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Showing 1–2 of 2 results for author: Vashistha, N

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  1. arXiv:2207.09627  [pdf, other

    cs.CR cs.AI cs.CV cs.LG eess.SY

    EVHA: Explainable Vision System for Hardware Testing and Assurance -- An Overview

    Authors: Md Mahfuz Al Hasan, Mohammad Tahsin Mostafiz, Thomas An Le, Jake Julia, Nidish Vashistha, Shayan Taheri, Navid Asadizanjani

    Abstract: Due to the ever-growing demands for electronic chips in different sectors the semiconductor companies have been mandated to offshore their manufacturing processes. This unwanted matter has made security and trustworthiness of their fabricated chips concerning and caused creation of hardware attacks. In this condition, different entities in the semiconductor supply chain can act maliciously and exe… ▽ More

    Submitted 19 July, 2022; originally announced July 2022.

    Comments: Please contact Dr. Shayan Taheri for any questions and/or comments regarding the paper arXiv submission at: "www.shayan-taheri.com". The Paper Initial Submission: The ACM Journal on Emerging Technologies in Computing Systems (JETC)

  2. arXiv:2205.13311  [pdf, other

    cs.LG cs.CV eess.IV

    SARS-CoV-2 Result Interpretation based on Image Analysis of Lateral Flow Devices

    Authors: Neeraj Vashistha

    Abstract: The widely used gene quantisation technique, Lateral Flow Device (LFD), is now commonly used to detect the presence of SARS-CoV-2. It is enabling the control and prevention of the spread of the virus. Depending on the viral load, LFD have different sensitivity and self-test for normal user present additional challenge to interpret the result. With the evolution of machine learning algorithms, imag… ▽ More

    Submitted 26 May, 2022; originally announced May 2022.

    Comments: 12 pages, 14 figures