Showing 1–2 of 2 results for author: Wiecha, P R

Monitoring MBE substrate deoxidation via RHEED image-sequence analysis by deep learning

Authors: Abdourahman Khaireh-Walieh, Alexandre Arnoult, Sébastien Plissard, Peter R. Wiecha

Abstract: Reflection high-energy electron diffraction (RHEED) is a powerful tool in molecular beam epitaxy (MBE), but RHEED images are often difficult to interpret, requiring experienced operators. We present an approach for automated surveillance of GaAs substrate deoxidation in MBE reactors using deep learning based RHEED image-sequence classification. Our approach consists of an non-supervised auto-encod… ▽ More Reflection high-energy electron diffraction (RHEED) is a powerful tool in molecular beam epitaxy (MBE), but RHEED images are often difficult to interpret, requiring experienced operators. We present an approach for automated surveillance of GaAs substrate deoxidation in MBE reactors using deep learning based RHEED image-sequence classification. Our approach consists of an non-supervised auto-encoder (AE) for feature extraction, combined with a supervised convolutional classifier network. We demonstrate that our lightweight network model can accurately identify the exact deoxidation moment. Furthermore we show that the approach is very robust and allows accurate deoxidation detection during months without requiring re-training. The main advantage of the approach is that it can be applied to raw RHEED images without requiring further information such as the rotation angle, temperature, etc. △ Less

Submitted 15 December, 2022; v1 submitted 7 October, 2022; originally announced October 2022.

Comments: 8 pages, 5 figures

Journal ref: Crystal Growth and Design, 23(2) 892-898 (2023)

Pushing the limits of optical information storage using deep learning

Authors: Peter R. Wiecha, Aurélie Lecestre, Nicolas Mallet, Guilhem Larrieu

Abstract: Diffraction drastically limits the bit density in optical data storage. To increase the storage density, alternative strategies involving supplementary recording dimensions and robust read-out schemes must be explored. Here, we propose to encode multiple bits of information in the geometry of subwavelength dielectric nanostructures. A crucial problem in high-density information storage concepts is… ▽ More Diffraction drastically limits the bit density in optical data storage. To increase the storage density, alternative strategies involving supplementary recording dimensions and robust read-out schemes must be explored. Here, we propose to encode multiple bits of information in the geometry of subwavelength dielectric nanostructures. A crucial problem in high-density information storage concepts is the robustness of the information readout with respect to fabrication errors and experimental noise. Using a machine-learning based approach in which the scattering spectra are analyzed by an artificial neural network, we achieve quasi error free read-out of sequences of up to 9 bit, encoded in top-down fabricated silicon nanostructures. We demonstrate that probing few wavelengths instead of the entire spectrum is sufficient for robust information retrieval and that the readout can be further simplified, exploiting the RGB values from microscopy images. Our work paves the way towards high-density optical information storage using planar silicon nanostructures, compatible with mass-production ready CMOS technology. △ Less

Submitted 9 October, 2018; v1 submitted 9 May, 2018; originally announced May 2018.

Comments: 13 pages, 6 figures + supporting informations of 25 pages, 37 figures

Journal ref: Nature Nanotechnology 14, 237-244 (2019)