CellDefectNet: A Machine-designed Attention Condenser Network for Electroluminescence-based Photovoltaic Cell Defect Inspection
Authors:
Carol Xu,
Mahmoud Famouri,
Gautam Bathla,
Saeejith Nair,
Mohammad Javad Shafiee,
Alexander Wong
Abstract:
Photovoltaic cells are electronic devices that convert light energy to electricity, forming the backbone of solar energy harvesting systems. An essential step in the manufacturing process for photovoltaic cells is visual quality inspection using electroluminescence imaging to identify defects such as cracks, finger interruptions, and broken cells. A big challenge faced by industry in photovoltaic…
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Photovoltaic cells are electronic devices that convert light energy to electricity, forming the backbone of solar energy harvesting systems. An essential step in the manufacturing process for photovoltaic cells is visual quality inspection using electroluminescence imaging to identify defects such as cracks, finger interruptions, and broken cells. A big challenge faced by industry in photovoltaic cell visual inspection is the fact that it is currently done manually by human inspectors, which is extremely time consuming, laborious, and prone to human error. While deep learning approaches holds great potential to automating this inspection, the hardware resource-constrained manufacturing scenario makes it challenging for deploying complex deep neural network architectures. In this work, we introduce CellDefectNet, a highly efficient attention condenser network designed via machine-driven design exploration specifically for electroluminesence-based photovoltaic cell defect detection on the edge. We demonstrate the efficacy of CellDefectNet on a benchmark dataset comprising of a diversity of photovoltaic cells captured using electroluminescence imagery, achieving an accuracy of ~86.3% while possessing just 410K parameters (~13$\times$ lower than EfficientNet-B0, respectively) and ~115M FLOPs (~12$\times$ lower than EfficientNet-B0) and ~13$\times$ faster on an ARM Cortex A-72 embedded processor when compared to EfficientNet-B0.
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Submitted 25 April, 2022;
originally announced April 2022.
LightDefectNet: A Highly Compact Deep Anti-Aliased Attention Condenser Neural Network Architecture for Light Guide Plate Surface Defect Detection
Authors:
Carol Xu,
Mahmoud Famouri,
Gautam Bathla,
Mohammad Javad Shafiee,
Alexander Wong
Abstract:
Light guide plates are essential optical components widely used in a diverse range of applications ranging from medical lighting fixtures to back-lit TV displays. An essential step in the manufacturing of light guide plates is the quality inspection of defects such as scratches, bright/dark spots, and impurities. This is mainly done in industry through manual visual inspection for plate pattern ir…
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Light guide plates are essential optical components widely used in a diverse range of applications ranging from medical lighting fixtures to back-lit TV displays. An essential step in the manufacturing of light guide plates is the quality inspection of defects such as scratches, bright/dark spots, and impurities. This is mainly done in industry through manual visual inspection for plate pattern irregularities, which is time-consuming and prone to human error and thus act as a significant barrier to high-throughput production. Advances in deep learning-driven computer vision has led to the exploration of automated visual quality inspection of light guide plates to improve inspection consistency, accuracy, and efficiency. However, given the cost constraints in visual inspection scenarios, the widespread adoption of deep learning-driven computer vision methods for inspecting light guide plates has been greatly limited due to high computational requirements. In this study, we explore the utilization of machine-driven design exploration with computational and "best-practices" constraints as well as L$_1$ paired classification discrepancy loss to create LightDefectNet, a highly compact deep anti-aliased attention condenser neural network architecture tailored specifically for light guide plate surface defect detection in resource-constrained scenarios. Experiments show that LightDetectNet achieves a detection accuracy of $\sim$98.2% on the LGPSDD benchmark while having just 770K parameters ($\sim$33$\times$ and $\sim$6.9$\times$ lower than ResNet-50 and EfficientNet-B0, respectively) and $\sim$93M FLOPs ($\sim$88$\times$ and $\sim$8.4$\times$ lower than ResNet-50 and EfficientNet-B0, respectively) and $\sim$8.8$\times$ faster inference speed than EfficientNet-B0 on an embedded ARM processor.
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Submitted 25 April, 2022;
originally announced April 2022.
