Showing 1–2 of 2 results for author: Arslanturk, S
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Process Knowledge Driven Change Point Detection for Automated Calibration of Discrete Event Simulation Models Using Machine Learning
Authors:
Suleyman Yildirim,
Alper Ekrem Murat,
Murat Yildirim,
Suzan Arslanturk
Abstract:
Initial development and subsequent calibration of discrete event simulation models for complex systems require accurate identification of dynamically changing process characteristics. Existing data driven change point methods (DD-CPD) assume changes are extraneous to the system, thus cannot utilize available process knowledge. This work proposes a unified framework for process-driven multi-variate…
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Initial development and subsequent calibration of discrete event simulation models for complex systems require accurate identification of dynamically changing process characteristics. Existing data driven change point methods (DD-CPD) assume changes are extraneous to the system, thus cannot utilize available process knowledge. This work proposes a unified framework for process-driven multi-variate change point detection (PD-CPD) by combining change point detection models with machine learning and process-driven simulation modeling. The PD-CPD, after initializing with DD-CPD's change point(s), uses simulation models to generate system level outputs as time-series data streams which are then used to train neural network models to predict system characteristics and change points. The accuracy of the predictive models measures the likelihood that the actual process data conforms to the simulated change points in system characteristics. PD-CPD iteratively optimizes change points by repeating simulation and predictive model building steps until the set of change point(s) with the maximum likelihood is identified. Using an emergency department case study, we show that PD-CPD significantly improves change point detection accuracy over DD-CPD estimates and is able to detect actual change points.
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Submitted 21 September, 2020; v1 submitted 11 May, 2020;
originally announced May 2020.
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Res-CR-Net, a residual network with a novel architecture optimized for the semantic segmentation of microscopy images
Authors:
Hassan Abdallah,
Asiri Liyanaarachchi,
Maranda Saigh,
Samantha Silvers,
Suzan Arslanturk,
Douglas J. Taatjes,
Lars Larsson,
Bhanu P. Jena,
Domenico L. Gatti
Abstract:
Deep Neural Networks (DNN) have been widely used to carry out segmentation tasks in both electron and light microscopy. Most DNNs developed for this purpose are based on some variation of the encoder-decoder type U-Net architecture, in combination with residual blocks to increase ease of training and resilience to gradient degradation. Here we introduce Res-CR-Net, a type of DNN that features resi…
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Deep Neural Networks (DNN) have been widely used to carry out segmentation tasks in both electron and light microscopy. Most DNNs developed for this purpose are based on some variation of the encoder-decoder type U-Net architecture, in combination with residual blocks to increase ease of training and resilience to gradient degradation. Here we introduce Res-CR-Net, a type of DNN that features residual blocks with either a bundle of separable atrous convolutions with different dilation rates or a convolutional LSTM. The number of filters used in each residual block and the number of blocks are the only hyperparameters that need to be modified in order to optimize the network training for a variety of different microscopy images.
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Submitted 14 April, 2020;
originally announced April 2020.