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Quantitative probing: Validating causal models using quantitative domain knowledge
Authors:
Daniel Grünbaum,
Maike L. Stern,
Elmar W. Lang
Abstract:
We present quantitative probing as a model-agnostic framework for validating causal models in the presence of quantitative domain knowledge. The method is constructed as an analogue of the train/test split in correlation-based machine learning and as an enhancement of current causal validation strategies that are consistent with the logic of scientific discovery. The effectiveness of the method is…
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We present quantitative probing as a model-agnostic framework for validating causal models in the presence of quantitative domain knowledge. The method is constructed as an analogue of the train/test split in correlation-based machine learning and as an enhancement of current causal validation strategies that are consistent with the logic of scientific discovery. The effectiveness of the method is illustrated using Pearl's sprinkler example, before a thorough simulation-based investigation is conducted. Limits of the technique are identified by studying exemplary failing scenarios, which are furthermore used to propose a list of topics for future research and improvements of the presented version of quantitative probing. The code for integrating quantitative probing into causal analysis, as well as the code for the presented simulation-based studies of the effectiveness of quantitative probing is provided in two separate open-source Python packages.
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Submitted 7 September, 2022;
originally announced September 2022.
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Playing ** Pong with Light: Directional Emission of White Light
Authors:
Heribert Wankerl,
Christopher Wiesmann,
Laura Kreiner,
Rainer Butendeich,
Alexander Luce,
Sandra Sobczyk,
Maike Lorena Stern,
Elmar Wolfgang Lang
Abstract:
Over the last decades, light-emitting diodes (LED) have replaced common light bulbs in almost every application, from flashlights in smartphones to automotive headlights. Illuminating nightly streets requires LEDs to emit a light spectrum that is perceived as pure white by the human eye. The power associated with such a white light spectrum is not only distributed over the contributing wavelengths…
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Over the last decades, light-emitting diodes (LED) have replaced common light bulbs in almost every application, from flashlights in smartphones to automotive headlights. Illuminating nightly streets requires LEDs to emit a light spectrum that is perceived as pure white by the human eye. The power associated with such a white light spectrum is not only distributed over the contributing wavelengths but also over the angles of vision. For many applications, the usable light rays are required to exit the LED in forward direction, namely under small angles to the perpendicular. In this work, we demonstrate that a specifically designed multi-layer thin film on top of a white LED increases the power of pure white light emitted in forward direction. Therefore, the deduced multi-objective optimization problem is reformulated via a real-valued physics-guided objective function that represents the hierarchical structure of our engineering problem. Variants of Bayesian optimization are employed to maximize this non-deterministic objective function based on ray tracing simulations. Eventually, the investigation of optical properties of suitable multi-layer thin films allowed to identify the mechanism behind the increased directionality of white light: angle and wavelength selective filtering causes the multi-layer thin film to play ** pong with rays of light.
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Submitted 30 November, 2021;
originally announced November 2021.
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Parameterized Reinforcement Learning for Optical System Optimization
Authors:
Heribert Wankerl,
Maike L. Stern,
Ali Mahdavi,
Christoph Eichler,
Elmar W. Lang
Abstract:
Designing a multi-layer optical system with designated optical characteristics is an inverse design problem in which the resulting design is determined by several discrete and continuous parameters. In particular, we consider three design parameters to describe a multi-layer stack: Each layer's dielectric material and thickness as well as the total number of layers. Such a combination of both, dis…
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Designing a multi-layer optical system with designated optical characteristics is an inverse design problem in which the resulting design is determined by several discrete and continuous parameters. In particular, we consider three design parameters to describe a multi-layer stack: Each layer's dielectric material and thickness as well as the total number of layers. Such a combination of both, discrete and continuous parameters is a challenging optimization problem that often requires a computationally expensive search for an optimal system design. Hence, most methods merely determine the optimal thicknesses of the system's layers. To incorporate layer material and the total number of layers as well, we propose a method that considers the stacking of consecutive layers as parameterized actions in a Markov decision process. We propose an exponentially transformed reward signal that eases policy optimization and adapt a recent variant of Q-learning for inverse design optimization. We demonstrate that our method outperforms human experts and a naive reinforcement learning algorithm concerning the achieved optical characteristics. Moreover, the learned Q-values contain information about the optical properties of multi-layer optical systems, thereby allowing physical interpretation or what-if analysis.
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Submitted 25 November, 2020; v1 submitted 9 October, 2020;
originally announced October 2020.
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Rethinking Fully Convolutional Networks for the Analysis of Photoluminescence Wafer Images
Authors:
Maike Lorena Stern,
Hans Lindberg,
Klaus Meyer-Wegener
Abstract:
The manufacturing of light-emitting diodes is a complex semiconductor-manufacturing process, interspersed with different measurements. Among the employed measurements, photoluminescence imaging has several advantages, namely being a non-destructive, fast and thus cost-effective measurement. On a photoluminescence measurement image of an LED wafer, every pixel corresponds to an LED chip's brightnes…
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The manufacturing of light-emitting diodes is a complex semiconductor-manufacturing process, interspersed with different measurements. Among the employed measurements, photoluminescence imaging has several advantages, namely being a non-destructive, fast and thus cost-effective measurement. On a photoluminescence measurement image of an LED wafer, every pixel corresponds to an LED chip's brightness after photo-excitation, revealing chip performance information. However, generating a chip-fine defect map of the LED wafer, based on photoluminescence images, proves challenging for multiple reasons: on the one hand, the measured brightness values vary from image to image, in addition to local spots of differing brightness. On the other hand, certain defect structures may assume multiple shapes, sizes and brightness gradients, where salient brightness values may correspond to defective LED chips, measurement artefacts or non-defective structures. In this work, we revisit the creation of chip-fine defect maps using fully convolutional networks and show that the problem of segmenting objects at multiple scales can be improved by the incorporation of densely connected convolutional blocks and atrous spatial pyramid pooling modules. We also share implementation details and our experiences with training networks with small datasets of measurement images. The proposed architecture significantly improves the segmentation accuracy of highly variable defect structures over our previous version.
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Submitted 1 March, 2020;
originally announced March 2020.
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Fully Convolutional Networks for Chip-wise Defect Detection Employing Photoluminescence Images
Authors:
Maike Lorena Stern,
Martin Schellenberger
Abstract:
Efficient quality control is inevitable in the manufacturing of light-emitting diodes (LEDs). Because defective LED chips may be traced back to different causes, a time and cost-intensive electrical and optical contact measurement is employed. Fast photoluminescence measurements, on the other hand, are commonly used to detect wafer separation damages but also hold the potential to enable an effici…
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Efficient quality control is inevitable in the manufacturing of light-emitting diodes (LEDs). Because defective LED chips may be traced back to different causes, a time and cost-intensive electrical and optical contact measurement is employed. Fast photoluminescence measurements, on the other hand, are commonly used to detect wafer separation damages but also hold the potential to enable an efficient detection of all kinds of defective LED chips. On a photoluminescence image, every pixel corresponds to an LED chip's brightness after photoexcitation, revealing performance information. But due to unevenly distributed brightness values and varying defect patterns, photoluminescence images are not yet employed for a comprehensive defect detection. In this work, we show that fully convolutional networks can be used for chip-wise defect detection, trained on a small data-set of photoluminescence images. Pixel-wise labels allow us to classify each and every chip as defective or not. Being measurement-based, labels are easy to procure and our experiments show that existing discrepancies between training images and labels do not hinder network training. Using weighted loss calculation, we were able to equalize our highly unbalanced class categories. Due to the consistent use of skip connections and residual shortcuts, our network is able to predict a variety of structures, from extensive defect clusters up to single defective LED chips.
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Submitted 6 October, 2019;
originally announced October 2019.
