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Optimizing Coded-Apertures for Depth-Resolved Diffraction
Authors:
Doğa Gürsoy,
Dina Sheyfer,
Michael Wojcik,
Wenjun Liu,
Jonathan Tischler
Abstract:
Coded apertures, traditionally employed in x-ray astronomy for imaging celestial objects, are now being adapted for micro-scale applications, particularly in studying microscopic specimens with synchrotron light diffraction. In this paper, we focus on micro-coded aperture imaging and its capacity to accomplish depth-resolved micro-diffraction analysis within crystalline specimens. We study apertur…
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Coded apertures, traditionally employed in x-ray astronomy for imaging celestial objects, are now being adapted for micro-scale applications, particularly in studying microscopic specimens with synchrotron light diffraction. In this paper, we focus on micro-coded aperture imaging and its capacity to accomplish depth-resolved micro-diffraction analysis within crystalline specimens. We study aperture specifications and scanning parameters by assessing characteristics like size, thickness, and patterns. Numerical experiments assist in assessing their impact on reconstruction quality. Empirical data from a Laue diffraction microscope at a synchrotron undulator beamline supports our findings. Overall, our results offer key insights for optimizing aperture design in advancing micro-scale diffraction imaging at synchrotrons. This study contributes insights to this expanding field and suggests significant advancements, especially when coupled with the enhanced flux anticipated from the global upgrades of synchrotron sources.
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Submitted 21 May, 2024;
originally announced May 2024.
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Dark-Field X-Ray Microscopy with Structured Illumination for Three-Dimensional Imaging
Authors:
Doğa Gürsoy,
Kaan Alp Yay,
Elliot Kisiel,
Michael Wojcik,
Dina Sheyfer,
Matthew Highland,
Ian Randal Fisher,
Stephan Hruszkewycz,
Zahir Islam
Abstract:
We introduce a structured illumination technique for dark-field x-ray microscopy optimized for three-dimensional imaging of ordered materials at sub-micrometer length scales. Our method utilizes a coded aperture to spatially modulate the incident x-ray beam on the sample, enabling the reconstruction of the sample's 3D structure from images captured at various aperture positions. Unlike common volu…
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We introduce a structured illumination technique for dark-field x-ray microscopy optimized for three-dimensional imaging of ordered materials at sub-micrometer length scales. Our method utilizes a coded aperture to spatially modulate the incident x-ray beam on the sample, enabling the reconstruction of the sample's 3D structure from images captured at various aperture positions. Unlike common volumetric imaging techniques such as tomography, our approach casts a scanning x-ray silhouette of a coded aperture for depth resolution along the axis of diffraction, eliminating any need for sample rotation or rastering, leading to a highly stable imaging modality. This modification provides robustness against geometric uncertainties during data acquisition, particularly for achieving sub-micrometer resolutions where geometric uncertainties typically limit resolution. We introduce the image reconstruction model and validate our results with experimental data on an isolated twin domain within a bulk single crystal of an iron pnictide obtained using a dark-field x-ray microscope. This timely advancement aligns with the enhanced brightness upgrade of the world's synchrotron radiation facilities, opening unprecedented opportunities in imaging.
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Submitted 21 May, 2024;
originally announced May 2024.
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Digital autofocusing of a coded-aperture Laue diffraction microscope
Authors:
Doga Gursoy,
Dina Sheyfer,
Michael Wojcik,
Wenjun Liu,
Jonathan Tischler
Abstract:
To provide optimal depth resolution with a coded-aperture Laue diffraction microscope, an accurate position of the coded-aperture and its scanning geometry need to be known. However, finding the geometry by trial and error is a time-consuming and often challenging process because of the large number of parameters involved. In this paper, we propose an optimization approach to automate the focusing…
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To provide optimal depth resolution with a coded-aperture Laue diffraction microscope, an accurate position of the coded-aperture and its scanning geometry need to be known. However, finding the geometry by trial and error is a time-consuming and often challenging process because of the large number of parameters involved. In this paper, we propose an optimization approach to automate the focusing process after data is collected. We demonstrate the robustness and efficiency of the proposed approach with experimental data taken at a synchrotron facility.
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Submitted 1 February, 2023; v1 submitted 15 August, 2022;
originally announced August 2022.
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Depth-resolved Laue microdiffraction with coded-apertures
Authors:
Doga Gursoy,
Dina Sheyfer,
Michael Wojcik,
Wenjun Liu,
Jonathan Z. Tischler
Abstract:
We introduce a rapid data acquisition and reconstruction method to image the crystalline structure of materials and associated strain and orientations at micrometer resolution using Laue diffraction. Our method relies on scanning a coded-aperture across the diffracted x-ray beams from a broadband illumination, and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function o…
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We introduce a rapid data acquisition and reconstruction method to image the crystalline structure of materials and associated strain and orientations at micrometer resolution using Laue diffraction. Our method relies on scanning a coded-aperture across the diffracted x-ray beams from a broadband illumination, and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. This method provides a rapid access to full diffraction information at sub-micrometer volume elements in bulk materials. Here we present the theory as well as the experimental validation of this imaging approach.
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Submitted 13 September, 2022; v1 submitted 3 March, 2022;
originally announced March 2022.
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Real-time X-ray Phase-contrast Imaging Using SPINNet -- A Speckle-based Phase-contrast Imaging Neural Network
Authors:
Zhi Qiao,
Xianbo Shi,
Yudong Yao,
Michael J. Wojcik,
Luca Rebuffi,
Mathew J. Cherukara,
Lahsen Assoufid
Abstract:
X-ray phase-contrast imaging has become indispensable for visualizing samples with low absorption contrast. In this regard, speckle-based techniques have shown significant advantages in spatial resolution, phase sensitivity, and implementation flexibility compared with traditional methods. However, their computational cost has hindered their wider adoption. By exploiting the power of deep learning…
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X-ray phase-contrast imaging has become indispensable for visualizing samples with low absorption contrast. In this regard, speckle-based techniques have shown significant advantages in spatial resolution, phase sensitivity, and implementation flexibility compared with traditional methods. However, their computational cost has hindered their wider adoption. By exploiting the power of deep learning, we developed a new speckle-based phase-contrast imaging neural network (SPINNet) that boosts the phase retrieval speed by at least two orders of magnitude compared to existing methods. To achieve this performance, we combined SPINNet with a novel coded-mask-based technique, an enhanced version of the speckle-based method. Using this scheme, we demonstrate a simultaneous reconstruction of absorption and phase images on the order of 100 ms, where a traditional correlation-based analysis would take several minutes even with a cluster. In addition to significant improvement in speed, our experimental results show that the imaging resolution and phase retrieval quality of SPINNet outperform existing single-shot speckle-based methods. Furthermore, we successfully demonstrate its application in 3D X-ray phase-contrast tomography. Our result shows that SPINNet could enable many applications requiring high-resolution and fast data acquisition and processing, such as in-situ and in-operando 2D and 3D phase-contrast imaging and real-time at-wavelength metrology and wavefront sensing.
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Submitted 18 January, 2022;
originally announced January 2022.
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Evaluation of modified uniformly redundant arrays as structured illuminations for ptychography
Authors:
Daniel J. Ching,
Selin Aslan,
Viktor Nikitin,
Michael J. Wojcik,
Doga Gursoy
Abstract:
Previous studies have shown that the frequency content of an illumination affects the convergence rate and reconstruction quality of ptychographic reconstructions. In this numerical study, we demonstrate that structuring a large illumination as a modified uniformly redundant array (MURA) can yield higher resolution and faster convergence for ptychography by improving the signal-to-noise ratio of h…
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Previous studies have shown that the frequency content of an illumination affects the convergence rate and reconstruction quality of ptychographic reconstructions. In this numerical study, we demonstrate that structuring a large illumination as a modified uniformly redundant array (MURA) can yield higher resolution and faster convergence for ptychography by improving the signal-to-noise ratio of high spatial frequencies in the far-field diffraction pattern.
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Submitted 3 April, 2020;
originally announced April 2020.
