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Programmable EM Sensor Array for Golden-Model Free Run-time Trojan Detection and Localization
Authors:
Hanqiu Wang,
Max Panoff,
Zihao Zhan,
Shuo Wang,
Christophe Bobda,
Domenic Forte
Abstract:
Side-channel analysis has been proven effective at detecting hardware Trojans in integrated circuits (ICs). However, most detection techniques rely on large external probes and antennas for data collection and require a long measurement time to detect Trojans. Such limitations make these techniques impractical for run-time deployment and ineffective in detecting small Trojans with subtle side-chan…
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Side-channel analysis has been proven effective at detecting hardware Trojans in integrated circuits (ICs). However, most detection techniques rely on large external probes and antennas for data collection and require a long measurement time to detect Trojans. Such limitations make these techniques impractical for run-time deployment and ineffective in detecting small Trojans with subtle side-channel signatures. To overcome these challenges, we propose a Programmable Sensor Array (PSA) for run-time hardware Trojan detection, localization, and identification. PSA is a tampering-resilient integrated on-chip magnetic field sensor array that can be re-programmed to change the sensors' shape, size, and location. Using PSA, EM side-channel measurement results collected from sensors at different locations on an IC can be analyzed to localize and identify the Trojan. The PSA has better performance than conventional external magnetic probes and state-of-the-art on-chip single-coil magnetic field sensors. We fabricated an AES-128 test chip with four AES Hardware Trojans. They were successfully detected, located, and identified with the proposed on-chip PSA within 10 milliseconds using our proposed cross-domain analysis.
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Submitted 22 January, 2024;
originally announced January 2024.
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Histogram-based Auto Segmentation: A Novel Approach to Segmenting Integrated Circuit Structures from SEM Images
Authors:
Ronald Wilson,
Navid Asadizanjani,
Domenic Forte,
Damon L. Woodard
Abstract:
In the Reverse Engineering and Hardware Assurance domain, a majority of the data acquisition is done through electron microscopy techniques such as Scanning Electron Microscopy (SEM). However, unlike its counterparts in optical imaging, only a limited number of techniques are available to enhance and extract information from the raw SEM images. In this paper, we introduce an algorithm to segment o…
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In the Reverse Engineering and Hardware Assurance domain, a majority of the data acquisition is done through electron microscopy techniques such as Scanning Electron Microscopy (SEM). However, unlike its counterparts in optical imaging, only a limited number of techniques are available to enhance and extract information from the raw SEM images. In this paper, we introduce an algorithm to segment out Integrated Circuit (IC) structures from the SEM image. Unlike existing algorithms discussed in this paper, this algorithm is unsupervised, parameter-free and does not require prior information on the noise model or features in the target image making it effective in low quality image acquisition scenarios as well. Furthermore, the results from the application of the algorithm on various structures and layers in the IC are reported and discussed.
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Submitted 28 April, 2020;
originally announced April 2020.
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Hardware Trust and Assurance through Reverse Engineering: A Survey and Outlook from Image Analysis and Machine Learning Perspectives
Authors:
Ulbert J. Botero,
Ronald Wilson,
Hangwei Lu,
Mir Tanjidur Rahman,
Mukhil A. Mallaiyan,
Fatemeh Ganji,
Navid Asadizanjani,
Mark M. Tehranipoor,
Damon L. Woodard,
Domenic Forte
Abstract:
In the context of hardware trust and assurance, reverse engineering has been often considered as an illegal action. Generally speaking, reverse engineering aims to retrieve information from a product, i.e., integrated circuits (ICs) and printed circuit boards (PCBs) in hardware security-related scenarios, in the hope of understanding the functionality of the device and determining its constituent…
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In the context of hardware trust and assurance, reverse engineering has been often considered as an illegal action. Generally speaking, reverse engineering aims to retrieve information from a product, i.e., integrated circuits (ICs) and printed circuit boards (PCBs) in hardware security-related scenarios, in the hope of understanding the functionality of the device and determining its constituent components. Hence, it can raise serious issues concerning Intellectual Property (IP) infringement, the (in)effectiveness of security-related measures, and even new opportunities for injecting hardware Trojans. Ironically, reverse engineering can enable IP owners to verify and validate the design. Nevertheless, this cannot be achieved without overcoming numerous obstacles that limit successful outcomes of the reverse engineering process. This paper surveys these challenges from two complementary perspectives: image processing and machine learning. These two fields of study form a firm basis for the enhancement of efficiency and accuracy of reverse engineering processes for both PCBs and ICs. In summary, therefore, this paper presents a roadmap indicating clearly the actions to be taken to fulfill hardware trust and assurance objectives.
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Submitted 7 April, 2021; v1 submitted 11 February, 2020;
originally announced February 2020.
