Showing 1–1 of 1 results for author: Torikoshi, Y

Sensitive Region-based Metamorphic Testing Framework using Explainable AI

Authors: Yuma Torikoshi, Yasuharu Nishi, Juichi Takahashi

Abstract: Deep Learning (DL) is one of the most popular research topics in machine learning and DL-driven image recognition systems have developed rapidly. Recent research has employed metamorphic testing (MT) to detect misclassified images. Most of them discuss metamorphic relations (MR), with limited attention given to which regions should be transformed. We focus on the fact that there are sensitive regi… ▽ More Deep Learning (DL) is one of the most popular research topics in machine learning and DL-driven image recognition systems have developed rapidly. Recent research has employed metamorphic testing (MT) to detect misclassified images. Most of them discuss metamorphic relations (MR), with limited attention given to which regions should be transformed. We focus on the fact that there are sensitive regions where even small transformations can easily change the prediction results and propose an MT framework that efficiently tests for regions prone to misclassification by transforming these sensitive regions. Our evaluation demonstrated that the sensitive regions can be specified by Explainable AI (XAI) and our framework effectively detects faults. △ Less

Submitted 30 March, 2023; v1 submitted 13 March, 2023; originally announced March 2023.