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Showing 1–27 of 27 results for author: Raik, J

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  1. arXiv:2406.06313  [pdf, other

    cs.LG

    ProAct: Progressive Training for Hybrid Clipped Activation Function to Enhance Resilience of DNNs

    Authors: Seyedhamidreza Mousavi, Mohammad Hasan Ahmadilivani, Jaan Raik, Maksim Jenihhin, Masoud Daneshtalab

    Abstract: Deep Neural Networks (DNNs) are extensively employed in safety-critical applications where ensuring hardware reliability is a primary concern. To enhance the reliability of DNNs against hardware faults, activation restriction techniques significantly mitigate the fault effects at the DNN structure level, irrespective of accelerator architectures. State-of-the-art methods offer either neuron-wise o… ▽ More

    Submitted 10 June, 2024; originally announced June 2024.

  2. arXiv:2405.10658  [pdf, other

    cs.LG

    Cost-Effective Fault Tolerance for CNNs Using Parameter Vulnerability Based Hardening and Pruning

    Authors: Mohammad Hasan Ahmadilivani, Seyedhamidreza Mousavi, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin

    Abstract: Convolutional Neural Networks (CNNs) have become integral in safety-critical applications, thus raising concerns about their fault tolerance. Conventional hardware-dependent fault tolerance methods, such as Triple Modular Redundancy (TMR), are computationally expensive, imposing a remarkable overhead on CNNs. Whereas fault tolerance techniques can be applied either at the hardware level or at the… ▽ More

    Submitted 17 May, 2024; originally announced May 2024.

    Comments: 7 pages, 7 figures, 2 tables, 32 references, the paper is accepted at IOLTS 2024

  3. arXiv:2403.02946  [pdf, other

    cs.AI cs.AR cs.LG

    SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators

    Authors: Mahdi Taheri, Masoud Daneshtalab, Jaan Raik, Maksim Jenihhin, Salvatore Pappalardo, Paul Jimenez, Bastien Deveautour, Alberto Bosio

    Abstract: Systolic array has emerged as a prominent architecture for Deep Neural Network (DNN) hardware accelerators, providing high-throughput and low-latency performance essential for deploying DNNs across diverse applications. However, when used in safety-critical applications, reliability assessment is mandatory to guarantee the correct behavior of DNN accelerators. While fault injection stands out as a… ▽ More

    Submitted 5 March, 2024; originally announced March 2024.

  4. arXiv:2403.02936  [pdf, other

    cs.AI cs.AR cs.LG

    AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators

    Authors: Mahdi Taheri, Natalia Cherezova, Samira Nazari, Ahsan Rafiq, Ali Azarpeyvand, Tara Ghasempouri, Masoud Daneshtalab, Jaan Raik, Maksim Jenihhin

    Abstract: In this paper, we propose an architecture of a novel adaptive fault-tolerant approximate multiplier tailored for ASIC-based DNN accelerators.

    Submitted 5 March, 2024; originally announced March 2024.

  5. arXiv:2401.09509  [pdf, other

    cs.AR cs.LG

    Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators

    Authors: Mahdi Taheri, Natalia Cherezova, Mohammad Saeed Ansari, Maksim Jenihhin, Ali Mahani, Masoud Daneshtalab, Jaan Raik

    Abstract: The stringent requirements for the Deep Neural Networks (DNNs) accelerator's reliability stand along with the need for reducing the computational burden on the hardware platforms, i.e. reducing the energy consumption and execution time as well as increasing the efficiency of DNN accelerators. Moreover, the growing demand for specialized DNN accelerators with tailored requirements, particularly for… ▽ More

    Submitted 17 January, 2024; originally announced January 2024.

  6. arXiv:2306.09973  [pdf, other

    cs.LG cs.AR cs.NE

    Enhancing Fault Resilience of QNNs by Selective Neuron Splitting

    Authors: Mohammad Hasan Ahmadilivani, Mahdi Taheri, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin

    Abstract: The superior performance of Deep Neural Networks (DNNs) has led to their application in various aspects of human life. Safety-critical applications are no exception and impose rigorous reliability requirements on DNNs. Quantized Neural Networks (QNNs) have emerged to tackle the complexity of DNN accelerators, however, they are more prone to reliability issues. In this paper, a recent analytical… ▽ More

    Submitted 16 June, 2023; originally announced June 2023.

    Comments: 5 pages, 4 figures, 1 table. The paper is accepted at the AICAS'23 conference

  7. arXiv:2306.04645  [pdf, other

    cs.LG cs.AR cs.DC

    Special Session: Approximation and Fault Resiliency of DNN Accelerators

    Authors: Mohammad Hasan Ahmadilivani, Mario Barbareschi, Salvatore Barone, Alberto Bosio, Masoud Daneshtalab, Salvatore Della Torca, Gabriele Gavarini, Maksim Jenihhin, Jaan Raik, Annachiara Ruospo, Ernesto Sanchez, Mahdi Taheri

    Abstract: Deep Learning, and in particular, Deep Neural Network (DNN) is nowadays widely used in many scenarios, including safety-critical applications such as autonomous driving. In this context, besides energy efficiency and performance, reliability plays a crucial role since a system failure can jeopardize human life. As with any other device, the reliability of hardware architectures running DNNs has to… ▽ More

    Submitted 31 May, 2023; originally announced June 2023.

    Comments: 10 pages, 6 tables, 9 figures

  8. arXiv:2305.19733  [pdf, other

    cs.LG cs.AI cs.AR

    APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors

    Authors: Mahdi Taheri, Mohammad Hasan Ahmadilivani, Maksim Jenihhin, Masoud Daneshtalab, Jaan Raik

    Abstract: Nowadays, the extensive exploitation of Deep Neural Networks (DNNs) in safety-critical applications raises new reliability concerns. In practice, methods for fault injection by emulation in hardware are efficient and widely used to study the resilience of DNN architectures for mitigating reliability issues already at the early design stages. However, the state-of-the-art methods for fault injectio… ▽ More

    Submitted 31 May, 2023; originally announced May 2023.

    Comments: 5 pages, 2 tables, 6 figures

  9. arXiv:2305.05750  [pdf, other

    cs.LG cs.AI cs.AR

    A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks

    Authors: Mohammad Hasan Ahmadilivani, Mahdi Taheri, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin

    Abstract: Artificial Intelligence (AI) and, in particular, Machine Learning (ML) have emerged to be utilized in various applications due to their capability to learn how to solve complex problems. Over the last decade, rapid advances in ML have presented Deep Neural Networks (DNNs) consisting of a large number of neurons and layers. DNN Hardware Accelerators (DHAs) are leveraged to deploy DNNs in the target… ▽ More

    Submitted 9 May, 2023; originally announced May 2023.

    Comments: 42 pages, 15 figures, 3 tables, 201 references. The paper has been reviewed and revised 2 times and is under the 3rd review

  10. arXiv:2303.08226  [pdf, other

    cs.LG cs.AI cs.AR

    DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators

    Authors: Mahdi Taheri, Mohammad Riazati, Mohammad Hasan Ahmadilivani, Maksim Jenihhin, Masoud Daneshtalab, Jaan Raik, Mikael Sjodin, Bjorn Lisper

    Abstract: While the role of Deep Neural Networks (DNNs) in a wide range of safety-critical applications is expanding, emerging DNNs experience massive growth in terms of computation power. It raises the necessity of improving the reliability of DNN accelerators yet reducing the computational burden on the hardware platforms, i.e. reducing the energy consumption and execution time as well as increasing the e… ▽ More

    Submitted 14 March, 2023; originally announced March 2023.

    Comments: This paper is accepted at the 24th International Symposium on Quality Electronic Design (ISQED) 2023, 8 pages, 4 figures, 4 tables

  11. DeepVigor: Vulnerability Value Ranges and Factors for DNNs' Reliability Assessment

    Authors: Mohammad Hasan Ahmadilivani, Mahdi Taheri, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin

    Abstract: Deep Neural Networks (DNNs) and their accelerators are being deployed ever more frequently in safety-critical applications leading to increasing reliability concerns. A traditional and accurate method for assessing DNNs' reliability has been resorting to fault injection, which, however, suffers from prohibitive time complexity. While analytical and hybrid fault injection-/analytical-based methods… ▽ More

    Submitted 13 March, 2023; originally announced March 2023.

    Comments: 6 pages, 6 figures, 2 tables, accepted at ETS 2023 (cas.polito.it/ETS23/#/program-conference#tab-accepted)

    Report number: https://ieeexplore.ieee.org/document/10174133 ACM Class: B.8.1; I.4.9

    Journal ref: ETS 2023

  12. arXiv:2301.11115  [pdf, other

    cs.CR eess.SP

    Hybrid Protection of Digital FIR Filters

    Authors: Levent Aksoy, Quang-Linh Nguyen, Felipe Almeida, Jaan Raik, Marie-Lise Flottes, Sophie Dupuis, Samuel Pagliarini

    Abstract: A digital Finite Impulse Response (FIR) filter is a ubiquitous block in digital signal processing applications and its behavior is determined by its coefficients. To protect filter coefficients from an adversary, efficient obfuscation techniques have been proposed, either by hiding them behind decoys or replacing them by key bits. In this article, we initially introduce a query attack that can dis… ▽ More

    Submitted 26 January, 2023; originally announced January 2023.

  13. arXiv:2208.14194  [pdf

    cs.CR

    Survey on Architectural Attacks: A Unified Classification and Attack Model

    Authors: Tara Ghasempouri, Jaan Raik, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil

    Abstract: According to the World Economic Forum, cyber attacks are considered as one of the most important sources of risk to companies and institutions worldwide. Attacks can target the network, software, and/or hardware. During the past years, much knowledge has been developed to understand and mitigate cyberattacks. However, new threats have appeared in recent years regarding software attacks that exploi… ▽ More

    Submitted 30 August, 2022; originally announced August 2022.

  14. arXiv:2109.07824  [pdf, other

    cs.CR

    Design Space Exploration of SABER in 65nm ASIC

    Authors: Malik Imran, Felipe Almeida, Jaan Raik, Andrea Basso, Sujoy Sinha Roy, Samuel Pagliarini

    Abstract: This paper presents a design space exploration for SABER, one of the finalists in NIST's quantum-resistant public-key cryptographic standardization effort. Our design space exploration targets a 65nm ASIC platform and has resulted in the evaluation of 6 different architectures. Our exploration is initiated by setting a baseline architecture which is ported from FPGA. In order to improve the clock… ▽ More

    Submitted 16 September, 2021; originally announced September 2021.

    Comments: 6 pages, 3 figures, conference

  15. arXiv:2105.06122  [pdf, other

    cs.CR

    High-level Intellectual Property Obfuscation via Decoy Constants

    Authors: Levent Aksoy, Quang-Linh Nguyen, Felipe Almeida, Jaan Raik, Marie-Lise Flottes, Sophie Dupuis, Samuel Pagliarini

    Abstract: This paper presents a high-level circuit obfuscation technique to prevent the theft of intellectual property (IP) of integrated circuits. In particular, our technique protects a class of circuits that relies on constant multiplications, such as filters and neural networks, where the constants themselves are the IP to be protected. By making use of decoy constants and a key-based scheme, a reverse… ▽ More

    Submitted 13 May, 2021; originally announced May 2021.

  16. arXiv:2104.04334  [pdf, other

    cs.CR

    Side-Channel Attacks on Triple Modular Redundancy Schemes

    Authors: Felipe Almeida, Levent Aksoy, Jaan Raik, Samuel Pagliarini

    Abstract: The interplay between security and reliability is poorly understood. This paper shows how triple modular redundancy affects a side-channel attack (SCA). Our counterintuitive findings show that modular redundancy can increase SCA resiliency.

    Submitted 6 September, 2021; v1 submitted 9 April, 2021; originally announced April 2021.

    Comments: 4-pager

  17. New categories of Safe Faults in a processor-based Embedded System

    Authors: C. C. Gursoy, M. Jenihhin, A. S. Oyeniran, D. Piumatti, J. Raik, M. Sonza Reorda, R. Ubar

    Abstract: The identification of safe faults (i.e., faults which are guaranteed not to produce any failure) in an electronic system is a crucial step when analyzing its dependability and its test plan development. Unfortunately, safe fault identification is poorly supported by available EDA tools, and thus remains an open problem. The complexity growth of modern systems used in safety-critical applications f… ▽ More

    Submitted 24 September, 2020; originally announced September 2020.

    Comments: 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

  18. arXiv:2002.11108  [pdf, other

    cs.CR

    PASCAL: Timing SCA Resistant Design and Verification Flow

    Authors: Xinhui Lai, Maksim Jenihhin, Jaan Raik, Kolin Paul

    Abstract: A large number of crypto accelerators are being deployed with the widespread adoption of IoT. It is vitally important that these accelerators and other security hardware IPs are provably secure. Security is an extra functional requirement and hence many security verification tools are not mature. We propose an approach/flow-PASCAL-that works on RTL designs and discovers potential Timing Side-Chann… ▽ More

    Submitted 19 August, 2020; v1 submitted 25 February, 2020; originally announced February 2020.

    Comments: Total page number: 4 pages; Figures: 5 figures; conference: 25th IEEE International Symposium on On-Line Testing and Robust System Design 2019

  19. Efficient Fault Injection based on Dynamic HDL Slicing Technique

    Authors: Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer

    Abstract: This work proposes a fault injection methodology where Hardware Description Language (HDL) code slicing is exploited to prune fault injection locations, thus enabling more efficient campaigns for safety mechanisms evaluation. In particular, the dynamic HDL slicing technique provides for a highly collapsed critical fault list and allows avoiding injections at redundant locations or time-steps. Expe… ▽ More

    Submitted 24 January, 2020; originally announced February 2020.

    Comments: arXiv admin note: substantial text overlap with arXiv:2001.09982

  20. Accelerating Transient Fault Injection Campaigns by using Dynamic HDL Slicing

    Authors: Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer

    Abstract: Along with the complexity of electronic systems for safety-critical applications, the cost of safety mechanisms evaluation by fault injection simulation is rapidly going up. To reduce these efforts, we propose a fault injection methodology where Hardware Description Language (HDL) code slicing is exploited to accelerate transient fault injection campaigns by pruning fault lists and reducing the nu… ▽ More

    Submitted 24 January, 2020; originally announced January 2020.

  21. arXiv:1912.01561  [pdf

    cs.CR cs.DC cs.SE eess.SP

    RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems

    Authors: Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendoerfer, Christian Sauer, Anton Klotz, Michael Huebner, Joerg Nolte, Heinrich Theodor Vierhaus, Georgios Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert-Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka

    Abstract: The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical world. These set tough requirements on mutually dependent extra-functional design aspects. The H2020 MSC… ▽ More

    Submitted 29 November, 2019; originally announced December 2019.

    Comments: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, France, 09 - 13 March 2020 6 pages

  22. arXiv:1910.00889  [pdf, other

    eess.SY cs.OH

    Overview of Fault Tolerant Techniques in Underwater Sensor Networks

    Authors: Lauri Vihman, Maarja Kruusmaa, Jaan Raik

    Abstract: Sensor networks provide services to a broad range of applications ranging from intelligence service surveillance to weather forecasting. Most of the sensor networks are terrestrial, however much of our planet is covered by water and Underwater Sensor Networks (USN) are an emerging research area. One of the unavoidable increasing challenge for modern technology is tolerating faults - accepting that… ▽ More

    Submitted 2 October, 2019; originally announced October 2019.

  23. High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors

    Authors: Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik

    Abstract: Recent safety standards set stringent requirements for the target fault coverage in embedded microprocessors, with the objective to guarantee robustness and functional safety of the critical electronic systems. This motivates the need for improving the quality of test generation for microprocessors. A new high-level implementation-independent test generation method for RISC processors is proposed.… ▽ More

    Submitted 8 August, 2019; originally announced August 2019.

    Comments: 2019 IEEE European Test Symposium (ETS). arXiv admin note: text overlap with arXiv:1907.12325

  24. Towards Multidimensional Verification: Where Functional Meets Non-Functional

    Authors: Maksim Jenihhin, Xinhui Lai, Tara Ghasempouri, Jaan Raik

    Abstract: Trends in advanced electronic systems' design have a notable impact on design verification technologies. The recent paradigms of Internet-of-Things (IoT) and Cyber-Physical Systems (CPS) assume devices immersed in physical environments, significantly constrained in resources and expected to provide levels of security, privacy, reliability, performance and low power features. In recent years, numer… ▽ More

    Submitted 1 August, 2019; originally announced August 2019.

    Comments: 2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)

  25. Mixed-level identification of fault redundancy in microprocessors

    Authors: Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gursoy, Jaan Raik

    Abstract: A new high-level implementation independent functional fault model for control faults in microprocessors is introduced. The fault model is based on the instruction set, and is specified as a set of data constraints to be satisfied by test data generation. We show that the high-level test, which satisfies these data constraints, will be sufficient to guarantee the detection of all non-redundant low… ▽ More

    Submitted 29 July, 2019; originally announced July 2019.

    Comments: 2019 IEEE Latin American Test Symposium (LATS)

    Journal ref: 2019 IEEE Latin American Test Symposium (LATS), Santiago, Chile, 2019, pp. 1-6

  26. arXiv:1601.07089  [pdf, other

    cs.DC

    Holistic Approach for Fault-Tolerant Network-on-Chip based Many-Core Systems

    Authors: Siavoosh Payandeh Azad, Behrad Niazmand, Jaan Raik, Gert Jervan, Thomas Hollstein

    Abstract: In this paper we describe a holistic approach for Fault-Tolerant Network-on-Chip (NoC) based many-core systems that incorporates a System Health Monitoring Unit (SHMU) which collects all the fault information from the system, classifies them and provides different solutions for different fault classes. A Mapper/Scheduler Unit (MSU) is used for online generation of different map** and scheduling… ▽ More

    Submitted 26 January, 2016; originally announced January 2016.

    Comments: 2nd International Workshop on Dynamic Resource Allocation and Management in Embedded, High Performance and Cloud Computing DREAMCloud 2016 (arXiv:cs/1601.04675), DREAMCloud/2016/05

  27. arXiv:1008.0063  [pdf

    cs.NE

    Evolutionary Approach to Test Generation for Functional BIST

    Authors: Y. A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, R. Ubar, J. Raik

    Abstract: In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the device's microprogram to test its logic, providing an observation structure to the system, and generating appropriate test data for the given architecture. Two methods of deriving a deterministic test set at functional level… ▽ More

    Submitted 31 July, 2010; originally announced August 2010.

    Comments: 10 European Test Symposium. Informal Digest of Papers