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Lagrangian Neural Networks for Reversible Dissipative Evolution
Authors:
Veera Sundararaghavan,
Megna N. Shah,
Jeff P. Simmons
Abstract:
There is a growing attention given to utilizing Lagrangian and Hamiltonian mechanics with network training in order to incorporate physics into the network. Most commonly, conservative systems are modeled, in which there are no frictional losses, so the system may be run forward and backward in time without requiring regularization. This work addresses systems in which the reverse direction is ill…
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There is a growing attention given to utilizing Lagrangian and Hamiltonian mechanics with network training in order to incorporate physics into the network. Most commonly, conservative systems are modeled, in which there are no frictional losses, so the system may be run forward and backward in time without requiring regularization. This work addresses systems in which the reverse direction is ill-posed because of the dissipation that occurs in forward evolution. The novelty is the use of Morse-Feshbach Lagrangian, which models dissipative dynamics by doubling the number of dimensions of the system in order to create a mirror latent representation that would counterbalance the dissipation of the observable system, making it a conservative system, albeit embedded in a larger space. We start with their formal approach by redefining a new Dissipative Lagrangian, such that the unknown matrices in the Euler-Lagrange's equations arise as partial derivatives of the Lagrangian with respect to only the observables. We then train a network from simulated training data for dissipative systems such as Fickian diffusion that arise in materials sciences. It is shown by experiments that the systems can be evolved in both forward and reverse directions without regularization beyond that provided by the Morse-Feshbach Lagrangian. Experiments of dissipative systems, such as Fickian diffusion, demonstrate the degree to which dynamics can be reversed.
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Submitted 26 May, 2024; v1 submitted 23 May, 2024;
originally announced May 2024.
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Towards Microstructural State Variables in Materials Systems
Authors:
Veera Sundararaghavan,
Megna N. Shah,
Jeff P. Simmons
Abstract:
The vast combination of material properties seen in nature are achieved by the complexity of the material microstructure. Advanced characterization and physics based simulation techniques have led to generation of extremely large microstructural datasets. There is a need for machine learning techniques that can manage data complexity by capturing the maximal amount of information about the microst…
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The vast combination of material properties seen in nature are achieved by the complexity of the material microstructure. Advanced characterization and physics based simulation techniques have led to generation of extremely large microstructural datasets. There is a need for machine learning techniques that can manage data complexity by capturing the maximal amount of information about the microstructure using the least number of variables. This paper aims to formulate dimensionality and state variable estimation techniques focused on reducing microstructural image data. It is shown that local dimensionality estimation based on nearest neighbors tend to give consistent dimension estimates for natural images for all p-Minkowski distances. However, it is found that dimensionality estimates have a systematic error for low-bit depth microstructural images. The use of Manhattan distance to alleviate this issue is demonstrated. It is also shown that stacked autoencoders can reconstruct the generator space of high dimensional microstructural data and provide a sparse set of state variables to fully describe the variability in material microstructures.
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Submitted 10 January, 2023;
originally announced January 2023.
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Multi-resolution Data Fusion for Super-Resolution Electron Microscopy
Authors:
Suhas Sreehari,
S. V. Venkatakrishnan,
Katherine L. Bouman,
Jeffrey P. Simmons,
Lawrence F. Drummy,
Charles A. Bouman
Abstract:
Perhaps surprisingly, the total electron microscopy (EM) data collected to date is less than a cubic millimeter. Consequently, there is an enormous demand in the materials and biological sciences to image at greater speed and lower dosage, while maintaining resolution. Traditional EM imaging based on homogeneous raster-order scanning severely limits the volume of high-resolution data that can be c…
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Perhaps surprisingly, the total electron microscopy (EM) data collected to date is less than a cubic millimeter. Consequently, there is an enormous demand in the materials and biological sciences to image at greater speed and lower dosage, while maintaining resolution. Traditional EM imaging based on homogeneous raster-order scanning severely limits the volume of high-resolution data that can be collected, and presents a fundamental limitation to understanding physical processes such as material deformation, crack propagation, and pyrolysis.
We introduce a novel multi-resolution data fusion (MDF) method for super-resolution computational EM. Our method combines innovative data acquisition with novel algorithmic techniques to dramatically improve the resolution/volume/speed trade-off. The key to our approach is to collect the entire sample at low resolution, while simultaneously collecting a small fraction of data at high resolution. The high-resolution measurements are then used to create a material-specific patch-library that is used within the "plug-and-play" framework to dramatically improve super-resolution of the low-resolution data. We present results using FEI electron microscope data that demonstrate super-resolution factors of 4x, 8x, and 16x, while substantially maintaining high image quality and reducing dosage.
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Submitted 28 November, 2016;
originally announced December 2016.
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Plug-and-Play Priors for Bright Field Electron Tomography and Sparse Interpolation
Authors:
Suhas Sreehari,
S. V. Venkatakrishnan,
Brendt Wohlberg,
Lawrence F. Drummy,
Jeffrey P. Simmons,
Charles A. Bouman
Abstract:
Many material and biological samples in scientific imaging are characterized by non-local repeating structures. These are studied using scanning electron microscopy and electron tomography. Sparse sampling of individual pixels in a 2D image acquisition geometry, or sparse sampling of projection images with large tilt increments in a tomography experiment, can enable high speed data acquisition and…
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Many material and biological samples in scientific imaging are characterized by non-local repeating structures. These are studied using scanning electron microscopy and electron tomography. Sparse sampling of individual pixels in a 2D image acquisition geometry, or sparse sampling of projection images with large tilt increments in a tomography experiment, can enable high speed data acquisition and minimize sample damage caused by the electron beam.
In this paper, we present an algorithm for electron tomographic reconstruction and sparse image interpolation that exploits the non-local redundancy in images. We adapt a framework, termed plug-and-play (P&P) priors, to solve these imaging problems in a regularized inversion setting. The power of the P&P approach is that it allows a wide array of modern denoising algorithms to be used as a "prior model" for tomography and image interpolation. We also present sufficient mathematical conditions that ensure convergence of the P&P approach, and we use these insights to design a new non-local means denoising algorithm. Finally, we demonstrate that the algorithm produces higher quality reconstructions on both simulated and real electron microscope data, along with improved convergence properties compared to other methods.
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Submitted 22 December, 2015;
originally announced December 2015.
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A Dictionary Approach to EBSD Indexing
Authors:
Yu-Hui Chen,
Se Un Park,
Dennis Wei,
Gregory Newstadt,
Michael Jackson,
Jeff P. Simmons,
Marc De Graef,
Alfred O. Hero
Abstract:
We propose a framework for indexing of grain and sub-grain structures in electron backscatter diffraction (EBSD) images of polycrystalline materials. The framework is based on a previously introduced physics-based forward model by Callahan and De Graef (2013) relating measured patterns to grain orientations (Euler angle). The forward model is tuned to the microscope and the sample symmetry group.…
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We propose a framework for indexing of grain and sub-grain structures in electron backscatter diffraction (EBSD) images of polycrystalline materials. The framework is based on a previously introduced physics-based forward model by Callahan and De Graef (2013) relating measured patterns to grain orientations (Euler angle). The forward model is tuned to the microscope and the sample symmetry group. We discretize the domain of the forward model onto a dense grid of Euler angles and for each measured pattern we identify the most similar patterns in the dictionary. These patterns are used to identify boundaries, detect anomalies, and index crystal orientations. The statistical distribution of these closest matches is used in an unsupervised binary decision tree (DT) classifier to identify grain boundaries and anomalous regions. The DT classifies a pattern as an anomaly if it has an abnormally low similarity to any pattern in the dictionary. It classifies a pixel as being near a grain boundary if the highly ranked patterns in the dictionary differ significantly over the pixels 3x3 neighborhood. Indexing is accomplished by computing the mean orientation of the closest dictionary matches to each pattern. The mean orientation is estimated using a maximum likelihood approach that models the orientation distribution as a mixture of Von Mises-Fisher distributions over the quaternionic 3-sphere. The proposed dictionary matching approach permits segmentation, anomaly detection, and indexing to be performed in a unified manner with the additional benefit of uncertainty quantification. We demonstrate the proposed dictionary-based approach on a Ni-base IN100 alloy.
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Submitted 27 February, 2015; v1 submitted 26 February, 2015;
originally announced February 2015.
