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Showing 1–2 of 2 results for author: Ban, H

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  1. arXiv:2206.11321  [pdf

    cs.SE eess.SY

    An Application of a Modified Beta Factor Method for the Analysis of Software Common Cause Failures

    Authors: Tate Shorthill, Han Bao, Edward Chen, Heng Ban

    Abstract: This paper presents an approach for modeling software common cause failures (CCFs) within digital instrumentation and control (I&C) systems. CCFs consist of a concurrent failure between two or more components due to a shared failure cause and coupling mechanism. This work emphasizes the importance of identifying software-centric attributes related to the coupling mechanisms necessary for simultane… ▽ More

    Submitted 22 June, 2022; originally announced June 2022.

    Comments: 12 pages, 3 Figures, 7 Tables, presented at the Probabilistic Safety Assessment & Management conference in 2022. arXiv admin note: text overlap with arXiv:2204.03717

  2. arXiv:2005.02348  [pdf

    eess.SY

    A Redundancy-Guided Approach for the Hazard Analysis of Digital Instrumentation and Control Systems in Advanced Nuclear Power Plants

    Authors: Tate Shorthill, Han Bao, Hongbin Zhang, Heng Ban

    Abstract: Digital instrumentation and control (I&C) upgrades are a vital research area for nuclear industry. Despite their performance benefits, deployment of digital I&C in nuclear power plants (NPPs) has been limited. Digital I&C systems exhibit complex failure modes including common cause failures (CCFs) which can be difficult to identify. This paper describes the development of a redundancy-guided appli… ▽ More

    Submitted 5 May, 2020; originally announced May 2020.