Showing 1–1 of 1 results for author: de la Maza, U S
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Boosting Defect Detection in Manufacturing using Tensor Convolutional Neural Networks
Authors:
Pablo Martin-Ramiro,
Unai Sainz de la Maza,
Sukhbinder Singh,
Roman Orus,
Samuel Mugel
Abstract:
Defect detection is one of the most important yet challenging tasks in the quality control stage in the manufacturing sector. In this work, we introduce a Tensor Convolutional Neural Network (T-CNN) and examine its performance on a real defect detection application in one of the components of the ultrasonic sensors produced at Robert Bosch's manufacturing plants. Our quantum-inspired T-CNN operate…
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Defect detection is one of the most important yet challenging tasks in the quality control stage in the manufacturing sector. In this work, we introduce a Tensor Convolutional Neural Network (T-CNN) and examine its performance on a real defect detection application in one of the components of the ultrasonic sensors produced at Robert Bosch's manufacturing plants. Our quantum-inspired T-CNN operates on a reduced model parameter space to substantially improve the training speed and performance of an equivalent CNN model without sacrificing accuracy. More specifically, we demonstrate how T-CNNs are able to reach the same performance as classical CNNs as measured by quality metrics, with up to fifteen times fewer parameters and 4% to 19% faster training times. Our results demonstrate that the T-CNN greatly outperforms the results of traditional human visual inspection, providing value in a current real application in manufacturing.
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Submitted 26 April, 2024; v1 submitted 29 December, 2023;
originally announced January 2024.
