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Unsupervised learning approaches to characterize heterogeneous samples using X-ray single particle imaging
Authors:
Yulong Zhuang,
Salah Awel,
Anton Barty,
Richard Bean,
Johan Bielecki,
Martin Bergemann,
Benedikt J. Daurer,
Tomas Ekeberg,
Armando D. Estillore,
Hans Fangohr,
Klaus Giewekemeyer,
Mark S. Hunter,
Mikhail Karnevskiy,
Richard A. Kirian,
Henry Kirkwood,
Yoonhee Kim,
Jayanath Koliyadu,
Holger Lange,
Romain Letrun,
Jannik Lübke,
Abhishek Mall,
Thomas Michelat,
Andrew J. Morgan,
Nils Roth,
Amit K. Samanta
, et al. (17 additional authors not shown)
Abstract:
One of the outstanding analytical problems in X-ray single particle imaging (SPI) is the classification of structural heterogeneity, which is especially difficult given the low signal-to-noise ratios of individual patterns and that even identical objects can yield patterns that vary greatly when orientation is taken into consideration. We propose two methods which explicitly account for this orien…
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One of the outstanding analytical problems in X-ray single particle imaging (SPI) is the classification of structural heterogeneity, which is especially difficult given the low signal-to-noise ratios of individual patterns and that even identical objects can yield patterns that vary greatly when orientation is taken into consideration. We propose two methods which explicitly account for this orientation-induced variation and can robustly determine the structural landscape of a sample ensemble. The first, termed common-line principal component analysis (PCA) provides a rough classification which is essentially parameter-free and can be run automatically on any SPI dataset. The second method, utilizing variation auto-encoders (VAEs) can generate 3D structures of the objects at any point in the structural landscape. We implement both these methods in combination with the noise-tolerant expand-maximize-compress (EMC) algorithm and demonstrate its utility by applying it to an experimental dataset from gold nanoparticles with only a few thousand photons per pattern and recover both discrete structural classes as well as continuous deformations. These developments diverge from previous approaches of extracting reproducible subsets of patterns from a dataset and open up the possibility to move beyond studying homogeneous sample sets and study open questions on topics such as nanocrystal growth and dynamics as well as phase transitions which have not been externally triggered.
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Submitted 13 September, 2021;
originally announced September 2021.
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3D diffractive imaging of nanoparticle ensembles using an X-ray laser
Authors:
Kartik Ayyer,
P. Lourdu Xavier,
Johan Bielecki,
Zhou Shen,
Benedikt J. Daurer,
Amit K. Samanta,
Salah Awel,
Richard Bean,
Anton Barty,
Tomas Ekeberg,
Armando D. Estillore,
Klaus Giewekemeyer,
Mark S. Hunter,
Richard A. Kirian,
Henry Kirkwood,
Yoonhee Kim,
Jayanath Koliyadu,
Holger Lange,
Romain Letruin,
Jannik Lübke,
Andrew J. Morgan,
Nils Roth,
Tokushi Sato,
Marcin Sikorski,
Florian Schulz
, et al. (12 additional authors not shown)
Abstract:
We report the 3D structure determination of gold nanoparticles (AuNPs) by X-ray single particle imaging (SPI). Around 10 million diffraction patterns from gold nanoparticles were measured in less than 100 hours of beam time, more than 100 times the amount of data in any single prior SPI experiment, using the new capabilities of the European X-ray free electron laser which allow measurements of 150…
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We report the 3D structure determination of gold nanoparticles (AuNPs) by X-ray single particle imaging (SPI). Around 10 million diffraction patterns from gold nanoparticles were measured in less than 100 hours of beam time, more than 100 times the amount of data in any single prior SPI experiment, using the new capabilities of the European X-ray free electron laser which allow measurements of 1500 frames per second. A classification and structural sorting method was developed to disentangle the heterogeneity of the particles and to obtain a resolution of better than 3 nm. With these new experimental and analytical developments, we have entered a new era for the SPI method and the path towards close-to-atomic resolution imaging of biomolecules is apparent.
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Submitted 17 July, 2020;
originally announced July 2020.
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Low-signal limit of X-ray single particle imaging
Authors:
Kartik Ayyer,
Andrew J. Morgan,
Andrew A. Aquila,
Hasan DeMirci,
Brenda G. Hogue,
Richard A. Kirian,
P. Lourdu Xavier,
Chun Hong Yoon,
Henry N. Chapman,
Anton Barty
Abstract:
An outstanding question in X-ray single particle imaging experiments has been the feasibility of imaging sub 10-nm-sized biomolecules under realistic experimental conditions where very few photons are expected to be measured in a single snapshot and instrument background may be significant relative to particle scattering. While analyses of simulated data have shown that the determination of an ave…
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An outstanding question in X-ray single particle imaging experiments has been the feasibility of imaging sub 10-nm-sized biomolecules under realistic experimental conditions where very few photons are expected to be measured in a single snapshot and instrument background may be significant relative to particle scattering. While analyses of simulated data have shown that the determination of an average image should be feasible using Bayesian methods such as the EMC algorithm, this has yet to be demonstrated using experimental data containing realistic non-isotropic instrument background, sample variability and other experimental factors. In this work, we show that the orientation and phase retrieval steps work at photon counts diluted to the signal levels one expects from smaller molecules or with weaker pulses, using data from experimental measurements of 60-nm PR772 viruses. Even when the signal is reduced to a fraction as little as 1/256, the virus electron density determined using ab initio phasing is of almost the same quality as the high-signal data. However, we are still limited by the total number of patterns collected, which may soon be mitigated by the advent of high repetition-rate sources like the European XFEL and LCLS-II.
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Submitted 27 April, 2020; v1 submitted 10 May, 2019;
originally announced May 2019.
