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ProAct: Progressive Training for Hybrid Clipped Activation Function to Enhance Resilience of DNNs
Authors:
Seyedhamidreza Mousavi,
Mohammad Hasan Ahmadilivani,
Jaan Raik,
Maksim Jenihhin,
Masoud Daneshtalab
Abstract:
Deep Neural Networks (DNNs) are extensively employed in safety-critical applications where ensuring hardware reliability is a primary concern. To enhance the reliability of DNNs against hardware faults, activation restriction techniques significantly mitigate the fault effects at the DNN structure level, irrespective of accelerator architectures. State-of-the-art methods offer either neuron-wise o…
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Deep Neural Networks (DNNs) are extensively employed in safety-critical applications where ensuring hardware reliability is a primary concern. To enhance the reliability of DNNs against hardware faults, activation restriction techniques significantly mitigate the fault effects at the DNN structure level, irrespective of accelerator architectures. State-of-the-art methods offer either neuron-wise or layer-wise clip** activation functions. They attempt to determine optimal clip** thresholds using heuristic and learning-based approaches. Layer-wise clipped activation functions cannot preserve DNNs resilience at high bit error rates. On the other hand, neuron-wise clip** activation functions introduce considerable memory overhead due to the addition of parameters, which increases their vulnerability to faults. Moreover, the heuristic-based optimization approach demands numerous fault injections during the search process, resulting in time-consuming threshold identification. On the other hand, learning-based techniques that train thresholds for entire layers concurrently often yield sub-optimal results. In this work, first, we demonstrate that it is not essential to incorporate neuron-wise activation functions throughout all layers in DNNs. Then, we propose a hybrid clipped activation function that integrates neuron-wise and layer-wise methods that apply neuron-wise clip** only in the last layer of DNNs. Additionally, to attain optimal thresholds in the clip** activation function, we introduce ProAct, a progressive training methodology. This approach iteratively trains the thresholds on a layer-by-layer basis, aiming to obtain optimal threshold values in each layer separately.
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Submitted 10 June, 2024;
originally announced June 2024.
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Cost-Effective Fault Tolerance for CNNs Using Parameter Vulnerability Based Hardening and Pruning
Authors:
Mohammad Hasan Ahmadilivani,
Seyedhamidreza Mousavi,
Jaan Raik,
Masoud Daneshtalab,
Maksim Jenihhin
Abstract:
Convolutional Neural Networks (CNNs) have become integral in safety-critical applications, thus raising concerns about their fault tolerance. Conventional hardware-dependent fault tolerance methods, such as Triple Modular Redundancy (TMR), are computationally expensive, imposing a remarkable overhead on CNNs. Whereas fault tolerance techniques can be applied either at the hardware level or at the…
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Convolutional Neural Networks (CNNs) have become integral in safety-critical applications, thus raising concerns about their fault tolerance. Conventional hardware-dependent fault tolerance methods, such as Triple Modular Redundancy (TMR), are computationally expensive, imposing a remarkable overhead on CNNs. Whereas fault tolerance techniques can be applied either at the hardware level or at the model levels, the latter provides more flexibility without sacrificing generality. This paper introduces a model-level hardening approach for CNNs by integrating error correction directly into the neural networks. The approach is hardware-agnostic and does not require any changes to the underlying accelerator device. Analyzing the vulnerability of parameters enables the duplication of selective filters/neurons so that their output channels are effectively corrected with an efficient and robust correction layer. The proposed method demonstrates fault resilience nearly equivalent to TMR-based correction but with significantly reduced overhead. Nevertheless, there exists an inherent overhead to the baseline CNNs. To tackle this issue, a cost-effective parameter vulnerability based pruning technique is proposed that outperforms the conventional pruning method, yielding smaller networks with a negligible accuracy loss. Remarkably, the hardened pruned CNNs perform up to 24\% faster than the hardened un-pruned ones.
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Submitted 17 May, 2024;
originally announced May 2024.
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SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators
Authors:
Mahdi Taheri,
Masoud Daneshtalab,
Jaan Raik,
Maksim Jenihhin,
Salvatore Pappalardo,
Paul Jimenez,
Bastien Deveautour,
Alberto Bosio
Abstract:
Systolic array has emerged as a prominent architecture for Deep Neural Network (DNN) hardware accelerators, providing high-throughput and low-latency performance essential for deploying DNNs across diverse applications. However, when used in safety-critical applications, reliability assessment is mandatory to guarantee the correct behavior of DNN accelerators. While fault injection stands out as a…
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Systolic array has emerged as a prominent architecture for Deep Neural Network (DNN) hardware accelerators, providing high-throughput and low-latency performance essential for deploying DNNs across diverse applications. However, when used in safety-critical applications, reliability assessment is mandatory to guarantee the correct behavior of DNN accelerators. While fault injection stands out as a well-established practical and robust method for reliability assessment, it is still a very time-consuming process. This paper addresses the time efficiency issue by introducing a novel hierarchical software-based hardware-aware fault injection strategy tailored for systolic array-based DNN accelerators.
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Submitted 5 March, 2024;
originally announced March 2024.
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AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators
Authors:
Mahdi Taheri,
Natalia Cherezova,
Samira Nazari,
Ahsan Rafiq,
Ali Azarpeyvand,
Tara Ghasempouri,
Masoud Daneshtalab,
Jaan Raik,
Maksim Jenihhin
Abstract:
In this paper, we propose an architecture of a novel adaptive fault-tolerant approximate multiplier tailored for ASIC-based DNN accelerators.
In this paper, we propose an architecture of a novel adaptive fault-tolerant approximate multiplier tailored for ASIC-based DNN accelerators.
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Submitted 5 March, 2024;
originally announced March 2024.
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Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
Authors:
Mahdi Taheri,
Natalia Cherezova,
Mohammad Saeed Ansari,
Maksim Jenihhin,
Ali Mahani,
Masoud Daneshtalab,
Jaan Raik
Abstract:
The stringent requirements for the Deep Neural Networks (DNNs) accelerator's reliability stand along with the need for reducing the computational burden on the hardware platforms, i.e. reducing the energy consumption and execution time as well as increasing the efficiency of DNN accelerators. Moreover, the growing demand for specialized DNN accelerators with tailored requirements, particularly for…
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The stringent requirements for the Deep Neural Networks (DNNs) accelerator's reliability stand along with the need for reducing the computational burden on the hardware platforms, i.e. reducing the energy consumption and execution time as well as increasing the efficiency of DNN accelerators. Moreover, the growing demand for specialized DNN accelerators with tailored requirements, particularly for safety-critical applications, necessitates a comprehensive design space exploration to enable the development of efficient and robust accelerators that meet those requirements. Therefore, the trade-off between hardware performance, i.e. area and delay, and the reliability of the DNN accelerator implementation becomes critical and requires tools for analysis. This paper presents a comprehensive methodology for exploring and enabling a holistic assessment of the trilateral impact of quantization on model accuracy, activation fault reliability, and hardware efficiency. A fully automated framework is introduced that is capable of applying various quantization-aware techniques, fault injection, and hardware implementation, thus enabling the measurement of hardware parameters. Moreover, this paper proposes a novel lightweight protection technique integrated within the framework to ensure the dependable deployment of the final systolic-array-based FPGA implementation. The experiments on established benchmarks demonstrate the analysis flow and the profound implications of quantization on reliability, hardware performance, and network accuracy, particularly concerning the transient faults in the network's activations.
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Submitted 17 January, 2024;
originally announced January 2024.
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Enhancing Fault Resilience of QNNs by Selective Neuron Splitting
Authors:
Mohammad Hasan Ahmadilivani,
Mahdi Taheri,
Jaan Raik,
Masoud Daneshtalab,
Maksim Jenihhin
Abstract:
The superior performance of Deep Neural Networks (DNNs) has led to their application in various aspects of human life. Safety-critical applications are no exception and impose rigorous reliability requirements on DNNs. Quantized Neural Networks (QNNs) have emerged to tackle the complexity of DNN accelerators, however, they are more prone to reliability issues.
In this paper, a recent analytical…
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The superior performance of Deep Neural Networks (DNNs) has led to their application in various aspects of human life. Safety-critical applications are no exception and impose rigorous reliability requirements on DNNs. Quantized Neural Networks (QNNs) have emerged to tackle the complexity of DNN accelerators, however, they are more prone to reliability issues.
In this paper, a recent analytical resilience assessment method is adapted for QNNs to identify critical neurons based on a Neuron Vulnerability Factor (NVF). Thereafter, a novel method for splitting the critical neurons is proposed that enables the design of a Lightweight Correction Unit (LCU) in the accelerator without redesigning its computational part.
The method is validated by experiments on different QNNs and datasets. The results demonstrate that the proposed method for correcting the faults has a twice smaller overhead than a selective Triple Modular Redundancy (TMR) while achieving a similar level of fault resiliency.
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Submitted 16 June, 2023;
originally announced June 2023.
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Special Session: Approximation and Fault Resiliency of DNN Accelerators
Authors:
Mohammad Hasan Ahmadilivani,
Mario Barbareschi,
Salvatore Barone,
Alberto Bosio,
Masoud Daneshtalab,
Salvatore Della Torca,
Gabriele Gavarini,
Maksim Jenihhin,
Jaan Raik,
Annachiara Ruospo,
Ernesto Sanchez,
Mahdi Taheri
Abstract:
Deep Learning, and in particular, Deep Neural Network (DNN) is nowadays widely used in many scenarios, including safety-critical applications such as autonomous driving. In this context, besides energy efficiency and performance, reliability plays a crucial role since a system failure can jeopardize human life. As with any other device, the reliability of hardware architectures running DNNs has to…
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Deep Learning, and in particular, Deep Neural Network (DNN) is nowadays widely used in many scenarios, including safety-critical applications such as autonomous driving. In this context, besides energy efficiency and performance, reliability plays a crucial role since a system failure can jeopardize human life. As with any other device, the reliability of hardware architectures running DNNs has to be evaluated, usually through costly fault injection campaigns. This paper explores the approximation and fault resiliency of DNN accelerators. We propose to use approximate (AxC) arithmetic circuits to agilely emulate errors in hardware without performing fault injection on the DNN. To allow fast evaluation of AxC DNN, we developed an efficient GPU-based simulation framework. Further, we propose a fine-grain analysis of fault resiliency by examining fault propagation and masking in networks
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Submitted 31 May, 2023;
originally announced June 2023.
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APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors
Authors:
Mahdi Taheri,
Mohammad Hasan Ahmadilivani,
Maksim Jenihhin,
Masoud Daneshtalab,
Jaan Raik
Abstract:
Nowadays, the extensive exploitation of Deep Neural Networks (DNNs) in safety-critical applications raises new reliability concerns. In practice, methods for fault injection by emulation in hardware are efficient and widely used to study the resilience of DNN architectures for mitigating reliability issues already at the early design stages. However, the state-of-the-art methods for fault injectio…
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Nowadays, the extensive exploitation of Deep Neural Networks (DNNs) in safety-critical applications raises new reliability concerns. In practice, methods for fault injection by emulation in hardware are efficient and widely used to study the resilience of DNN architectures for mitigating reliability issues already at the early design stages. However, the state-of-the-art methods for fault injection by emulation incur a spectrum of time-, design- and control-complexity problems. To overcome these issues, a novel resiliency assessment method called APPRAISER is proposed that applies functional approximation for a non-conventional purpose and employs approximate computing errors for its interest. By adopting this concept in the resiliency assessment domain, APPRAISER provides thousands of times speed-up in the assessment process, while kee** high accuracy of the analysis. In this paper, APPRAISER is validated by comparing it with state-of-the-art approaches for fault injection by emulation in FPGA. By this, the feasibility of the idea is demonstrated, and a new perspective in resiliency evaluation for DNNs is opened.
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Submitted 31 May, 2023;
originally announced May 2023.
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A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks
Authors:
Mohammad Hasan Ahmadilivani,
Mahdi Taheri,
Jaan Raik,
Masoud Daneshtalab,
Maksim Jenihhin
Abstract:
Artificial Intelligence (AI) and, in particular, Machine Learning (ML) have emerged to be utilized in various applications due to their capability to learn how to solve complex problems. Over the last decade, rapid advances in ML have presented Deep Neural Networks (DNNs) consisting of a large number of neurons and layers. DNN Hardware Accelerators (DHAs) are leveraged to deploy DNNs in the target…
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Artificial Intelligence (AI) and, in particular, Machine Learning (ML) have emerged to be utilized in various applications due to their capability to learn how to solve complex problems. Over the last decade, rapid advances in ML have presented Deep Neural Networks (DNNs) consisting of a large number of neurons and layers. DNN Hardware Accelerators (DHAs) are leveraged to deploy DNNs in the target applications. Safety-critical applications, where hardware faults/errors would result in catastrophic consequences, also benefit from DHAs. Therefore, the reliability of DNNs is an essential subject of research. In recent years, several studies have been published accordingly to assess the reliability of DNNs. In this regard, various reliability assessment methods have been proposed on a variety of platforms and applications. Hence, there is a need to summarize the state of the art to identify the gaps in the study of the reliability of DNNs. In this work, we conduct a Systematic Literature Review (SLR) on the reliability assessment methods of DNNs to collect relevant research works as much as possible, present a categorization of them, and address the open challenges. Through this SLR, three kinds of methods for reliability assessment of DNNs are identified including Fault Injection (FI), Analytical, and Hybrid methods. Since the majority of works assess the DNN reliability by FI, we characterize different approaches and platforms of the FI method comprehensively. Moreover, Analytical and Hybrid methods are propounded. Thus, different reliability assessment methods for DNNs have been elaborated on their conducted DNN platforms and reliability evaluation metrics. Finally, we highlight the advantages and disadvantages of the identified methods and address the open challenges in the research area.
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Submitted 9 May, 2023;
originally announced May 2023.
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DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators
Authors:
Mahdi Taheri,
Mohammad Riazati,
Mohammad Hasan Ahmadilivani,
Maksim Jenihhin,
Masoud Daneshtalab,
Jaan Raik,
Mikael Sjodin,
Bjorn Lisper
Abstract:
While the role of Deep Neural Networks (DNNs) in a wide range of safety-critical applications is expanding, emerging DNNs experience massive growth in terms of computation power. It raises the necessity of improving the reliability of DNN accelerators yet reducing the computational burden on the hardware platforms, i.e. reducing the energy consumption and execution time as well as increasing the e…
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While the role of Deep Neural Networks (DNNs) in a wide range of safety-critical applications is expanding, emerging DNNs experience massive growth in terms of computation power. It raises the necessity of improving the reliability of DNN accelerators yet reducing the computational burden on the hardware platforms, i.e. reducing the energy consumption and execution time as well as increasing the efficiency of DNN accelerators. Therefore, the trade-off between hardware performance, i.e. area, power and delay, and the reliability of the DNN accelerator implementation becomes critical and requires tools for analysis. In this paper, we propose a framework DeepAxe for design space exploration for FPGA-based implementation of DNNs by considering the trilateral impact of applying functional approximation on accuracy, reliability and hardware performance. The framework enables selective approximation of reliability-critical DNNs, providing a set of Pareto-optimal DNN implementation design space points for the target resource utilization requirements. The design flow starts with a pre-trained network in Keras, uses an innovative high-level synthesis environment DeepHLS and results in a set of Pareto-optimal design space points as a guide for the designer. The framework is demonstrated in a case study of custom and state-of-the-art DNNs and datasets.
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Submitted 14 March, 2023;
originally announced March 2023.
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DeepVigor: Vulnerability Value Ranges and Factors for DNNs' Reliability Assessment
Authors:
Mohammad Hasan Ahmadilivani,
Mahdi Taheri,
Jaan Raik,
Masoud Daneshtalab,
Maksim Jenihhin
Abstract:
Deep Neural Networks (DNNs) and their accelerators are being deployed ever more frequently in safety-critical applications leading to increasing reliability concerns. A traditional and accurate method for assessing DNNs' reliability has been resorting to fault injection, which, however, suffers from prohibitive time complexity. While analytical and hybrid fault injection-/analytical-based methods…
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Deep Neural Networks (DNNs) and their accelerators are being deployed ever more frequently in safety-critical applications leading to increasing reliability concerns. A traditional and accurate method for assessing DNNs' reliability has been resorting to fault injection, which, however, suffers from prohibitive time complexity. While analytical and hybrid fault injection-/analytical-based methods have been proposed, they are either inaccurate or specific to particular accelerator architectures. In this work, we propose a novel accurate, fine-grain, metric-oriented, and accelerator-agnostic method called DeepVigor that provides vulnerability value ranges for DNN neurons' outputs. An outcome of DeepVigor is an analytical model representing vulnerable and non-vulnerable ranges for each neuron that can be exploited to develop different techniques for improving DNNs' reliability. Moreover, DeepVigor provides reliability assessment metrics based on vulnerability factors for bits, neurons, and layers using the vulnerability ranges. The proposed method is not only faster than fault injection but also provides extensive and accurate information about the reliability of DNNs, independent from the accelerator. The experimental evaluations in the paper indicate that the proposed vulnerability ranges are 99.9% to 100% accurate even when evaluated on previously unseen test data. Also, it is shown that the obtained vulnerability factors represent the criticality of bits, neurons, and layers proficiently. DeepVigor is implemented in the PyTorch framework and validated on complex DNN benchmarks.
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Submitted 13 March, 2023;
originally announced March 2023.
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Hybrid Protection of Digital FIR Filters
Authors:
Levent Aksoy,
Quang-Linh Nguyen,
Felipe Almeida,
Jaan Raik,
Marie-Lise Flottes,
Sophie Dupuis,
Samuel Pagliarini
Abstract:
A digital Finite Impulse Response (FIR) filter is a ubiquitous block in digital signal processing applications and its behavior is determined by its coefficients. To protect filter coefficients from an adversary, efficient obfuscation techniques have been proposed, either by hiding them behind decoys or replacing them by key bits. In this article, we initially introduce a query attack that can dis…
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A digital Finite Impulse Response (FIR) filter is a ubiquitous block in digital signal processing applications and its behavior is determined by its coefficients. To protect filter coefficients from an adversary, efficient obfuscation techniques have been proposed, either by hiding them behind decoys or replacing them by key bits. In this article, we initially introduce a query attack that can discover the secret key of such obfuscated FIR filters, which could not be broken by existing prominent attacks. Then, we propose a first of its kind hybrid technique, including both hardware obfuscation and logic locking using a point function for the protection of parallel direct and transposed forms of digital FIR filters. Experimental results show that the hybrid protection technique can lead to FIR filters with higher security while maintaining the hardware complexity competitive or superior to those locked by prominent logic locking methods. It is also shown that the protected multiplier blocks and FIR filters are resilient to existing attacks. The results on different forms and realizations of FIR filters show that the parallel direct form FIR filter has a promising potential for a secure design.
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Submitted 26 January, 2023;
originally announced January 2023.
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Survey on Architectural Attacks: A Unified Classification and Attack Model
Authors:
Tara Ghasempouri,
Jaan Raik,
Cezar Reinbrecht,
Said Hamdioui,
Mottaqiallah Taouil
Abstract:
According to the World Economic Forum, cyber attacks are considered as one of the most important sources of risk to companies and institutions worldwide. Attacks can target the network, software, and/or hardware. During the past years, much knowledge has been developed to understand and mitigate cyberattacks. However, new threats have appeared in recent years regarding software attacks that exploi…
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According to the World Economic Forum, cyber attacks are considered as one of the most important sources of risk to companies and institutions worldwide. Attacks can target the network, software, and/or hardware. During the past years, much knowledge has been developed to understand and mitigate cyberattacks. However, new threats have appeared in recent years regarding software attacks that exploit hardware vulnerabilities. We define these attacks as architectural attacks. Today, both industry and academy have only limited comprehension of architectural attacks, which represents a critical issue for the design of future systems. To this end, this work proposes a new taxonomy, a new attack model, and a complete survey of existing architectural attacks. As a result, our study provides the tools to understand the Architectural Attacks deeply and start building better designs as well as protection mechanisms.
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Submitted 30 August, 2022;
originally announced August 2022.
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Design Space Exploration of SABER in 65nm ASIC
Authors:
Malik Imran,
Felipe Almeida,
Jaan Raik,
Andrea Basso,
Sujoy Sinha Roy,
Samuel Pagliarini
Abstract:
This paper presents a design space exploration for SABER, one of the finalists in NIST's quantum-resistant public-key cryptographic standardization effort. Our design space exploration targets a 65nm ASIC platform and has resulted in the evaluation of 6 different architectures. Our exploration is initiated by setting a baseline architecture which is ported from FPGA. In order to improve the clock…
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This paper presents a design space exploration for SABER, one of the finalists in NIST's quantum-resistant public-key cryptographic standardization effort. Our design space exploration targets a 65nm ASIC platform and has resulted in the evaluation of 6 different architectures. Our exploration is initiated by setting a baseline architecture which is ported from FPGA. In order to improve the clock frequency (the primary goal in our exploration), we have employed several optimizations: (i) use of compiled memories in a 'smart synthesis' fashion, (ii) pipelining, and (iii) logic sharing between SABER building blocks. The most optimized architecture utilizes four register files, achieves a remarkable clock frequency of 1GHz while only requiring an area of 0.314mm2. Moreover, physical synthesis is carried out for this architecture and a tapeout-ready layout is presented. The estimated dynamic power consumption of the high-frequency architecture is approximately 184mW for key generation and 187mW for encapsulation or decapsulation operations. These results strongly suggest that our optimized accelerator architecture is well suited for high-speed cryptographic applications.
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Submitted 16 September, 2021;
originally announced September 2021.
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High-level Intellectual Property Obfuscation via Decoy Constants
Authors:
Levent Aksoy,
Quang-Linh Nguyen,
Felipe Almeida,
Jaan Raik,
Marie-Lise Flottes,
Sophie Dupuis,
Samuel Pagliarini
Abstract:
This paper presents a high-level circuit obfuscation technique to prevent the theft of intellectual property (IP) of integrated circuits. In particular, our technique protects a class of circuits that relies on constant multiplications, such as filters and neural networks, where the constants themselves are the IP to be protected. By making use of decoy constants and a key-based scheme, a reverse…
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This paper presents a high-level circuit obfuscation technique to prevent the theft of intellectual property (IP) of integrated circuits. In particular, our technique protects a class of circuits that relies on constant multiplications, such as filters and neural networks, where the constants themselves are the IP to be protected. By making use of decoy constants and a key-based scheme, a reverse engineer adversary at an untrusted foundry is rendered incapable of discerning true constants from decoy constants. The time-multiplexed constant multiplication (TMCM) block of such circuits, which realizes the multiplication of an input variable by a constant at a time, is considered as our case study for obfuscation. Furthermore, two TMCM design architectures are taken into account; an implementation using a multiplier and a multiplierless shift-adds implementation. Optimization methods are also applied to reduce the hardware complexity of these architectures. The well-known satisfiability (SAT) and automatic test pattern generation (ATPG) attacks are used to determine the vulnerability of the obfuscated designs. It is observed that the proposed technique incurs small overheads in area, power, and delay that are comparable to the hardware complexity of prominent logic locking methods. Yet, the advantage of our approach is in the insight that constants -- instead of arbitrary circuit nodes -- become key-protected.
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Submitted 13 May, 2021;
originally announced May 2021.
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Side-Channel Attacks on Triple Modular Redundancy Schemes
Authors:
Felipe Almeida,
Levent Aksoy,
Jaan Raik,
Samuel Pagliarini
Abstract:
The interplay between security and reliability is poorly understood. This paper shows how triple modular redundancy affects a side-channel attack (SCA). Our counterintuitive findings show that modular redundancy can increase SCA resiliency.
The interplay between security and reliability is poorly understood. This paper shows how triple modular redundancy affects a side-channel attack (SCA). Our counterintuitive findings show that modular redundancy can increase SCA resiliency.
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Submitted 6 September, 2021; v1 submitted 9 April, 2021;
originally announced April 2021.
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New categories of Safe Faults in a processor-based Embedded System
Authors:
C. C. Gursoy,
M. Jenihhin,
A. S. Oyeniran,
D. Piumatti,
J. Raik,
M. Sonza Reorda,
R. Ubar
Abstract:
The identification of safe faults (i.e., faults which are guaranteed not to produce any failure) in an electronic system is a crucial step when analyzing its dependability and its test plan development. Unfortunately, safe fault identification is poorly supported by available EDA tools, and thus remains an open problem. The complexity growth of modern systems used in safety-critical applications f…
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The identification of safe faults (i.e., faults which are guaranteed not to produce any failure) in an electronic system is a crucial step when analyzing its dependability and its test plan development. Unfortunately, safe fault identification is poorly supported by available EDA tools, and thus remains an open problem. The complexity growth of modern systems used in safety-critical applications further complicates their identification. In this article, we identify some classes of safe faults within an embedded system based on a pipelined processor. A new method for automating the safe fault identification is also proposed. The safe faults belonging to each class are identified resorting to Automatic Test Pattern Generation (ATPG) techniques. The proposed methodology is applied to a sample system built around the OpenRisc1200 open source processor.
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Submitted 24 September, 2020;
originally announced September 2020.
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PASCAL: Timing SCA Resistant Design and Verification Flow
Authors:
Xinhui Lai,
Maksim Jenihhin,
Jaan Raik,
Kolin Paul
Abstract:
A large number of crypto accelerators are being deployed with the widespread adoption of IoT. It is vitally important that these accelerators and other security hardware IPs are provably secure. Security is an extra functional requirement and hence many security verification tools are not mature. We propose an approach/flow-PASCAL-that works on RTL designs and discovers potential Timing Side-Chann…
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A large number of crypto accelerators are being deployed with the widespread adoption of IoT. It is vitally important that these accelerators and other security hardware IPs are provably secure. Security is an extra functional requirement and hence many security verification tools are not mature. We propose an approach/flow-PASCAL-that works on RTL designs and discovers potential Timing Side-Channel Attack(SCA) vulnerabilities in them. Based on information flow analysis, this is able to identify Timing Disparate Security Paths that could lead to information leakage. This flow also (automatically) eliminates the information leakage caused by the timing channel. The insertion of a lightweight Compensator Block as balancing or compliance FSM removes the timing channel with minimum modifications to the design with no impact on the clock cycle time or combinational delay of the critical path in the circuit.
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Submitted 19 August, 2020; v1 submitted 25 February, 2020;
originally announced February 2020.
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Efficient Fault Injection based on Dynamic HDL Slicing Technique
Authors:
Ahmet Cagri Bagbaba,
Maksim Jenihhin,
Jaan Raik,
Christian Sauer
Abstract:
This work proposes a fault injection methodology where Hardware Description Language (HDL) code slicing is exploited to prune fault injection locations, thus enabling more efficient campaigns for safety mechanisms evaluation. In particular, the dynamic HDL slicing technique provides for a highly collapsed critical fault list and allows avoiding injections at redundant locations or time-steps. Expe…
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This work proposes a fault injection methodology where Hardware Description Language (HDL) code slicing is exploited to prune fault injection locations, thus enabling more efficient campaigns for safety mechanisms evaluation. In particular, the dynamic HDL slicing technique provides for a highly collapsed critical fault list and allows avoiding injections at redundant locations or time-steps. Experimental results show that the proposed methodology integrated into commercial tool flow doubles the simulation speed when comparing to the state-of-the-art industrial-grade EDA tool flows.
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Submitted 24 January, 2020;
originally announced February 2020.
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Accelerating Transient Fault Injection Campaigns by using Dynamic HDL Slicing
Authors:
Ahmet Cagri Bagbaba,
Maksim Jenihhin,
Jaan Raik,
Christian Sauer
Abstract:
Along with the complexity of electronic systems for safety-critical applications, the cost of safety mechanisms evaluation by fault injection simulation is rapidly going up. To reduce these efforts, we propose a fault injection methodology where Hardware Description Language (HDL) code slicing is exploited to accelerate transient fault injection campaigns by pruning fault lists and reducing the nu…
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Along with the complexity of electronic systems for safety-critical applications, the cost of safety mechanisms evaluation by fault injection simulation is rapidly going up. To reduce these efforts, we propose a fault injection methodology where Hardware Description Language (HDL) code slicing is exploited to accelerate transient fault injection campaigns by pruning fault lists and reducing the number of the injections. In particular, the dynamic HDL slicing technique provides for a critical fault list and allows avoiding injections at non-critical time-steps. Experimental results on an industrial core show that the proposed methodology can successfully reduce the number of injections by up to 10 percent and speed-up the fault injection campaigns.
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Submitted 24 January, 2020;
originally announced January 2020.
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RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems
Authors:
Maksim Jenihhin,
Said Hamdioui,
Matteo Sonza Reorda,
Milos Krstic,
Peter Langendoerfer,
Christian Sauer,
Anton Klotz,
Michael Huebner,
Joerg Nolte,
Heinrich Theodor Vierhaus,
Georgios Selimis,
Dan Alexandrescu,
Mottaqiallah Taouil,
Geert-Jan Schrijen,
Jaan Raik,
Luca Sterpone,
Giovanni Squillero,
Zoya Dyka
Abstract:
The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical world. These set tough requirements on mutually dependent extra-functional design aspects. The H2020 MSC…
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The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical world. These set tough requirements on mutually dependent extra-functional design aspects. The H2020 MSCA ITN project RESCUE is focused on key challenges for reliability, security and quality, as well as related electronic design automation tools and methodologies. The objectives include both research advancements and cross-sectoral training of a new generation of interdisciplinary researchers. Notable interdisciplinary collaborative research results for the first half-period include novel approaches for test generation, soft-error and transient faults vulnerability analysis, cross-layer fault-tolerance and error-resilience, functional safety validation, reliability assessment and run-time management, HW security enhancement and initial implementation of these into holistic EDA tools.
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Submitted 29 November, 2019;
originally announced December 2019.
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Overview of Fault Tolerant Techniques in Underwater Sensor Networks
Authors:
Lauri Vihman,
Maarja Kruusmaa,
Jaan Raik
Abstract:
Sensor networks provide services to a broad range of applications ranging from intelligence service surveillance to weather forecasting. Most of the sensor networks are terrestrial, however much of our planet is covered by water and Underwater Sensor Networks (USN) are an emerging research area. One of the unavoidable increasing challenge for modern technology is tolerating faults - accepting that…
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Sensor networks provide services to a broad range of applications ranging from intelligence service surveillance to weather forecasting. Most of the sensor networks are terrestrial, however much of our planet is covered by water and Underwater Sensor Networks (USN) are an emerging research area. One of the unavoidable increasing challenge for modern technology is tolerating faults - accepting that hardware is imperfect and cope with it. Fault tolerance may have more impact underwater than in terrestrial environment as terrestrial environment is more forgiving, reaching the malfunctioning devices for replacement underwater is harder and may be more costly. Current paper is the first to investigate fault tolerance, particularly cross layer fault tolerance, in USN-s.
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Submitted 2 October, 2019;
originally announced October 2019.
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High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors
Authors:
Adeboye Stephen Oyeniran,
Raimund Ubar,
Maksim Jenihhin,
Cemil Cem Gürsoy,
Jaan Raik
Abstract:
Recent safety standards set stringent requirements for the target fault coverage in embedded microprocessors, with the objective to guarantee robustness and functional safety of the critical electronic systems. This motivates the need for improving the quality of test generation for microprocessors. A new high-level implementation-independent test generation method for RISC processors is proposed.…
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Recent safety standards set stringent requirements for the target fault coverage in embedded microprocessors, with the objective to guarantee robustness and functional safety of the critical electronic systems. This motivates the need for improving the quality of test generation for microprocessors. A new high-level implementation-independent test generation method for RISC processors is proposed. The set of instructions of the processor is partitioned nto groups. For each group, a dedicated test template is created, to be used for generating two test programs, for testing the control and the data paths respectively. For testing the control part, a novel high-level control fault model is proposed. Using this model, a set of deterministic test data operands are generated for each instruction of the given group. The advantage of the high-level fault model is that it covers larger than SAF fault class including multiple fault coverage in the control part. For generating the data path test, pseudoexhaustive data operands are used. We investigated the feasibility of the approach and demonstrated high efficiency of the generated test programs for testing the execute module of the miniMIPS RISC processor.
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Submitted 8 August, 2019;
originally announced August 2019.
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Towards Multidimensional Verification: Where Functional Meets Non-Functional
Authors:
Maksim Jenihhin,
Xinhui Lai,
Tara Ghasempouri,
Jaan Raik
Abstract:
Trends in advanced electronic systems' design have a notable impact on design verification technologies. The recent paradigms of Internet-of-Things (IoT) and Cyber-Physical Systems (CPS) assume devices immersed in physical environments, significantly constrained in resources and expected to provide levels of security, privacy, reliability, performance and low power features. In recent years, numer…
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Trends in advanced electronic systems' design have a notable impact on design verification technologies. The recent paradigms of Internet-of-Things (IoT) and Cyber-Physical Systems (CPS) assume devices immersed in physical environments, significantly constrained in resources and expected to provide levels of security, privacy, reliability, performance and low power features. In recent years, numerous extra-functional aspects of electronic systems were brought to the front and imply verification of hardware design models in multidimensional space along with the functional concerns of the target system. However, different from the software domain such a holistic approach remains underdeveloped. The contributions of this paper are a taxonomy for multidimensional hardware verification aspects, a state-of-the-art survey of related research works and trends towards the multidimensional verification concept. The concept is motivated by an example for the functional and power verification dimensions.
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Submitted 1 August, 2019;
originally announced August 2019.
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Mixed-level identification of fault redundancy in microprocessors
Authors:
Adeboye Stephen Oyeniran,
Raimund Ubar,
Maksim Jenihhin,
Cemil Cem Gursoy,
Jaan Raik
Abstract:
A new high-level implementation independent functional fault model for control faults in microprocessors is introduced. The fault model is based on the instruction set, and is specified as a set of data constraints to be satisfied by test data generation. We show that the high-level test, which satisfies these data constraints, will be sufficient to guarantee the detection of all non-redundant low…
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A new high-level implementation independent functional fault model for control faults in microprocessors is introduced. The fault model is based on the instruction set, and is specified as a set of data constraints to be satisfied by test data generation. We show that the high-level test, which satisfies these data constraints, will be sufficient to guarantee the detection of all non-redundant low level faults. The paper proposes a simple and fast simulation based method of generating test data, which satisfy the constraints prescribed by the proposed fault model, and a method of evaluating the high-level control fault coverage for the proposed fault model and for the given test. A method is presented for identification of the high-level redundant faults, and it is shown that a test, which provides 100% coverage of non-redundant high-level faults, will also guarantee 100% non-redundant SAF coverage, whereas all gate-level SAF not covered by the test are identified as redundant. Experimental results of test generation for the execution part of a microprocessor support the results presented in the paper.
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Submitted 29 July, 2019;
originally announced July 2019.
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Holistic Approach for Fault-Tolerant Network-on-Chip based Many-Core Systems
Authors:
Siavoosh Payandeh Azad,
Behrad Niazmand,
Jaan Raik,
Gert Jervan,
Thomas Hollstein
Abstract:
In this paper we describe a holistic approach for Fault-Tolerant Network-on-Chip (NoC) based many-core systems that incorporates a System Health Monitoring Unit (SHMU) which collects all the fault information from the system, classifies them and provides different solutions for different fault classes. A Mapper/Scheduler Unit (MSU) is used for online generation of different map** and scheduling…
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In this paper we describe a holistic approach for Fault-Tolerant Network-on-Chip (NoC) based many-core systems that incorporates a System Health Monitoring Unit (SHMU) which collects all the fault information from the system, classifies them and provides different solutions for different fault classes. A Mapper/Scheduler Unit (MSU) is used for online generation of different map** and scheduling solutions based on the current fault configuration of the system. For detection of faults, we have leveraged concurrent online checkers, able to capture faults with low detection latency and providing the fault information for SHMU, which can be later used for the recovery process. The experimentation setup is performed in an open source tool, able to perform the map**, scheduling and simulation of the system.
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Submitted 26 January, 2016;
originally announced January 2016.
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Evolutionary Approach to Test Generation for Functional BIST
Authors:
Y. A. Skobtsov,
D. E. Ivanov,
V. Y. Skobtsov,
R. Ubar,
J. Raik
Abstract:
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the device's microprogram to test its logic, providing an observation structure to the system, and generating appropriate test data for the given architecture. Two methods of deriving a deterministic test set at functional level…
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In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the device's microprogram to test its logic, providing an observation structure to the system, and generating appropriate test data for the given architecture. Two methods of deriving a deterministic test set at functional level are suggested. The first method is based on the classical genetic algorithm with binary and arithmetic crossover and mutation operators. The second one uses genetic programming, where test is represented as a sequence of microoperations. In the latter case, we apply two-point crossover based on exchanging test subsequences and mutation implemented as random replacement of microoperations or operands. Experimental data of the program realization showing the efficiency of the proposed methods are presented.
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Submitted 31 July, 2010;
originally announced August 2010.