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Showing 1–1 of 1 results for author: Eifler, M

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  1. arXiv:2406.06381  [pdf, other

    eess.SP

    Feature Characterization for Profile Surface Texture

    Authors: Alexander Müller, Matthias Eifler, Arsalan Jawaid, Jörg Seewig

    Abstract: Conventional field parameters for surface measurement use all data points, while feature characterization focuses on subsets extracted by watershed segmentation. This approach enables the extraction of specific features that are potentially responsible for the function of the surface or are a direct reflection of the manufacturing process, allowing for a more accurate assessment of both aspects. F… ▽ More

    Submitted 5 July, 2024; v1 submitted 10 June, 2024; originally announced June 2024.