kuhn,
Steve Aplin,
Istwan Mohacsi,
Marc Messerschmidt,
Karolina Stachnik,
Yang Du,
Anja Burkhart,
Alke Meents,
Evgeny Nazaretski,
Hanfei Yan,
Xiao**g Huang,
Yong Chu,
Henry N. Chapman,
Saša Bajt
Abstract:
The ever-increasing brightness of synchrotron radiation sources demands improved x-ray optics to utilise their capability for imaging and probing biological cells, nano-devices, and functional matter on the nanometre scale with chemical sensitivity. Hard x-rays are ideal for high-resolution imaging and spectroscopic applications due to their short wavelength, high penetrating power, and chemical s…
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The ever-increasing brightness of synchrotron radiation sources demands improved x-ray optics to utilise their capability for imaging and probing biological cells, nano-devices, and functional matter on the nanometre scale with chemical sensitivity. Hard x-rays are ideal for high-resolution imaging and spectroscopic applications due to their short wavelength, high penetrating power, and chemical sensitivity. The penetrating power that makes x-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques that have enabled the fabrication of a series of highly focusing x-ray lenses, known as wedged multi layer Laue lenses. Improvements to the lens design and fabrication technique demands an accurate, robust, in-situ and at-wavelength characterisation method. To this end, we have developed a modified form of the speckle-tracking wavefront metrology method, the ptychographic x-ray speckle tracking method, which is capable of operating with highly divergent wavefields. A useful by-product of this method, is that it also provides high-resolution and aberration-free projection images of extended specimens. We report on three separate experiments using this method, where we have resolved ray path angles to within 4 nano-radians with an imaging resolution of 45nm (full-period). This method does not require a high degree of coherence, making it suitable for lab based x-ray sources. Likewise it is robust to errors in the registered sample positions making it suitable for x-ray free-electron laser facilities, where beam pointing fluctuations can be problematic for wavefront metrology.
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Submitted 28 March, 2020;
originally announced March 2020.
