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Memristive Learning Cellular Automata: Theory and Applications
Authors:
Rafailia-Eleni Karamani,
Iosif-Angelos Fyrigos,
Vasileios Ntinas,
Orestis Liolis,
Giorgos Dimitrakopoulos,
Mustafa Altun,
Andrew Adamatzky,
Mircea R. Stan,
Georgios Ch. Sirakoulis
Abstract:
Memristors are novel non volatile devices that manage to combine storing and processing capabilities in the same physical place.Their nanoscale dimensions and low power consumption enable the further design of various nanoelectronic processing circuits and corresponding computing architectures, like neuromorhpic, in memory, unconventional, etc.One of the possible ways to exploit the memristor's ad…
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Memristors are novel non volatile devices that manage to combine storing and processing capabilities in the same physical place.Their nanoscale dimensions and low power consumption enable the further design of various nanoelectronic processing circuits and corresponding computing architectures, like neuromorhpic, in memory, unconventional, etc.One of the possible ways to exploit the memristor's advantages is by combining them with Cellular Automata (CA).CA constitute a well known non von Neumann computing architecture that is based on the local interconnection of simple identical cells forming N-dimensional grids.These local interconnections allow the emergence of global and complex phenomena.In this paper, we propose a hybridization of the CA original definition coupled with memristor based implementation, and, more specifically, we focus on Memristive Learning Cellular Automata (MLCA), which have the ability of learning using also simple identical interconnected cells and taking advantage of the memristor devices inherent variability.The proposed MLCA circuit level implementation is applied on optimal detection of edges in image processing through a series of SPICE simulations, proving its robustness and efficacy.
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Submitted 15 March, 2020;
originally announced March 2020.
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Reservoir Computing based Neural Image Filters
Authors:
Samiran Ganguly,
Yunfei Gu,
Yunkun Xie,
Mircea R. Stan,
Avik W. Ghosh,
Nibir K. Dhar
Abstract:
Clean images are an important requirement for machine vision systems to recognize visual features correctly. However, the environment, optics, electronics of the physical imaging systems can introduce extreme distortions and noise in the acquired images. In this work, we explore the use of reservoir computing, a dynamical neural network model inspired from biological systems, in creating dynamic i…
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Clean images are an important requirement for machine vision systems to recognize visual features correctly. However, the environment, optics, electronics of the physical imaging systems can introduce extreme distortions and noise in the acquired images. In this work, we explore the use of reservoir computing, a dynamical neural network model inspired from biological systems, in creating dynamic image filtering systems that extracts signal from noise using inverse modeling. We discuss the possibility of implementing these networks in hardware close to the sensors.
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Submitted 7 September, 2018;
originally announced September 2018.
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Hardware based Spatio-Temporal Neural Processing Backend for Imaging Sensors: Towards a Smart Camera
Authors:
Samiran Ganguly,
Yunfei Gu,
Mircea R. Stan,
Avik W. Ghosh
Abstract:
In this work we show how we can build a technology platform for cognitive imaging sensors using recent advances in recurrent neural network architectures and training methods inspired from biology. We demonstrate learning and processing tasks specific to imaging sensors, including enhancement of sensitivity and signal-to-noise ratio (SNR) purely through neural filtering beyond the fundamental limi…
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In this work we show how we can build a technology platform for cognitive imaging sensors using recent advances in recurrent neural network architectures and training methods inspired from biology. We demonstrate learning and processing tasks specific to imaging sensors, including enhancement of sensitivity and signal-to-noise ratio (SNR) purely through neural filtering beyond the fundamental limits sensor materials, and inferencing and spatio-temporal pattern recognition capabilities of these networks with applications in object detection, motion tracking and prediction. We then show designs of unit hardware cells built using complementary metal-oxide semiconductor (CMOS) and emerging materials technologies for ultra-compact and energy-efficient embedded neural processors for smart cameras.
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Submitted 22 March, 2018;
originally announced March 2018.
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Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience)
Authors:
Eric Cheng,
Shahrzad Mirkhani,
Lukasz G. Szafaryn,
Chen-Yong Cher,
Hyungmin Cho,
Kevin Skadron,
Mircea R. Stan,
Klas Lilja,
Jacob A. Abraham,
Pradip Bose,
Subhasish Mitra
Abstract:
We present CLEAR (Cross-Layer Exploration for Architecting Resilience), a first of its kind framework which overcomes a major challenge in the design of digital systems that are resilient to reliability failures: achieve desired resilience targets at minimal costs (energy, power, execution time, area) by combining resilience techniques across various layers of the system stack (circuit, logic, arc…
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We present CLEAR (Cross-Layer Exploration for Architecting Resilience), a first of its kind framework which overcomes a major challenge in the design of digital systems that are resilient to reliability failures: achieve desired resilience targets at minimal costs (energy, power, execution time, area) by combining resilience techniques across various layers of the system stack (circuit, logic, architecture, software, algorithm). This is also referred to as cross-layer resilience. In this paper, we focus on radiation-induced soft errors in processor cores. We address both single-event upsets (SEUs) and single-event multiple upsets (SEMUs) in terrestrial environments. Our framework automatically and systematically explores the large space of comprehensive resilience techniques and their combinations across various layers of the system stack (586 cross-layer combinations in this paper), derives cost-effective solutions that achieve resilience targets at minimal costs, and provides guidelines for the design of new resilience techniques. Our results demonstrate that a carefully optimized combination of circuit-level hardening, logic-level parity checking, and micro-architectural recovery provides a highly cost-effective soft error resilience solution for general-purpose processor cores. For example, a 50x improvement in silent data corruption rate is achieved at only 2.1% energy cost for an out-of-order core (6.1% for an in-order core) with no speed impact. However, (application-aware) selective circuit-level hardening alone, guided by a thorough analysis of the effects of soft errors on application benchmarks, provides a cost-effective soft error resilience solution as well (with ~1% additional energy cost for a 50x improvement in silent data corruption rate).
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Submitted 28 September, 2017;
originally announced September 2017.
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CLEAR: Cross-Layer Exploration for Architecting Resilience - Combining Hardware and Software Techniques to Tolerate Soft Errors in Processor Cores
Authors:
Eric Cheng,
Shahrzad Mirkhani,
Lukasz G. Szafaryn,
Chen-Yong Cher,
Hyungmin Cho,
Kevin Skadron,
Mircea R. Stan,
Klas Lilja,
Jacob A. Abraham,
Pradip Bose,
Subhasish Mitra
Abstract:
We present a first of its kind framework which overcomes a major challenge in the design of digital systems that are resilient to reliability failures: achieve desired resilience targets at minimal costs (energy, power, execution time, area) by combining resilience techniques across various layers of the system stack (circuit, logic, architecture, software, algorithm). This is also referred to as…
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We present a first of its kind framework which overcomes a major challenge in the design of digital systems that are resilient to reliability failures: achieve desired resilience targets at minimal costs (energy, power, execution time, area) by combining resilience techniques across various layers of the system stack (circuit, logic, architecture, software, algorithm). This is also referred to as cross-layer resilience. In this paper, we focus on radiation-induced soft errors in processor cores. We address both single-event upsets (SEUs) and single-event multiple upsets (SEMUs) in terrestrial environments. Our framework automatically and systematically explores the large space of comprehensive resilience techniques and their combinations across various layers of the system stack (586 cross-layer combinations in this paper), derives cost-effective solutions that achieve resilience targets at minimal costs, and provides guidelines for the design of new resilience techniques. We demonstrate the practicality and effectiveness of our framework using two diverse designs: a simple, in-order processor core and a complex, out-of-order processor core. Our results demonstrate that a carefully optimized combination of circuit-level hardening, logic-level parity checking, and micro-architectural recovery provides a highly cost-effective soft error resilience solution for general-purpose processor cores. For example, a 50x improvement in silent data corruption rate is achieved at only 2.1% energy cost for an out-of-order core (6.1% for an in-order core) with no speed impact. However, selective circuit-level hardening alone, guided by a thorough analysis of the effects of soft errors on application benchmarks, provides a cost-effective soft error resilience solution as well (with ~1% additional energy cost for a 50x improvement in silent data corruption rate).
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Submitted 23 June, 2016; v1 submitted 11 April, 2016;
originally announced April 2016.
