Data-driven Modeling in Metrology -- A Short Introduction, Current Developments and Future Perspectives
Authors:
Linda-Sophie Schneider,
Patrick Krauss,
Nadine Schiering,
Christopher Syben,
Richard Schielein,
Andreas Maier
Abstract:
Mathematical models are vital to the field of metrology, playing a key role in the derivation of measurement results and the calculation of uncertainties from measurement data, informed by an understanding of the measurement process. These models generally represent the correlation between the quantity being measured and all other pertinent quantities. Such relationships are used to construct meas…
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Mathematical models are vital to the field of metrology, playing a key role in the derivation of measurement results and the calculation of uncertainties from measurement data, informed by an understanding of the measurement process. These models generally represent the correlation between the quantity being measured and all other pertinent quantities. Such relationships are used to construct measurement systems that can interpret measurement data to generate conclusions and predictions about the measurement system itself. Classic models are typically analytical, built on fundamental physical principles. However, the rise of digital technology, expansive sensor networks, and high-performance computing hardware have led to a growing shift towards data-driven methodologies. This trend is especially prominent when dealing with large, intricate networked sensor systems in situations where there is limited expert understanding of the frequently changing real-world contexts. Here, we demonstrate the variety of opportunities that data-driven modeling presents, and how they have been already implemented in various real-world applications.
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Submitted 24 June, 2024;
originally announced June 2024.
Task-based Generation of Optimized Projection Sets using Differentiable Ranking
Authors:
Linda-Sophie Schneider,
Mareike Thies,
Christopher Syben,
Richard Schielein,
Mathias Unberath,
Andreas Maier
Abstract:
We present a method for selecting valuable projections in computed tomography (CT) scans to enhance image reconstruction and diagnosis. The approach integrates two important factors, projection-based detectability and data completeness, into a single feed-forward neural network. The network evaluates the value of projections, processes them through a differentiable ranking function and makes the f…
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We present a method for selecting valuable projections in computed tomography (CT) scans to enhance image reconstruction and diagnosis. The approach integrates two important factors, projection-based detectability and data completeness, into a single feed-forward neural network. The network evaluates the value of projections, processes them through a differentiable ranking function and makes the final selection using a straight-through estimator. Data completeness is ensured through the label provided during training. The approach eliminates the need for heuristically enforcing data completeness, which may exclude valuable projections. The method is evaluated on simulated data in a non-destructive testing scenario, where the aim is to maximize the reconstruction quality within a specified region of interest. We achieve comparable results to previous methods, laying the foundation for using reconstruction-based loss functions to learn the selection of projections.
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Submitted 21 March, 2023;
originally announced March 2023.