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Showing 1–1 of 1 results for author: Shelley, T

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  1. arXiv:2406.07880  [pdf, other

    cs.CV eess.IV

    A Comprehensive Survey on Machine Learning Driven Material Defect Detection: Challenges, Solutions, and Future Prospects

    Authors: Jun Bai, Di Wu, Tristan Shelley, Peter Schubel, David Twine, John Russell, Xuesen Zeng, Ji Zhang

    Abstract: Material defects (MD) represent a primary challenge affecting product performance and giving rise to safety issues in related products. The rapid and accurate identification and localization of MD constitute crucial research endeavours in addressing contemporary challenges associated with MD. Although conventional non-destructive testing methods such as ultrasonic and X-ray approaches have mitigat… ▽ More

    Submitted 12 June, 2024; originally announced June 2024.